NEC UPA2716GR

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µ PA2716GR
SWITCHING
P-CHANNEL POWER MOS FET
DESCRIPTION
PACKAGE DRAWING (Unit: mm)
The µ PA2716GR is P-Channel MOS Field Effect Transistor
designed for power management applications of notebook
computers and Li-ion battery protection circuit.
8
5
1, 2, 3
: Source
4
: Gate
5, 6, 7, 8 : Drain
FEATURES
• Low on-state resistance
RDS(on)1 = 7.0 mΩ MAX. (VGS = –10 V, ID = –7.0 A)
RDS(on)2 = 11.3 mΩ MAX. (VGS = –4.5 V, ID = –7.0 A)
• Low Ciss: Ciss = 3000 pF TYP.
• Built-in gate protection diode
• Small and surface mount package (Power SOP8)
4.4
5.37 MAX.
0.15
0.05 MIN.
PACKAGE
µ PA2716GR
6.0 ±0.3
4
0.8
+0.10
–0.05
1.8 MAX.
ORDERING INFORMATION
PART NUMBER
1.44
1
0.5 ±0.2
0.10
1.27 0.78 MAX.
0.40
+0.10
–0.05
0.12 M
Power SOP8
ABSOLUTE MAXIMUM RATINGS (TA = 25°C, All terminals are connected.)
Drain to Source Voltage (VGS = 0 V)
VDSS
–30
V
Gate to Source Voltage (VDS = 0 V)
VGSS
m20
V
Drain Current (DC)
ID(DC)
m14
A
ID(pulse)
m140
A
Drain Current (pulse)
Note1
Total Power Dissipation
Note2
PT1
2
W
Total Power Dissipation
Note3
PT2
2
W
Channel Temperature
Tch
150
°C
Storage Temperature
Tstg
–55 to + 150
°C
Single Avalanche Current
Note4
IAS
–14
A
Single Avalanche Energy
Note4
EAS
19.6
mJ
Notes 1.
2.
3.
4.
EQUIVALENT CIRCUIT
Drain
Body
Diode
Gate
Gate
Protection
Diode
Source
PW ≤ 10 µs, Duty Cycle ≤ 1%
Mounted on ceramic substrate of 1200 mm2 x 2.2 mm
Mounted on glass epoxy board of 25.4 mm x 25.4 mm x 0.8 mm, PW = 10 sec
Starting Tch = 25°C, VDD = –15 V, RG = 25 Ω, L = 100 µH, VGS = –20 → 0 V
Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When
this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated
voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with an NEC Electronics
sales representative for availability and additional information.
Document No. G16827EJ2V0DS00 (2nd edition)
Date Published July 2004 NS CP(K)
Printed in Japan
The mark
shows major revised points.
2004
µ PA2716GR
ELECTRICAL CHARACTERISTICS (TA = 25°C, All terminals are connected.)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Zero Gate Voltage Drain Current
IDSS
VDS = –30 V, VGS = 0 V
–1
µA
Gate Leakage Current
IGSS
VGS = m20 V, VDS = 0 V
m10
µA
–2.5
V
VGS(off)
VDS = –10 V, ID = –1 mA
–1.0
| yfs |
VDS = –10 V, ID = –7.0 A
10
RDS(on)1
VGS = –10 V, ID = –7.0 A
5.5
7.0
mΩ
RDS(on)2
VGS = –4.5 V, ID = –7.0 A
7.3
11.3
mΩ
RDS(on)3
VGS = –4.0 V, ID = –7.0 A
8.3
13.5
mΩ
Gate Cut-off Voltage
Forward Transfer Admittance
Note
Drain to Source On-state Resistance
Note
S
Input Capacitance
Ciss
VDS = –10 V
3000
pF
Output Capacitance
Coss
VGS = 0 V
960
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
500
pF
td(on)
VDD = –15 V, ID = –7.0 A
14
ns
VGS = –10 V
19
ns
RG = 10 Ω
680
ns
340
ns
Turn-on Delay Time
Rise Time
tr
Turn-off Delay Time
td(off)
Fall Time
tf
Total Gate Charge
QG
VDD = –24 V
95
nC
Gate to Source Charge
QGS
VGS = –10 V
11
nC
QGD
ID = –14 A
25
nC
Gate to Drain Charge
Body Diode Forward Voltage
Note
VF(S-D)
IF = 14 A, VGS = 0 V
0.83
V
Reverse Recovery Time
trr
IF = 14 A, VGS = 0 V
380
ns
Reverse Recovery Charge
Qrr
di/dt = 50 A/µs
690
nC
Note Pulsed
TEST CIRCUIT 1 AVALANCHE CAPABILITY
TEST CIRCUIT 2 SWITCHING TIME
D.U.T.
RG = 25 Ω
D.U.T.
L
RL
50 Ω
PG.
VGS = −20 → 0 V
VDD
RG
PG.
VGS(−)
VGS
Wave Form
0
VGS
10%
90%
VDD
VDS(−)
−
IAS
BVDSS
VDS
ID
VGS(−)
0
VDS
Wave Form
τ
VDD
Starting Tch
τ = 1 µs
Duty Cycle ≤ 1%
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
PG.
