HAT2096H Silicon N Channel Power MOS FET Power Switching ADE-208-1431B (Z) 3rd. Edition Aug. 2002 Features • Capable of 4.5 V gate drive • Low drive current • High density mounting • Low on-resistance RDS(on) = 4.2 mΩ typ. (at VGS = 10 V) Outline LFPAK 5 5 D 4 G 3 1 2 4 1, 2, 3 Source 4 Gate 5 Drain S S S 1 2 3 HAT2096H Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS 30 V Gate to source voltage VGSS ±20 V Drain current ID 40 A 160 A 40 A 20 W Note1 Drain peak current ID(pulse) Body-drain diode reverse drain current IDR Channel dissipation Pch Channel temperature Tch 150 °C Storage temperature Tstg –55 to + 150 °C Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Tc = 25°C Rev.2, Aug. 2002, page 2 of 10 Note2 HAT2096H Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V(BR)DSS 30 — — V ID = 10 mA, VGS = 0 Gate to source breakdown voltage V(BR)GSS ± 20 — — V IG = ±100 µA, VDS = 0 Gate to source leak current IGSS — — ± 10 µA VGS = ±16 V, VDS = 0 Zero gate voltege drain current IDSS — — 1 µA VDS = 30 V, VGS = 0 Gate to source cutoff voltage VGS(off) 1.0 — 2.5 V VDS = 10 V, I D = 1 mA Static drain to source on state RDS(on) — 4.2 5.3 mΩ ID = 20 A, VGS = 10 V resistance RDS(on) — 7.0 10 mΩ ID = 20 A, VGS = 4.5 V Forward transfer admittance |yfs| 30 50 — S ID = 20 A, VDS = 10 V Input capacitance Ciss — 2200 — pF VDS = 10 V Output capacitance Coss — 600 — pF VGS = 0 Reverse transfer capacitance Crss — 330 — pF f = 1 MHz Total gate charge Qg — 40 — nc VDD = 10 V Gate to source charge Qgs — 7 — nc VGS = 10 V Gate to drain charge Qgd — 8 — nc ID = 40 A Turn-on delay time td(on) — 20 — ns VGS = 10 V, ID = 20 A Rise time tr — 49 — ns VDD ≅ 10 V Turn-off delay time td(off) — 62 — ns RL = 0.5 Ω Fall time tf — 15 — ns Rg = 4.7 Ω Body–drain diode forward voltage VDF — 0.85 1.11 V IF = 40 A, VGS = 0 — 60 — ns IF = 40 A, VGS = 0 diF/ dt = 50 A/ µs Body–drain diode reverse recovery trr time Note3 Note3 Note3 Note3 Notes: 3. Pulse test Rev.2, Aug. 2002, page 3 of 10 HAT2096H Main Characteristics Power vs. Temperature Derating Maximum Safe Operation Area I D (A) 500 30 20 10 PW 10 Op s =1 0m era s tio 1 0.1 50 100 Case Temperature 150 200 n Operation in this area is limited by R DS(on) Tc (°C) 0.01 0.1 0.3 1 3 10 30 100 Drain to Source Voltage V DS (V) Typical Output Characteristics 50 Typical Transfer Characteristics 50 10 V 3.5 V V DS = 10 V Pulse Test Pulse Test (A) 40 ID 4.5 V 30 Drain Current I D (A) DC Tc = 25°C 1 shot Pulse 0 Drain Current 10 µ 10 0µ s 1m s 100 Drain Current Channel Dissipation Pch (W) 40 3V 20 10 40 30 20 25°C Tc = 75°C -25°C 10 VGS = 2.5 V 0 2 4 6 Drain to Source Voltage Rev.2, Aug. 2002, page 4 of 10 8 V DS (V) 10 0 1 2 3 Gate to Source Voltage 5 4 V GS (V) HAT2096H 0.16 0.08 I D = 10 A 0.04 5A 2A Static Drain to Source on State Resistance R DS(on) (m Ω) 0 4 8 12 Gate to Source Voltage 16 20 V GS (V) Static Drain to Source on State Resistance vs. Temperature 20 Pulse Test 16 I D = 2 A, 5 A, 10 A 12 8 V GS = 4.5 V 2 A, 5 A, 10 A 4 10 V 0 -40 Drain to Source On State Resistance R DS(on) (m Ω) 0.12 Pulse Test Static Drain to