2SK2685 GaAs HEMT ADE-208-400 1st. Edition Application UHF low noise amplifier Features • Excellent low noise characteristics. Fmin = 0.83 dB Typ. (3 V, 10 mA, 2 GHz) • High associated gain. Ga = 17 dB Typ. (3 V, 10 mA, 2 GHz) • High voltage. VDS = 6 or more voltage. • Small package. (CMPAK-4) Outline CMPAK–4 2 3 1 4 1. Source 2. Gate 3. Source 4. Drain 2SK2685 Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS 6 V Gate to source voltage VGSO –6 V Gate to drain voltage VGDO –7 V Drain current ID 20 mA Channel power dissipation Pch 100 mW Channel temperature Tch 125 °C Storage temperature Tstg –55 to +125 °C Attention: This device is very sensitive to electro static discharge. It is recommended to adopt appropriate cautions when handling this transistor. Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test conditions Gate to source leak current I GSS — — –20 µA VGS = –6 V, VDS = 0 Gate to source cutoff voltage VGS(off) –0.3 — –2.0 V VDS = 3 V, ID = 100 µA Drain current I DSS 35 50 70 mA VDS = 3 V, VGS = 0 (Pulse Test) Forward transfer admittance |yfs| 40 60 — mS VDS = 3 V, ID = 10 mA, f = 1 kHz Associated gain Ga — 17.0 — dB VDS = 3 V, ID = 10 mA, f = 2 GHz Associated gain Ga — 15.2 — dB VDS = 3 V, ID = 3 mA, f = 2 GHz Associated gain Ga 16 21.4 — dB VDS = 3 V, ID = 10 mA, f = 900 MHz Associated gain Ga — 19.7 — dB VDS = 3 V, ID = 3 mA, f = 900 MHz Minimum noise figure Fmin — 0.83 — dB VDS = 3 V, ID = 10 mA, f = 2 GHz Minimum noise figure Fmin — 1.08 — dB VDS = 3 V, ID = 3 mA, f = 2 GHz Minimum noise figure Fmin — 0.52 1.0 dB VDS = 3 V, ID = 10 mA, f = 900 MHz Minimum noise figure Fmin — 0.74 — dB VDS = 3 V, ID = 3 mA, f = 900 MHz Note: Marking is “ZT–”. 2 2SK2685 Typical Output Characteristics 20 –0.4 200 16 Drain Current ID (mA) Channel Power Dissipation Pch (mW) Maximum Channel Power Dissipation Curve 150 100 50 –0.5 V Pulse Test 12 –0.6 V 8 –0.7 V 4 –0.8 V VGS = –0.9 V 0 0 50 100 150 200 Ambient Temperature Ta (°C) Forward Transfer Admittance yfs (mS) 100 80 VDS = 3 V Pulse Test 60 40 20 –2.0 –1.6 –1.2 –0.8 –0.4 Gate to Source Voltage VGS (V) 1 2 3 4 Drain to Source Voltage VDS (V) 5 Forward Transfer Admittance vs. Gate to Source Voltage Typical Transfer Characteristics Drain Current ID (mA) –0.3 V –0.1 V V 0 100 VDS = 3 V Pulse Test 80 60 40 20 0 –2.0 –1.6 –1.2 –0.8 –0.4 Gate to Source Voltage VGS (V) 0 3 2SK2685 Associated Gain vs. Drain Current 30 100 VDS = 3 V Pulse Test 80 Associated Gain Ga (dB) Forward Transfer Admittance yfs (mS) Forward Transfer Admittance vs. Drain Current 60 40 20 0 4 8 12 16 Drain Current ID (mA) f = 900 MHz 3V VDS = 1 V f = 2 GHz 10 Minimum Noise Figure vs. Drain Current V DS 1V 3V 3V Associated Gain Ga (dB) Minimum Noise Figure Fmin (dB) f = 2 GHz V =1 f = 900 MHz 20 2 GHz 10 ID = 10 mA f = 900 MHz 4 30 30 2 0 10 20 Drain Current ID (mA) Associated Gain vs. Drain to Source Voltage 3 1 1V 20 0 20 3V 10 20 Drain Current ID (mA) 30 0 2 4 6 8 Drain to Source Voltage VDS (V) 10 2SK2685 Minimum Noise Figure vs. Drain to Source Voltage Isolation vs. Drain Current 50 3V Isolation S21 – S12 (dB) ID = 10 mA 2.0 1.0 2 GHz VDS = 1 V 40 30 20 10 f = 900 MHz f = 900 MHz 0 2 4 6 8 Drain to Source Voltage VDS (V) 10 0 10 20 Drain Current ID (mA) 30 Isolation vs. Drain Current 50 Isolation S21 – S12 (dB) Minimum Noise Figure Fmin (dB) 3.0 40 3V VDS = 1 V 30 20 10 f = 2 GHz 0 10 20 Drain Current ID (mA) 30 5 2SK2685 S11 Parameter vs. Frequency 0.8 0.6 1 S12 Parameter vs. Frequency 90° 1.5 Scale : 0.02/div. 60° 120° 2 0.4 3 150° 4 5 0.2 30° 10 0.2 0 0.4 0.6 0.8 1.0 1.5 2 3 4 5 10 ∞ 0° 180° –10 –0.2 –5 –4 –3 –0.4 –30° –150° –2 –0.6 –60° –90° Condition : ID = 10 mA, Zo = 50 Ω 200 to 2000 MHz (200 MHz step) (VDS = 1 V) (VDS = 3 V) –120° –1.5 –0.8 –1 Condition : ID = 10 mA, Zo = 50 Ω 200 to 2000 MHz (200 MHz step) (VDS = 