NEC 2SK3306

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
2SK3306
SWITCHING
N-CHANNEL POWER MOS FET
INDUSTRIAL USE
ORDERING INFORMATION
DESCRIPTION
The 2SK3306 is N-Channel DMOS FET device that features
PART NUMBER
PACKAGE
2SK3306
Isolated TO-220 (MP-45F)
a low gate charge and excellent switching characteristics, and
designed for high voltage applications such as switching power
supply, AC adapter.
(Isolated TO-220)
FEATURES
• Low gate charge :
★
QG = 13 nC TYP. (VDD = 400 V, VGS = 10 V, ID = 5.0 A)
• Gate voltage rating : ±30 V
• Low on-state resistance :
RDS(on) = 1.5 Ω MAX. (VGS = 10 V, ID = 2.5 A)
• Avalanche capability ratings
• Isolated TO-220(MP-45F) package
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage (VGS = 0 V)
VDSS
500
V
Gate to Source Voltage (VDS = 0 V)
VGSS(AC)
±30
V
ID(DC)
±5
A
ID(pulse)
±20
A
Total Power Dissipation (TC = 25°C)
PT
35
W
Total Power Dissipation (TA = 25°C)
PT
2.0
W
Channel Temperature
Tch
150
°C
Drain Current (DC)
Drain Current (pulse)
Note1
Storage Temperature
Tstg
–55 to +150
°C
Single Avalanche Current
Note2
IAS
5.0
A
Single Avalanche Energy
Note2
EAS
125
mJ
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1 %
2. Starting Tch = 25 °C, VDD = 150 V, RG = 25 Ω, VGS = 20 V → 0 V
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.
D14004EJ2V0DS00 (2nd edition)
Date Published January 2000 NS CP(K)
Printed in Japan
The mark ★ shows major revised points.
©
1999
2SK3306
ELECTRICAL CHARACTERISTICS (TA = 25 °C)
CHARACTERISTICS
★
SYMBOL
MIN.
TYP.
MAX.
UNIT
TEST CONDITIONS
Drain Leakage Current
IDSS
100
µA
VDS = 500 V, VGS = 0 V
Gate to Source Leakage Current
IGSS
±100
nA
VGS = ±30 V, VDS = 0 V
3.5
V
VDS = 10 V, ID = 1 mA
S
VDS = 10 V, ID = 2.5 A
Ω
VGS = 10 V, ID = 2.5 A
VDS = 10 V, VGS = 0 V, f = 1 MHz
Gate to Source Cut-off Voltage
★
Forward Transfer Admittance
★
Drain to Source On-state Resistance
★
VGS(off)
2.5
| yfs |
1.0
3.0
RDS(on)
1.35
Input Capacitance
Ciss
700
pF
Output Capacitance
Coss
115
pF
Reverse Transfer Capacitance
Crss
6
pF
Turn-on Delay Time
td(on)
16
ns
VDD = 150 V, ID = 2.5 A, VGS(on) = 10 V,
tr
3
ns
RG = 10 Ω, RL = 60 Ω
td(off)
33
ns
tf
5.5
ns
Rise Time
Turn-off Delay Time
Fall Time
1.5
★
Total Gate Charge
QG
13
nC
★
Gate to Source Charge
QGS
4
nC
★
Gate to Drain Charge
QGD
4.5
nC
★
Body Diode Forward Voltage
VF(S-D)
1.0
V
IF = 5.0 A, VGS = 0 V
Reverse Recovery Time
trr
0.7
µs
IF = 5.0 A, VGS = 0 V, di/dt = 50 A / µs
Reverse Recovery Charge
Qrr
3.3
µC
★
TEST CIRCUIT 1 AVALANCHE CAPABILITY
VDD = 400 V, VGS(on) = 10 V, ID = 5.0 A
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
RG = 25 Ω
D.U.T.
L
RL
PG
50 Ω
VDD
VGS = 20 → 0 V
RG
PG.
VGS
VGS
Wave Form
0
90 %
ID
VGS
0
ID
Starting Tch
τ = 1 µs
Duty Cycle ≤ 1 %
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
2
IG = 2 mA
RL
50 Ω
VDD
10 %
0 10 %
Wave Form
τ
VDD
PG.
90 %
BVDSS
VDS
ID
90 %
VDD
ID
IAS
VGS(on)
10 %
Data Sheet D14004EJ2V0DS00
tr td(off)
td(on)
ton
tf
toff
2SK3306
TYPICAL CHARACTERISTICS(TA = 25 °C)
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
50
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
100
80
60
40
20
0
20
40
80
60
100 120
140
160
40
30
20
10
0
Tc - Case Temperature - ˚C
20
40
60
80
100 120
140
160
Tc - Case Temperature - ˚C
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD BIAS SAFE OPERATING AREA
100
S
ID (pulse) PW
S
RD t VG
(a
10
10
0
1m
ID (DC)
we
rD
1
iss
ip
1
io
n
Li
µs
µs
10 V
VGS = 20 V
8
8.0 V
6
4
VGS = 6.0 V
2
m
Tc = 25 ˚C
Single Pulse
0.1
at
10
s
1
10 0 m
s
0
m
s
Po
=
ID - Drain Current - A
ID - Drain Current - A
Pulsed
10
d
ite )
im 0 V
L
)
1
n
(o
=
ite
d
10
100
1000
VDS - Drain to Source Voltage - V
0
4
8
12
16
VDS - Drain to Source Voltage - V
DRAIN CURRENT vs.
