PANASONIC 2SB976

Transistors
2SB0976 (2SB976)
Silicon PNP epitaxial planar type
For low-frequency output amplification
For DC-DC converter
For stroboscope
Unit: mm
4.0±0.2
5.1±0.2
5.0±0.2
• Low collector-emitter saturation voltage VCE(sat)
• Large collector current IC
0.7±0.2
■ Features
12.9±0.5
0.7±0.1
■ Absolute Maximum Ratings Ta = 25°C
Symbol
Rating
Unit
Collector-base voltage (Emitter open)
VCBO
−27
V
Collector-emitter voltage (Base open)
VCEO
−18
V
Emitter-base voltage (Collector open)
VEBO
−7
V
Collector current
IC
−5
A
Peak collector current
ICP
−8
A
Collector power dissipation
PC
0.75
W
Junction temperature
Tj
150
°C
Storage temperature
Tstg
−55 to +150
°C
0.45+0.15
–0.1
0.45+0.15
–0.1
2.5+0.6
–0.2
2.5+0.6
–0.2
1
2 3
2.3±0.2
Parameter
1: Emitter
2: Collector
3: Base
TO-92-B1 Package
■ Electrical Characteristics Ta = 25°C ± 3°C
Parameter
Symbol
Collector-emitter voltage (Base open)
VCEO
IC = −1 mA, IB = 0
−18
V
Emitter-base voltage (Collector open)
VEBO
IE = −10 µA, IC = 0
−7
V
Collector-base cutoff current (Emitter open)
ICBO
VCB = −10 V, IE = 0
−100
nA
Emitter-base cutoff current (Collector open)
IEBO
VEB = −5 V, IC = 0
−1
µA
hFE
VCE = −2 V, IC = −2 A
625

VCE(sat)
IC = −3 A, IB = − 0.1 A
− 0.4
−1.0
V
VCB = −6 V, IE = 50 mA, f = 200 MHz
120
MHz
VCB = −20 V, IE = 0, f = 1 MHz
60
pF
Forward current transfer ratio *1, 2
Collector-emitter saturation voltage *1
Transition frequency
fT
Collector output capacitance
(Common base, input open circuited)
Cob
Conditions
Min
Typ
125
Max
Unit
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. *1: Pulse measurement
*2: Rank classification
Rank
Q
R
hFE
125 to 205
180 to 625
Note) The part number in the parenthesis shows conventional part number.
Publication date: March 2003
SJC00064BED
1
2SB0976
PC  Ta
IC  VCE
0.4
0.2
−25 mA
−4
−20 mA
−15 mA
−3
−10 mA
−2
−5 mA
−1
40
80
120
0
160
Ambient temperature Ta (°C)
−1 mA
−2
0
25°C
−25°C
− 0.1
− 0.1
−4
−6
−8
−1
−10
Collector current IC (A)
600
Ta = 75°C
400
25°C
−25°C
200
0
− 0.01
− 0.1
−1
Collector current IC (A)
Collector output capacitance
C (pF)
(Common base, input open circuited) ob
IE = 0
f = 1 MHz
Ta = 25°C
120
80
40
−10
−100
Collector-base voltage VCB (V)
2
0
− 0.4
− 0.8
−1.2
−1.6
−2.0
Base-emitter voltage VBE (V)
fT  I E
800
160
0
−1
0
−12
VCE = −2 V
Cob  VCB
200
−10
240
1 000
Forward current transfer ratio hFE
Collector-emitter saturation voltage VCE(sat) (V)
Ta = 75°C
−25°C
−4
hFE  IC
−10
− 0.01
− 0.01
Ta = 75°C
−6
Collector-emitter voltage VCE (V)
IC / IB = 30
−1
25°C
−8
−2
VCE(sat)  IC
−100
VCE = −2 V
−10
VCB = −6 V
Ta = 25°C
Transition frequency fT (MHz)
0
−30 mA
Collector current IC (A)
Collector current IC (A)
Collector power dissipation PC (mW)
0.6
−12
Ta = 25°C
IB = −40 mA −35 mA
−5
0.8
0
IC  VBE
−6
1.0
SJC00064BED
−10
200
160
120
80
40
0
1
10
Emitter current IE (mA)
100
Request for your special attention and precautions in using the technical information
and semiconductors described in this material
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if any of the products or technologies described in this material and controlled under the "Foreign
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product or technologies as described in this material.
(4) The products described in this material are intended to be used for standard applications or general
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Consult our sales staff in advance for information on the following applications:
• Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment,
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(5) The products and product specifications described in this material are subject to change without
notice for modification and/or improvement. At the final stage of your design, purchasing, or use of
the products, therefore, ask for the most up-to-date Product Standards in advance to make sure that
the latest specifications satisfy your requirements.
(6) When designing your equipment, comply with the guaranteed values, in particular those of maximum rating, the range of operating power supply voltage, and heat radiation characteristics. Otherwise, we will not be liable for any defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of
incidence of break down and failure mode, possible to occur to semiconductor products. Measures
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2002 JUL