NEC UPA1731

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µPA1731
SWITCHING
P-CHANNEL POWER MOS FET
INDUSTRIAL USE
DESCRIPTION
PACKAGE DRAWING (Unit : mm)
The µPA1731 is P-Channel MOS Field Effect Transistor
8
5
designed for power management applications of
1,2,3 ; Source
; Gate
4
5,6,7,8 ; Drain
notebook computers and Li-ion battery protection circuit.
FEATURES
• Low on-resistance
• Built-in G-S protection diode
• Small and surface mount package (Power SOP8)
4.4
0.8
+0.10
–0.05
5.37 MAX.
0.15
RDS(on)3 = 16.5 mΩ TYP. (VGS = –4.0 V, ID = –5.0 A)
• Low Ciss : Ciss =2600 pF TYP.
6.0 ±0.3
4
0.05 MIN.
•
•
1.8 MAX.
RDS(on)2 = 14.6 mΩ TYP. (VGS = –4.5 V, ID = –5.0 A)
1.44
1
RDS(on)1 = 10.3 mΩ TYP. (VGS = –10 V, ID = –5.0 A)
0.5 ±0.2
0.10
1.27 0.78 MAX.
0.40
+0.10
–0.05
0.12 M
ORDERING INFORMATION
PART NUMBER
PACKAGE
µPA1731G
Power SOP8
ABSOLUTE MAXIMUM RATINGS (TA = 25°C, All terminals are connected.)
Drain to Source Voltage (VGS = 0 V)
VDSS
–30
V
Gate to Source Voltage (VDS = 0 V)
VGSS
# 20
V
Drain Current (DC)
ID(DC)
# 10
A
ID(pulse)
# 40
A
PT
2.0
W
Channel Temperature
Tch
150
°C
Storage Temperature
Tstg
–55 to + 150
°C
Drain Current (pulse)
Note1
Total Power Dissipation (TA = 25°C)
Note2
EQUIVALENT CIRCUIT
Drain
Body
Diode
Gate
Gate
Protection
Diode
Source
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1 %
2
2. Mounted on ceramic substrate of 1200 mm x 2.2 mm
Remark
The diode connected between the gate and source of the transistor serves as a protector against ESD.
When this device actually used, an additional protection circuit is externally required if a voltage
exceeding the rated voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.
G14285EJ1V0DS00 (1st edition)
Date Published October 1999 NS CP(K)
Printed in Japan
The mark • shows major revised points.
©
1999
µPA1731
•
ELECTRICAL CHARACTERISTICS (TA = 25 °C, All terminals are connected.)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
RDS(on)1
VGS = –10 V, ID = –5.0 A
10.3
13.0
mΩ
RDS(on)2
VGS = –4.5 V, ID = –5.0 A
14.6
19.5
mΩ
RDS(on)3
VGS = –4.0 V, ID = –5.0 A
16.5
22.0
mΩ
VGS(off)
VDS = –10 V, ID = –1 mA
–1.0
–1.6
–2.5
V
Forward Transfer Admittance
| yfs |
VDS = –10 V, ID = –5.0 A
8.0
18.0
Drain Leakage Current
IDSS
VDS = 30 V, VGS = 0 V
Gate to Source Leakage Current
IGSS
VGS = # 20 V, VDS = 0 V
Input Capacitance
Ciss
VDS = –10 V
2600
pF
Output Capacitance
Coss
VGS = 0 V
810
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
350
pF
Turn-on Delay Time
td(on)
ID = –5.0 A
32
ns
VGS(on) = –10 V
185
ns
VDD = –15 V
155
ns
tf
RG = 10 Ω
110
ns
Total Gate Charge
QG
ID = –10 A
46
nC
Gate to Source Charge
QGS
VDD = –24 V
6.5
nC
Gate to Drain Charge
QGD
VGS = –10 V
12
nC
Drain to Source On-state Resistance
Gate to Source Cut-off Voltage
Rise Time
tr
Turn-off Delay Time
td(off)
Fall Time
Body Diode Forward Voltage
S
–1
µA
# 10
µA
VF(S-D)
IF = 10 A, VGS = 0 V
0.80
V
Reverse Recovery Time
trr
IF = 10 A, VGS = 0 V
50
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/ µs
46
nC
TEST CIRCUIT 2 GATE CHARGE
TEST CIRCUIT 1 SWITCHING TIME
D.U.T.
IG = 2 mA
D.U.T.
VGS
RL
VGS
PG.
RG
RG = 10 Ω
Wave Form
0
VGS (on)
10 %
90 %
PG.