2
IG = −2 mA
RL
50 Ω
VDD
Data Sheet G16827EJ2V0DS
VDS
90%
90%
10% 10%
0
td(on)
tr td(off)
ton
tf
toff
µ PA2716GR
TYPICAL CHARACTERISTICS (TA = 25°C)
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
120
2.8
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
20
Mounted on ceramic
substrate of
1200 mm2 x 2.2 mm
2.4
2
1.6
1.2
0.8
0.4
0
0
0
25
50
75
100
125
150
175
0
25
TA - Ambient Temperature - °C
50
75
100
125
150
175
TA - Ambient Temperature - °C
FORWARD BIAS SAFE OPERATING AREA
-100
ID(pulse)
RDS(on) Limited
(at VGS = 10 V)
PW = 100 µs
ID(DC)
-10
1 ms
DC
-1
-0.1
10 ms
Power Dissipation Limited
TA = 25°C
Single pulse
100 ms
Mounted on ceramic substrate of
1200 mm2 x 2.2 mm
-0.01
-0.01
-0.1
-1
-10
-100
VDS - Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
1000
rth(t) - Transient Thermal Resistance - °C/W
ID - Drain Current - A
-1000
Rth(ch-A)2
100
Rth(ch-A)1
10
1
Single pulse, TA = 25°C
Rth(ch-A)1: Mounted on ceramic substrate of 1200 mm2 x 2.2 mm
Rth(ch-A)2: Mounted on glass epoxy board of 25.4 mm x 25.4 mm x 0.8 mm
0.1
100 µ
1m
10 m
100 m
1
10
100
1000
PW - Pulse Width - s
Data Sheet G16827EJ2V0DS
3
µ PA2716GR
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
-150
-1000
Pulsed
ID - Drain Current - A
ID - Drain Current - A
VDS = −10 V
Pulsed
VGS = −10 V
-125
−4.5 V
-100
-75
−4 V
-50
-100
TA = 150°C
75°C
25°C
−40°C
-10
-1
-0.1
-25
0
-0.01
0
-0.2
-0.4
-0.6
-0.8
-1
0
-1
VDS - Drain to Source Voltage - V
| yfs | - Forward Transfer Admittance - S
VGS(off) - Gate Cut-off Voltage - V
VDS = −10 V
ID = −1 mA
-1.5
-1.0
-0.5
0
0
50
100
150
TA = 150°C
75°C
25°C
−40°C
10
1
VDS = −10 V
Pulsed
0.1
-0.1
Pulsed
25
20
VGS = −10 V
−4.5 V
−4 V
5
0
-10
-100
-1000
RDS(on) - Drain to Source On-state Resistance - mΩ
RDS(on) - Drain to Source On-state Resistance - mΩ
30
-1
-10
-100
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
15
ID = −7 A
Pulsed
10
5
0
ID - Drain Current - A
4
-1
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
10
-5
100
Tch - Channel Temperature - °C
15
-4
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
-2.5
-50
-3
VGS - Gate to Source Voltage - V
GATE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
-2.0
-2
0
-5
-10
-15
VGS - Gate to Source Voltage - V
Data Sheet G16827EJ2V0DS
-20
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
20
10000
ID = −7 A
Pulsed
VGS = −4 V
−4.5 V
−10 V
10
5
0
-50
0
50
100
Ciss
1000
Coss
Crss
100
VGS = 0 V
f = 1 MHz
10
-0.1
150
Tch - Channel Temperature - °C
-100
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
-30
VDS - Drain to Source Voltage - V
10000
td(on), tr, td(off), tf - Switching Time - ns
-10
VDS - Drain to Source Voltage - V
SWITCHING CHARACTERISTICS
td(off)
1000
tf
100
tr
10
VDD = −15 V
VGS = −10 V
RG = 10 Ω
td(on)
1
-0.1
-15
ID = −14 A
VDD = −24 V
−15 V
−6 V
-20
-5
VGS
VDS
0
-1
-10
-100
0
40
60
80
0
100
REVERSE RECOVERY TIME vs.
DIODE FORWARD CURRENT
1000
trr - Reverse Recovery Time - ns
Pulsed
100
0V
VGS = −10 V
10
20
QG - Gate Charge - nC
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
1000
-10
-10
ID - Drain Current - A
IF - Diode Forward Current - A
-1
VGS - Gate to Source Voltage - V
15
Ciss, Coss, Crss - Capacitance - pF
RDS(on) - Drain to Source On-state Resistance - mΩ
µ PA2716GR
1
0.1
0.01
100
VGS = 0 V
di/dt = 50 A/µs
10
0
0.2
0.4
0.6
0.8
1
1.2
1.4
VF(S-D) - Source to Drain Voltage - V
0.1
1
10
100
IF - Diode Forward Current - A
Data Sheet G16827EJ2V0DS
5
µ PA2716GR
SINGLE AVALANCHE CURRENT vs.
INDUCTIVE LOAD
SINGLE AVALANCHE ENERGY
DERATING FACTOR
120
IAS = −14 A
-10
-1
EAS = 19.6 mJ
VDD = −15 V
VGS = −20 → 0 V
RG = 25 Ω
Starting Tch = 25°C
-0.1
0.01
VDD = −15 V
RG = 25 Ω
VGS = −20 → 0 V
IAS ≤ −14 A
100
80
60
40
20
0
0.1
1
L - Inductive Load - mH
6
Energy Derating Factor - %
IAS - Single Avalanche Current - A
-100
10
25
50
75
100
125
150
Starting Tch - Starting Channel Temperature - °C
Data Sheet G16827EJ2V0DS
µ PA2716GR
• The information in this document is current as of July, 2004. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC Electronics data sheets or
data books, etc., for the most up-to-date specifications of NEC Electronics products. Not all
products and/or types are available in every country. Please check with an NEC Electronics sales
representative for availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without the prior
written consent of NEC Electronics. NEC Electronics assumes no responsibility for any errors that may
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M8E 02. 11-1