GATE TO SOURCE VOLTAGE
1000
Pulsed
ID - Drain Current - A
100
10
1
TA = –25 ˚C
25 ˚C
75 ˚C
125 ˚C
0.1
0.01
0.001
0
5
10
15
VGS - Gate to Source Voltage - V
Data Sheet D14004EJ2V0DS00
3
2SK3306
rth(ch-C) (t) - Transient Thermal Resistance - ˚C/W
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
Rth(ch-A) = 62.5 ˚C/W
10
Rth(ch-C) = 3.57 ˚C/W
1
0.1
Tc = 25 ˚C
Single Pulse
0.01
0.0001
0.001
0.01
0.1
1
10
100
1000
10
1
TA = –25 ˚C
25 ˚C
75 ˚C
125 ˚C
0.1
VDS = 10 V
Pulsed
0.01
0.01
3.0
0.1
1
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
4.0
3.0
ID = 5.0 A
2.0
1.0
0.0
Pulsed
0
5
10
15
25
20
VGS - Gate to Source Voltage - V
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
GATE TO SOURCE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
2.0
1.0
1
10
4.0
VDS = 10 V
ID = 1 mA
3.0
2.0
1.0
0.0
ID - Drain Current - A
4
ID = 2.5 A
ID - Drain Current - A
Pulsed
0
0.1
100
10
VGS(off) - Gate to Source Cut-off Voltage - V
RDS(on) - Drain to Source On-State Resistance - Ω
IyfsI - Forward Transfer Admittance - S
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
RDS(on) - Drain to Source On-State Resistance - W
PW - Pulse Width - s
–50
0
50
100
150
Tch - Channel Temperature - ˚C
Data Sheet D14004EJ2V0DS00
200
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
3.0
100
ISD - Diode Forward Current - A
ID = 5.0 A
2.0
ID = 2.5 A
1.0
VGS = 10 V
0.0
–50
0
50
100
Pulsed
10
1
VGS = 10 V
VGS = 0 V
0.1
0.01
0.0
150
0.5
VSD - Source to Drain Voltage - V
Tch - Channel Temperature - ˚C
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
SWITCHING CHARACTERISTICS
VGS = 0 V
f = 1.0 MHz
Ciss
1 000
Coss
100
10
Crss
1
100
td(on), tr, td(off), tf - Switching Time - ns
Ciss, Coss, Crss - Capacitance - pF
10000
0.1
1
10
100
tr
td(off)
td(on)
tf
10
1
VDD = 150 V
VGS = 10 V
RG = 10 Ω
0.1
1000
0.1
1
10
ID - Drain Current - A
VDS - Drain to Source Voltage - V
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
100
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
2000
800
di/dt = 100 A/µs
VGS = 0 V
ID = 5.0 A
VDS - Drain to Source Voltage - V
1800
trr - Reverse Recovery Time - ns
1.5
1.0
1600
1400
1200
1000
800
600
400
200
14
700
VGS
VDD = 400 V
250 V
125 V
600
500
12
10
400
8
300
6
4
200
VDS
2
100
VGS - Gate to Source Voltage - V
RDS(on) - Drain to Source On-State Resistance - W
2SK3306
0
0.1
1
10
100
2
4
6
8
10
12
14
Qg - Gate Charge - nC
ID - Drain Current - A
Data Sheet D14004EJ2V0DS00
5
2SK3306
SINGLE AVALANCHE CURRENT vs
INDUCTIVE LOAD
SINGLE AVALANCHE ENERGY vs
STARTING CHANNEL TEMPERATURE
ID(peak) = IAS
RG = 25 Ω
VGS = 20 V → 0 V
VDD = 150 V
125
EAS = 125 mJ
100
75
50
25
0
25
50
75
100
125
150
175
100
IAS - Single Avalanche Current - A
EAS - Single Avalanche Energy - mJ
150
10
IAS = 5.0 A
EAS
= 12
5m
J
1
0.1
1.00E–04
Starting Tch - Starting Channel Temperature - ˚C
6
RG = 25 Ω
VDD = 150 V
VGS = 20 V → 0 V
Starting Tch = 25 ˚C
Data Sheet D14004EJ2V0DS00
1.00E–03
1.00E–02
L - Inductive Load - H
1.00E–01
2SK3306
PACKAGE DRAWING (Unit: mm)
Isolated TO-220(MP-45F)
10.0±0.3
4.5±0.2
3.2±0.2
2.7±0.2
EQUIVALENT CIRCUIT
12.0±0.2
3±0.1
4±0.2
0.7±0.1
1.3±0.2
1.5±0.2
2.54
2.54
Body
Diode
Gate
13.5 MIN.
15.0±0.3
Drain
Source
2.5±0.1
0.65±0.1
1. Gate
2. Drain
3. Source
1 2 3
★
Remark
Strong electric field, when exposed to this device, cause destruction of the gate oxide and ultimately
degrade the device operation. Steps must be taken to stop generation of static electricity as much as
possible, and quickly dissipate it once, when it has occurred.
Data Sheet D14004EJ2V0DS00
7
2SK3306
• The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
• No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
• NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
• Descriptions of circuits, software, and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these circuits,
software, and information in the design of the customer's equipment shall be done under the full responsibility
of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third
parties arising from the use of these circuits, software, and information.
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the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
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"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
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The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
M7 98. 8