VDD
90 %
ID
90 %
ID
VGS
0
I
D
Wave Form
τ
τ = 1 µs
Duty Cycle ≤ 1 %
2
0
10 %
10 %
tr
td (on)
ton
td (off)
tf
toff
Data Sheet G14285EJ1V0DS00
50 Ω
RL
VDD
µPA1731
TYPICAL CHARACTERISTICS (TA = 25 °C)
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
2.8
100
80
60
40
20
0
20
40
60
80
100 120 140 160
−1000
2.0
1.6
1.2
0.8
0.4
0
20
40
60
80
100 120 140 160
TA - Ambient Temperature - ˚C
FORWARD BIAS SAFE OPERATING AREA
Remark Mounted on ceramic substrate of
−100
ID(pulse)=40 A
10
Po
ms
0m
we
−1
1200 mm x 2.2 mm
s
10
ID(DC)=10 A
2
100 µs
1m
−10
Mounted on ceramic
substrate of
1200 mm2 x 2.2 mm
2.4
TA - Ambient Temperature - ˚C
ID - Drain Current - A
s
rD
iss
ipa
tion
Lim
ited
−0.1
TA = 25 ˚C
Single Pulse
−0.01
−0.1
−1
−10
−100
VDS - Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
1000
rth(t) - Transient Thermal Resistance - ˚C/W
•
Rth(ch-A) = 62.5˚C
100
10
1
0.1
0.01
0.001
Mounted on ceramic
substrate of 1200 mm2 x 2.2 mm
Single Pulse
10 µ
100µ
1m
10 m
100 m
1
10
100
1000
PW - Pulse Width - s
Data Sheet G14285EJ1V0DS00
3
µPA1731
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
−100
Pulsed
TA = −50˚C
−25˚C
25˚C
75˚C
125˚C
150˚C
−1
−0.1
ID - Drain Current - A
ID - Drain Current - A
−10
−0.01
−0.001
−0.0001
0
−50
−1.0
VDS = −10 V
−3.0
−4.0
−2.0
Pulsed
VGS = −10 V
−40
−30
−20
−10
1
VDS = −10 V
Pulsed
−100
−10
RDS(on) - Drain to Source On-state Resistance - mΩ
ID- Drain Current - A
4
RDS(on) - Drain to Source On-State Resistance - mΩ
TA = −50˚C
−25˚C
25˚C
75˚C
125˚C
150˚C
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
30
Pulsed
20
ID = −10 A
−5.0 A
10
VGS - Gate to Source Voltage - V
GATE TO SOURCE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
20
Pulsed
15
VGS = −4.0 V
−4.5 V
−10 V
10
5
0
−0.1
−1
−10
−100
−15
−10
−5
0
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
−100
VGS(off) - Gate to Source Cut-off Voltage - V
|yfs| - Forward Transfer Admittance - S
100
−1
−0.8
−0.6
VDS - Drain to Source Voltage - V
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
−0.1
−0.4
−0.2
0
VGS - Gate to Source Voltage - V
10
−4.5 V −4.0 V
−2.0
VDS = −10 V
ID = −1 mA
−1.5
−1.0
−0.5
0
−50
0
50
100
150
Tch - Channel Temperature - ˚C
ID - Drain Current - A
Data Sheet G14285EJ1V0DS00
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
100
25
Pulsed
VGS = −4.0 V
20
IF - Diode Forward Current - A
−4.5 V
15
−10 V
10
5
ID = −5.0 A
0
−50
0
50
100
VGS = −4.5 V
10
1
0.1
0.01
0.001
0
150
1.5
SWITCHING CHARACTERISTICS
−1 0000
1 000
−1 000
Coss
Crss
−100
VGS = 0 V
f = 1 MHz
−10
−0.1
−1
−10
tr
td(on), tr, td(off), tf - Switching Time - ns
Ciss
td(off)
tf
100
td(on)
10
1
−0.1
−100
−1
VDS - Drain to Source Voltage - V
REVERSE RECOVERY TIME vs.
DIODE CURRENT
10000
di/dt = 100 A/µ s
VGS = 0 V
1000
100
10
1
−0.1
−1
−10
VDS = −15 V
VGS = −10 V
RG = 10Ω
−10
−100
ID - Drain Current - A
−100
VDS - Drain to Source Voltage - V
Ciss, Coss, Crss - Capacitance - pF
1.0
0.5
VF - Source to Drain Voltage - V
Tch - Channel Temperature - ˚C
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
trr - Reverse Recovery Time - ns
0V
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
−40
−14
ID = −10 A
−12
−30
−20
−10
VGS
VDS = −24 V
−15 V
−6 V
−8
−6
−4
−10
−2
VDS
0
10
20
30
40
50
VGS - Gate to Source Voltage - V
RDS(on) - Drain to Source On-state Resistance - mΩ
µPA1731
0
QG - Gate Charge - nC
IF - Diode Current - A
Data Sheet G14285EJ1V0DS00
5
µPA1731
[MEMO]
6
Data Sheet G14285EJ1V0DS00
µPA1731
[MEMO]
Data Sheet G14285EJ1V0DS00
7
µPA1731
• The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
• No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
• NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
• Descriptions of circuits, software, and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these circuits,
software, and information in the design of the customer's equipment shall be done under the full responsibility
of the customer. NEC Corporation assumes no responsibility for any losses incurred by the customer or third
parties arising from the use of these circuits, software, and information.
• While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
• NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
M7 98. 8