NEC UPA1704

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µ PA1704
SWITCHING
N-CHANNEL POWER MOS FET
INDUSTRIAL USE
DESCRIPTION
PACKAGE DRAWING (Unit : mm)
This µPA1704 is N-Channel MOS Field Effect Transistor
8
designed for power management applications and Li-ion
5
1,2,3 ; Source
; Gate
4
5,6,7,8 ; Drain
battery application.
FEATURES
• 2.5-V gate drive and low on-resistance
0.05 MIN.
• Built-in G-S protection diode
• Small and surface mount package (Power SOP8)
4.4
0.8
+0.10
–0.05
• Low Ciss : Ciss = 2700 pF TYP.
6.0 ±0.3
4
5.37 MAX.
0.15
1.8 MAX.
RDS(on)2 = 16 mΩ MAX. (VGS = 2.5 V, ID = 5.0 A)
1.44
1
RDS(on)1 = 13 mΩ MAX. (VGS = 4.0 V, ID = 5.0 A)
0.5 ±0.2
0.10
1.27 0.78 MAX.
0.40
+0.10
–0.05
0.12 M
ORDERING INFORMATION
PART NUMBER
PACKAGE
µPA1704G
Power SOP8
ABSOLUTE MAXIMUM RATINGS (TA = 25°C, All terminals are connected.)
Drain to Source Voltage (VGS = 0 V)
VDSS
30
V
Gate to Source Voltage (VDS = 0 V)
VGSS
±12
V
Drain Current (DC)
ID(DC)
±10
A
ID(pulse)
±40
A
PT
2.0
W
Channel Temperature
Tch
150
°C
Storage Temperature
Tstg
–55 to + 150
°C
Drain Current (pulse)
Note1
Total Power Dissipation (TA = 25°C)
Note2
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1 %
2
EQUIVALENT CIRCUIT
Drain
Body
Diode
Gate
Gate
Protection
Diode
Source
2. Mounted on ceramic substrate of 1200 mm x 0.7 mm
Remark
The diode connected between the gate and source of the transistor serves as a protector against ESD.
When this device actually used, an additional protection circuit is externally required if a voltage
exceeding the rated voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.
D12908EJ1V1DS00 (1st edition)
Date Published January 2000 NS CP(K)
Printed in Japan
©
1998, 1999
µ PA1704
ELECTRICAL CHARACTERISTICS (TA = 25 °C, All terminals are connected.)
CHARACTERISTICS
SYMBOL
Drain to Source On-state Resistance
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
RDS(on)1
VGS = 4.0 V, ID = 5.0 A
9.8
13
mΩ
RDS(on)2
VGS = 2.5 V, ID = 5.0 A
12
16
mΩ
VGS(off)
VDS = 10 V, ID = 1 mA
0.5
0.8
1.5
V
Forward Transfer Admittance
| yfs |
VDS = 10 V, ID = 5.0 A
10
25
Drain Leakage Current
IDSS
VDS = 30 V, VGS = 0 V
10
µA
Gate to Source Leakage Current
IGSS
VGS = ±12 V, VDS = 0 V
±10
µA
Input Capacitance
Ciss
VDS = 10 V
2700
pF
Output Capacitance
Coss
VGS = 0 V
880
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
400
pF
Turn-on Delay Time
td(on)
ID = 5.0 A
25
ns
VGS(on) = 4.0 V
95
ns
td(off)
VDD = 15 V
235
ns
tf
RG = 10 Ω
200
ns
Total Gate Charge
QG
ID = 10 A
38
nC
Gate to Source Charge
QGS
VDD = 24 V
3.3
nC
Gate to Drain Charge
QGD
VGS = 4.0 V
15
nC
VF(S-D)
IF = 10 A, VGS = 0 V
0.8
V
Reverse Recovery Time
trr
IF = 10 A, VGS = 0 V
48
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/ µs
53
nC
Gate to Source Cut-off Voltage
Rise Time
tr
Turn-off Delay Time
Fall Time
Body Diode Forward Voltage
TEST CIRCUIT 1 SWITCHING TIME
TEST CIRCUIT 2 GATE CHARGE
D.U.T.
D.U.T.
RL
RG
PG.
VGS
VGS
Wave Form
0
10 %
ID
PG.