1 V) (VDS = 3 V) S22 Parameter vs. Frequency S21 Parameter vs. Frequency 90° 120° Scale : 2/div. 60° 0.6 0.8 1 1.5 2 0.4 3 150° 30° 4 5 0.2 10 0° 180° 0.2 0 0.4 0.6 0.8 1.0 1.5 2 3 4 5 10 ∞ –10 –0.2 –5 –4 –3 –30° –150° –0.4 –120° –60° –90° Condition : ID = 10 mA, Zo = 50 Ω 200 to 2000 MHz (200 MHz step) (VDS = 1 V) (VDS = 3 V) 6 –2 –0.6 –1.5 –0.8 –1 Condition : ID = 10 mA, Zo = 50 Ω 200 to 2000 MHz (200 MHz step) (VDS = 1 V) (VDS = 3 V) 2SK2685 S Parameter (VDS = 1 V, ID = 10 mA, ZO = 50 ) Freq. S11 S21 S12 S22 (MHz) MAG. ANG. MAG. ANG. MAG. ANG. MAG. ANG. 200 0.996 –4.8 5.12 175.8 0.00691 89.8 0.688 –3.2 400 0.980 –9.5 5.13 169.9 0.0143 88.2 0.682 –6.5 600 0.977 –15.0 5.07 165.4 0.0210 83.3 0.674 –10.6 800 0.970 –19.9 4.94 161.6 0.0276 81.5 0.668 –13.8 1000 0.952 –24.4 4.84 156.5 0.0399 79.3 0.658 –17.2 1200 0.938 –29.2 4.74 152.7 0.0404 76.0 0.648 –20.7 1400 0.916 –34.0 4.67 147.7 0.0462 74.8 0.636 –23.7 1600 0.896 –38.2 4.55 144.1 0.0523 73.1 0.622 –27.1 1800 0.882 –42.9 4.47 140.0 0.0578 72.0 0.611 –29.9 2000 0.859 –47.1 4.36 135.8 0.0630 70.3 0.597 –33.1 S Parameter (VDS = 3 V, ID = 10 mA, ZO = 50 Ω) Freq. S11 S21 S12 S22 (MHz) MAG. ANG. MAG. ANG. MAG. ANG. MAG. ANG. 200 0.998 –4.0 5.13 175.8 0.00581 89.8 0.802 –3.2 400 0.988 –9.2 5.14 170.1 0.0110 85.5 0.796 –6.5 600 0.978 –14.5 5.08 165.2 0.0163 83.3 0.790 –9.8 800 0.968 –19.4 4.95 161.4 0.0216 82.0 0.783 –13.3 1000 0.953 –24.2 4.85 156.4 0.0363 79.2 0.774 –16.4 1200 0.937 –28.7 4.75 152.5 0.0312 76.5 0.764 –19.4 1400 0.917 –33.3 4.68 147.8 0.0358 75.3 0.753 –22.5 1600 0.900 –37.5 4.57 144.0 0.0401 73.2 0.742 –25.4 1800 0.883 –41.9 4.49 140.1 0.0442 72.8 0.731 –28.1 2000 0.858 –46.1 4.37 135.9 0.0477 71.4 0.718 –31.1 7 Unit: mm 0.1 0.3 +– 0.05 0.2 0.65 0.6 1.25 ± 0.2 0.9 ± 0.1 0.1 0.4 +– 0.05 0 – 0.1 0.425 0.1 0.3 +– 0.05 + 0.1 0.16– 0.06 2.1 ± 0.3 0.65 0.65 1.25 ± 0.1 0.1 0.3 +– 0.05 0.425 2.0 ± 0.2 1.3 ± 0.2 Hitachi Code JEDEC EIAJ Weight (reference value) CMPAK-4(T) — Conforms 0.006 g Datasheet Title Cautions 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products. 1. This product must not be placed in the mouth, as it contains toxic substances that may cause poisoning. If by chance the product is placed in the mouth, take emergency action such as inducing vomiting, then consult a physician without delay. 2. Disposal of this product must be handled, separately from other general refuse, by a specialist processing contractor in the same way as dangerous items. 4 Datasheet Title Hitachi, Ltd. Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109 URL NorthAmerica : http:semiconductor.hitachi.com/ Europe : http://www.hitachi-eu.com/hel/ecg Asia (Singapore) : http://www.has.hitachi.com.sg/grp3/sicd/index.htm Asia (Taiwan) : http://www.hitachi.com.tw/E/Product/SICD_Frame.htm Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm Japan : http://www.hitachi.co.jp/Sicd/indx.htm For further information write to: Hitachi Semiconductor (America) Inc. 179 East Tasman Drive, San Jose,CA 95134 Tel: <1> (408) 433-1990 Fax: <1>(408) 433-0223 Hitachi Europe GmbH Electronic components Group Dornacher Straße 3 D-85622 Feldkirchen, Munich Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00 Hitachi Europe Ltd. Electronic Components Group. Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: <44> (1628) 585000 Fax: <44> (1628) 778322 Hitachi Asia Pte. Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 049318 Tel: 535-2100 Fax: 535-1533 Hitachi Asia Ltd. Taipei Branch Office 3F, Hung Kuo Building. No.167, Tun-Hwa North Road, Taipei (105) Tel: <886> (2) 2718-3666 Fax: <886> (2) 2718-8180 Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Sha Tsui, Kowloon, Hong Kong Tel: <852> (2) 735 9218 Fax: <852> (2) 730 0281 Telex: 40815 HITEC HX Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan. 5