Source on State Resistance vs. Drain Current 100 Pulse Test 50 0 40 80 120 160 Case Temperature Tc (°C) 20 10 VGS = 4.5 V 5 10 V 2 1 0.1 0.2 0.5 1 2 5 10 20 50 100 Drain Current I D (A) Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance |yfs| (S) V DS(on) (V) 0.20 Drain to Source Voltage Drain to Source Saturation Voltage vs. Gate to Source Voltage 100 Tc = -25°C 30 75°C 10 25°C 3 1 0.3 0.1 0.1 V DS = 10 V Pulse Test 0.3 1 3 10 30 100 Drain Current I D (A) Rev.2, Aug. 2002, page 5 of 10 HAT2096H Typical Capacitance vs. Drain to Source Voltage 1000 10000 500 3000 Capacitance C (pF) Reverse Recovery Time trr (ns) Body-Drain Diode Reverse Recovery Time 200 100 50 20 10 0.1 Ciss 1000 di / dt = 50 A / µs V GS = 0, Ta = 25°C Coss 300 Crss 100 30 VGS = 0 f = 1 MHz 10 0.3 1 3 10 30 100 Reverse Drain Current I DR (A) 0 10 V DS 20 10 0 12 8 V DD = 25 V 10 V 5V 20 40 60 80 Gate Charge Qg (nc) Rev.2, Aug. 2002, page 6 of 10 4 0 100 V GS (V) 100 Switching Time t (ns) 30 16 V DD = 25 V 10 V 5V 50 Switching Characteristics V GS 40 40 200 20 Gate to Source Voltage V DS (V) Drain to Source Voltage I D = 40 A 30 Drain to Source Voltage V DS (V) Dynamic Input Characteristics 50 20 t d(off) 50 tr 20 t d(on) tf 10 5 V GS = 10 V , VDS = 10 V Rg = 4.7 Ω, duty < 1 % 2 0.1 0.2 0.5 1 2 Drain Current 5 10 I D (A) 20 HAT2096H Reverse Drain Current vs. Source to Drain Voltage Reverse Drain Current I DR (A) 50 40 10 V V GS = 0 5V 30 20 10 Pulse Test 0 0.4 0.8 1.2 Source to Drain Voltage 1.6 2.0 V SD (V) Normalized Transient Thermal Impedance vs. Pulse Width Normalized Transient Thermal Impedance γ s (t) 3 Tc = 25°C 1 D=1 0.5 0.3 0.1 0.03 0.2 θ ch - c(t) = γs (t) • θ ch - c θ ch - c = 6.25°C/ W, Tc = 25°C 0.1 0.05 PDM 0.02 1 0.0 0.01 10 µ lse PW T PW u tp ho T 1s 100 µ D= 1m 10 m 100 m 1 10 Pulse Width PW (s) Rev.2, Aug. 2002, page 7 of 10 HAT2096H Switching Time Test Circuit Switching Time Waveform Vout Monitor Vin Monitor Rg 90% D.U.T. RL Vin Vin 10 V V DS = 10 V Vout 10% 10% 90% td(on) Rev.2, Aug. 2002, page 8 of 10 tr 10% 90% td(off) tf HAT2096H Package Dimensions As of January, 2002 Unit: mm 4.9 5.3 Max 4.0 ± 0.2 +0.05 1.0 4.2 6.1 –0.3 +0.1 3.95 5 4 0˚ – 8˚ +0.25 +0.05 0.20 –0.03 0.6 –0.20 1.3 Max 1 1.1 Max +0.03 0.07 –0.04 3.3 0.25 –0.03 0.75 Max 1.27 0.10 0.40 ± 0.06 0.25 M Hitachi Code JEDEC JEITA Mass (reference value) LFPAK — — 0.080 g Rev.2, Aug. 2002, page 9 of 10 HAT2096H Disclaimer 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products. Sales Offices Hitachi, Ltd. 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(Taipei Branch Office) 4/F, No. 167, Tun Hwa North Road Hung-Kuo Building Taipei (105), Taiwan Tel : <886>-(2)-2718-3666 Fax : <886>-(2)-2718-8180 Telex : 23222 HAS-TP URL : http://www.hitachi.com.tw Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower World Finance Centre, Harbour City, Canton Road Tsim Sha Tsui, Kowloon Hong Kong Tel : <852>-2735-9218 Fax : <852>-2730-0281 URL : http://semiconductor.hitachi.com.hk Copyright © Hitachi, Ltd., 2002. All rights reserved. Printed in Japan. Colophon 6.0 Rev.2, Aug. 2002, page 10 of 10