90 %
90 %
10 %
0 10 %
Wave Form
τ = 1 µs
Duty Cycle ≤ 1 %
tr td(off)
td(on)
ton
IG = 2 mA
RL
50 Ω
VDD
90 %
ID
τ
2
VGS(on)
VDD
ID
VGS
0
S
tf
toff
Data Sheet D12908EJ1V1DS00
µ PA1704
TYPICAL CHARACTERISTICS (TA = 25 °C)
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
rth(t) - Transient Thermal Resistance - ˚C/W
1 000
Rth(ch-A) = 62.5˚C/W
100
10
1
0.1
0.01
0.001
Mounted on ceramic
substrate of 1200 mm2 × 0.7 mm
Single Pulse
10 µ
100 µ
1m
10 m
100 m
1
10
100
1 000
100
VDS =10 V
Pulsed
10
TA = 25˚C
1
0.1
10
1
100
RDS(on) - Drain to Source On-state Resistance - mΩ
ID- Drain Current - A
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
Pulsed
30
20
VGS = 2.5 V
10
VGS = 4.0 V
0
1
10
100
VGS(off) - Gate to Source Cut-off Voltage - V
|yfs| - Forward Transfer Admittance - S
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
RDS(on) - Drain to Source On-state Resistance - mΩ
PW - Pulse Width - s
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
30
Pulsed
20
ID = 5.0 A
10
0
4
2
6
VGS - Gate to Source Voltage - V
GATE TO SOURCE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
VDS = 10 V
ID = 1 mA
1.0
0.5
0
ID - Drain Current - A
− 50
0
50
100
150
Tch - Channel Temperature - ˚C
Data Sheet D12908EJ1V1DS00
3
µ PA1704
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
2.8
100
80
60
40
20
0
20
40
60
80
Mounted on ceramic
substrate of
1200 mm 2 × 0.7 mm
2.4
2.0
1.6
1.2
0.8
0.4
0
100 120 140 160
20
TA - Ambient Temperature - ˚C
40
60
80
100 120 140 160
TA - Ambient Temperature - ˚C
FORWARD BIAS SAFE OPERATING AREA
100
d
ite )
Lim .0 V
4
=
S
ID(pulse) = 40 A
PW
)
n
(o
DS
ID - Drain Current - A
R
10
(V
G
10
ID(DC) = 10 A
=
Remark
2
Mounted on ceramic substrate of 1200 mm x 0.7 mm
1
m
s
m
s
10
0
Po
m
s
we
rD
iss
ipa
tio
n
1
Lim
ite
d
TA = 25 ˚C
Single Pulse
0.1
0.1
1
10
100
VDS - Drain to Source Voltage - V
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
100
Pulsed
Pulsed
40
ID - Drain Current - A
ID - Drain Current - A
50
VGS = 4.0 V
30
VGS = 2.5 V
20
10
0
10
1
TA = 125˚C
75˚C
25˚C
-25˚C
0.1
0.2
0.4
0.6
0.8
0
VDS - Drain to Source Voltage - V
4
1
2
VDS = 10 V
3
4
VGS - Gate to Source Voltage - V
Data Sheet D12908EJ1V1DS00
RDS(on) - Drain to Source On-state Resistance - mΩ
µ PA1704
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
Pulsed
IF - Diode Forward Current - A
20
VGS = 2.5 V
10
VGS = 4.0 V
1
0.1
ID = 5.0 A
− 50
0
50
100
150
0
VGS = 0 V
f = 1 MHz
1 000
Coss
Crss
100
1
10
30
1 000
td(on), tr, td(off), tf - Switching Time - ns
Ciss, Coss, Crss - Capacitance - pF
SWITCHING CHARACTERISTICS
Ciss
10
0.1
100
tf
tr
td(off)
100
td(on)
10
1
0.1
ID - Drain Current - A
di/dt = 100A/µs
VGS = 0 V
100
10
1
10
100
VDS - Drain to Source Voltage - V
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
1
0.1
VDS = 15 V
VGS = 4.0 V
RG = 10 Ω
10
100
1
VDS - Drain to Source Voltage - V
1 000
1.5
VSD - Source to Drain Voltage - V
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
10 000
1.0
0.5
Tch - Channel Temperature - ˚C
trr - Reverse Recovery Time - ns
0V
2.5 V
10
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
40
ID = 10 A
6
30
5
VGS
VDD = 24 V
15 V
6V
20
4
3
10
2
1
VDS
0
ID - Drain Current - A
5
10
15
20
25
30
35
VGS - Gate to Source Voltage - V
0
VGS = 4.0 V
100
0
40
QG - Gate Charge - nC
Data Sheet D12908EJ1V1DS00
5
µ PA1704
[MEMO]
6
Data Sheet D12908EJ1V1DS00
µ PA1704
[MEMO]
Data Sheet D12908EJ1V1DS00
7
µ PA1704
• The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
• No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
• NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
• Descriptions of circuits, software, and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these circuits,
software, and information in the design of the customer's equipment shall be done under the full responsibility
of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third
parties arising from the use of these circuits, software, and information.
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the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
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"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
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support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
M7 98. 8