SAMHOP STB8444

STB/P8444
S a mHop Microelectronics C orp.
Ver 1.0
N-Channel Enhancement Mode Field Effect Transistor
FEATURES
Super high dense cell design for low R DS(ON).
PRODUCT SUMMARY
V DSS
ID
R DS(ON) (m Ω) Max
40V
80A
4.8 @ VGS=10V
Rugged and reliable.
TO-220 and TO-263 Package.
D
D
G
G
D
S
S
STB SERIES
TO-263(DD-PAK)
G
STP SERIES
TO-220
S
ABSOLUTE MAXIMUM RATINGS ( T A=25 °C unless otherwise noted )
Symbol
VDS
VGS
ID
IDM
Parameter
Drain-Source Voltage
Gate-Source Voltage
Drain Current-Continuous
-Pulsed
a
TC=25°C
b
d
EAS
Sigle Pulse Avalanche Energy
PD
Maximum Power Dissipation
TJ, TSTG
Operating Junction and Storage
Temperature Range
TC=25°C
THERMAL CHARACTERISTICS
R JC
Thermal Resistance, Junction-to-Case
R JA
Thermal Resistance, Junction-to-Ambient
Details are subject to change without notice.
Limit
40
±20
Units
V
V
80
A
264
A
306
mJ
62
W
-55 to 150
°C
1.8
62.5
°C/W
°C/W
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STB/P8444
Ver 1.0
ELECTRICAL CHARACTERISTICS ( T A=25 °C unless otherwise noted )
4 Symbol
Parameter
OFF CHARACTERISTICS
Drain-Source Breakdown Voltage
BVDSS
Zero Gate Voltage Drain Current
IDSS
Gate-Body Leakage Current
IGSS
ON CHARACTERISTICS
Gate Threshold Voltage
VGS(th)
Drain-Source On-State Resistance
RDS(ON)
gFS
Forward Transconductance
Conditions
Min
VGS=0V , ID=250uA
40
Typ
VGS= ±20V , VDS=0V
2
Units
1
±100
uA
V
VDS=32V , VGS=0V
VDS=VGS , ID=250uA
VGS=10V , ID=80A
VDS=5V , ID=80A
Max
2.8
3.5
4
nA
20
V
m ohm
S
6500
940
500
pF
pF
pF
185
ns
162
ns
185
ns
50
ns
110
nC
20
nC
26
nC
4.8
c
DYNAMIC CHARACTERISTICS
Input Capacitance
CISS
Output Capacitance
COSS
Reverse Transfer Capacitance
CRSS
SWITCHING CHARACTERISTICS
tD(ON)
Turn-On Delay Time
tr
Rise Time
tD(OFF)
Turn-Off Delay Time
tf
Fall Time
VDS=20V,VGS=0V
f=1.0MHz
c
VDD=20V
ID=1A
VGS=10V
RGEN=6 ohm
Qg
Total Gate Charge
VDS=20V,ID=25A,VGS=10V
Qgs
Qgd
Gate-Source Charge
VDS=20V,ID=25A,
VGS=10V
Gate-Drain Charge
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
VSD
VGS=0V,IS=10A
Diode Forward Voltage
0.8
1.3
V
Notes
a.Maximum wire current carrying capacity is 80A.
_ 300us, Duty Cycle <
_ 2%.
b.Pulse Test:Pulse Width <
c.Guaranteed by design, not subject to production testing.
