MITSUBISHI MGF1952A

June /2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF1952A
Microwave Power MES FET (Leadless Ceramic Package)
DESCRIPTION
Outline Drawing
The MGF1952A is designed for use in S to Ku band power
amplifiers.
The lead-less ceramic package assures minimum parasitic losses.
FEATURES
High gain and High P1dB
Glp=7.0dB , P1dB=17dBm (Typ.) @ f=12GHz
Fig.1
APPLICATION
S to Ku band power Amplifiers
QUALITY GRADE
GG
ORDERING INFORMATION
Tape & reel
3000pcs./reel
Keep Safety first in your circuit designs!
ABSOLUTE MAXIMUM RATINGS
Symbol
VGDO
VGSO
Parameter
Gate to drain voltage
Gate to source voltage
(Ta=25°C )
Ratings
Unit
-8
V
-8
V
ID
Drain current
240
mA
PT
Tch
Total power dissipation
600
mW
Channel temperature
125
°C
Tstg
Storage temperature
-65 to +125
°C
ELECTRICAL CHARACTERISTICS
Synbol
V(BR)GDO
IDSS
VGS(off)
P1dB
Glp
Parameter
Mitsubishi Electric Corporation puts the maximum
effort into making semiconductor products better
and more reliable , but there is always the
possibility that trouble may occur with them.
Trouble with semiconductors may lead to personal
injury , fire or property damage. Remember to give
due consideration to safety when making your
circuit designs , with appropriate measure such
as (I) placement of substitutive , auxiliary circuits ,
(ii) use of non-flammable material or (iii) prevention
against any malfunction or mishap.
(Ta=25°C )
Test conditions
Limits
Unit
MIN.
TYP.
-8
-15
MAX
--
V
65
120
240
mA
Saturated drain current
Ig=-60µA
VGS=0V,VDS=3V
Gate to source cut-off voltage
VDS=3V,ID=600µA
-0.3
-1.4
-3.5
V
Output Power at 1dB gain
VDS=3V,ID=60mA
15
17
--
dBm
Compression
f=12GHz
VDS=3V,ID=60mA
5
7
--
dB
Gate to drain breakdown voltage
Linear Power Gain
f=12GHz,Pin=-5dBm
MITSUBISHI
(1/5)
June /2004
June /2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF1952A
Microwave Power MES FET (Leadless Ceramic Package)
Fig.1
Unit : mm
Top
Side
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Bottom
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Square shape electrode is Drain
‰…Š‡€
from "A" side view
1. Gate
2. Source
3. Drain
MITSUBISHI
(2/5)
June /2004
June /2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF1952A
Microwave Power MES FET (Leadless Ceramic Package)
TYPICAL CHARACTERISTICS
(Ta=25°C)
I D vs. VDS
Ta=25deg.C
VGS=-0.2V/STEP
180
Ta=25deg.C
VDS=3V
DRAIN CURRENTID(mA)
160
DRAIN CURRENT ID(mA)
I D vs. VGS
200
VGS=0V
140
120
100
80
60
40
20
0
0.0
1.0
2.0
3.0
4.0
5.0
-3.0
DRAIN TO SOURCE VOLTAGE V DS(V)
-2.5
-2.0
-1.5
-1.0
-0.5
0.0
GATE TO SOURCE VOLTAGE V GS(V)
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MITSUBISHI
(3/5)
June /2004
June /2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF1952A
Microwave Power MES FET (Leadless Ceramic Package)
S PARAMETERS
f
(GHz)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
S11
Mag. Angle
0.963 -32.6
0.888 -66.5
0.822 -89.7
0.764 -114.3
0.720 -132.8
0.685 -149.2
0.660 -165.2
0.643 -179.8
0.629 165.3
0.624 150.0
0.618 133.3
0.620 115.8
0.639 98.6
0.670 81.9
0.709 66.3
0.765 52.1
0.815 37.9
0.850 25.1
S21
Mag. Angle
6.695 154.5
6.024 128.4
5.294 110.6
4.599 93.5
4.030 79.6
3.591 67.1
3.243 54.4
2.993 42.2
2.785 30.5
2.614 18.5
2.460
6.4
2.310
-6.9
2.163 -19.8
2.017 -33.9
1.846 -47.2
1.700 -60.1
1.537 -73.9
1.353 -88.1
(Conditions : VDS=3V,ID=60mA,Ta=25deg.C)
MAG/MSG
S12
S22
K
Mag. Angle Mag. Angle
(dB)
0.024 72.0 0.314 -24.7
0.21
24.4
0.043 52.3 0.297 -51.3
0.38
21.4
0.056 42.0 0.281 -66.0
0.51
19.7
0.065 32.3 0.259 -83.0
0.64
18.5
0.071 24.2 0.254 -94.1
0.77
17.5
0.075 19.2 0.250 -100.0 0.90
16.8
0.079 14.0 0.247 -104.2 1.01
15.5
0.082
9.4
0.243 -108.3 1.10
13.7
0.088
4.4
0.232 -111.5 1.15
12.6
0.095
-0.8
0.214 -115.4 1.17
11.9
0.099
-8.3
0.179 -119.8 1.25
11.0
0.104 -14.8 0.137 -125.6 1.29
10.2
0.107 -21.6 0.085 -134.3 13.27
9.6
0.111 -30.5 0.025 -176.9 1.32
9.2
0.113 -39.4 0.063 61.7
1.33
8.7
0.113 -48.6 0.145 47.0
1.25
8.8
0.112 -57.5 0.237 37.8
1.18
8.8
0.109 -67.0 0.328 29.2
1.16
8.5
Gate
Source
Reference Point
Reference Point
Drain
Source
MITSUBISHI
(4/5)
June /2004
June /2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF1952A
Microwave Power MES FET (Leadless Ceramic Package)
Requests Regarding Safety Designs
Mitsubishi Electric constantly strives to raise the level of its quality and reliability. Despite these concerted efforts,
however, there will be occasions when our semiconductor products suffer breakdowns, malfunctions or other problems.
In view of this reality, it is requested that every feasible precaution be taken in the pursuit of redundancy design,
malfunction prevention design and other safety-related designs, to prevent breakdowns or malfunctions in our products
from resulting in accidents involving people, fires, social losses or other problems, thereby upholding the highest levels of
safety in the products when in use by customers.
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MITSUBISHI
(5/5)
June /2004