d.Starting TJ=25°C,L=0.5mH,RG=25Ω,IAS=35A,VDD = 20V.(See Figure13)
Mar,26,2008
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STB/P8444
120
20
96
16
I D, Drain Current(A)
I D, Drain Current(A)
Ver 1.0
V G S =10V
72
V G S =6V
V G S =5V
48
24
0
12
25 C
8
Tj=125 C
0
0
0.5
1
2
1.5
3
2.5
0
7
2.0
6
1.8
5
4
V G S =10V
6
V G S =10V
I D = 80 A
1.6
1.4
1.2
1
24
48
72
96
0.0
120
0
1.1
1.0
0.9
0.8
0.7
0.6
-50 -25
0
25
50
75
75
100
125
150
Figure 4. On-Resistance Variation with
Drain Current and Temperature
BVDSS, Normalized
Drain-Source Breakdown Voltage
V DS =V G S
I D =250uA
50
Tj, Junction Temperature ( C)
Figure 3. On-Resistance vs. Drain Current
and Gate Voltage
1.2
25
Tj( C)
ID, Drain Current (A)
Vth, Normalized
Gate-Source Threshold Voltage
5
1.0
2
0.5
4
3
Figure 2. Transfer Characteristics
RDS(ON), On-Resistance
Normalized
RDS(on) (m W)
Figure 1. Output Characteristics
1
2
1
VGS, Gate-to-Source Voltage (V)
VDS, Drain-to-Source Voltage (V)
3
-55 C
4
100 125 150
Tj, Junction Temperature ( C)
1.3
I D =250uA
1.2
1.1
1.0
0.9
0.8
0.7
-50
-25
0
25
50
75
100 125 150
Tj, Junction Temperature ( C)
Figure 6. Breakdown Voltage Variation
with Temperature
Figure 5. Gate Threshold Variation
with Temperature
Mar,26,2008
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STB/P8444
Ver 1.0
12
20.0
I D =80 A
Is, Source-drain current (A)
RDS(on) (m W)
10
8
125 C
6
4
25 C
75 C
2
0
0
2
4
6
8
125
125
C
25 C
75 C
1.0
10
0.0
0.2
0.4
0.6
0.8
1.0
V GS, Gate-Sorce Voltage(V)
V SD, Body Diode Forward Voltage(V)
Figure 7. On-Resistance vs.
Gate-Source Voltage
Figure 8. Body Diode Forward Voltage
Variation with Source Current
10
7500
VGS, Gate to Source Voltage (V)
9000
C, Capacitance (pF)
10.0
Cis s
6000
4500
3000
Cos s
1500
C rs s
0
0
V DS = 20V
I D = 25A
8
6
4
2
0
5
10
20
15
25
30
0
20
40
60
80 100 120 140 160
VDS, Drain-to Source Voltage(V)
Qg, Total Gate Charge(nC)
Figure 9. Capacitance
Figure 10. Gate Charge
2200
1000
1000
600
TD(off)
100
ID, Drain Current (A)
Switching Time (ns)
Tr
TD(on)
Tf
V DS =20V ,ID=1A
10
100
R
6 10
60 100
Rg, Gate Resistance(Ω)
it
10
1m
0u
s
s
10
1
0.1
300 600
(
L im
10
m
DC s
V G S =10V
1
DS
)
ON
V G S =10V
S ingle P ulse
T c=25 C
1
10
100
VDS, Drain-Source Voltage (V)
Figure 12. Maximum Safe
Operating Area
Figure 11.switching characteristics
Mar,26,2008
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STB/P8444
Ver 1.0
V (B R ) DS S
15V
DR IV E R
L
V DS
tp
D.U.T
RG
+
V DD
-
I AS
20V
0.01
tp
I AS
Unclamped Inductive Test Circuit
Unclamped Inductive Waveforms
Figure 13a.
Figure 13b.
r(t),Normalized E ffective
T ransient T hermal Impedance
2
1
D=0.5
0.2
0.1
0.1
P DM
0.05
t1
0.02
t2
0.01
1.
2.
3.
4.
S ingle P uls e
0.01
0.00001
0.0001
0.001
0.01
0.1
R J C (t)=r (t) * R J C
R J C =S ee Datas heet
T J M-T C = P * R J C (t )
Duty C ycle, D=t1/t2
1
10
S quare Wave P uls e Duration (ms ec)
F igure 14. Normalized T hermal T rans ient Impedance C urve
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STB/P8444
Ver 1.0
PACKAGE OUTLINE DIMENSIONS
TO-220
Mar,26,2008
6
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STB/P8444
Ver 1.0
PACKAGE OUTLINE DIMENSIONS
TO-263AB
Mar,26,2008
7
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STB/P8444
Ver 1.0
17.5
7.67 + 0.20
5.4 + 0.2
3.5 + 0.2
32
2.6
12.40
2.35
5.60 + 0.20
5.70
15.7 + 0.2
7.2 + 0.1
3.7 + 0.2
TO-220/263AB Tube
2.6 + 0.2
5.40 + 0.
0.5 + 0.1
536 + 1
2.50
4.30
5.80
5.10
ANTISTATIC
1.70
Mar,26,2008
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