IXYS IXFX80N50P

PolarHVTM HiPerFET
Power MOSFET
IXFK 80N50P
IXFX 80N50P
VDSS
ID25
RDS(on)
trr
N-Channel Enhancement Mode
Avalanche Rated
Fast Intrinsic Diode
Symbol
Test Conditions
VDSS
VDGR
TJ = 25° C to 150° C
TJ = 25° C to 150° C; RGS = 1 MΩ
500
500
V
V
VGSM
VGSM
Transient
Continuous
± 40
± 30
V
V
ID25
IL
IDM
TC = 25° C
Lead Current Limit, RMS
TC = 25° C, pulse width limited by TJM
80
75
200
A
A
A
IAR
EAR
EAS
TC = 25° C
TC = 25° C
TC = 25° C
80
80
3.5
A
mJ
J
dv/dt
IS ≤ IDM, di/dt ≤ 100 A/µs, VDD ≤ VDSS,
TJ ≤150° C, RG = 2 Ω
20
V/ns
PD
TC = 25° C
1040
W
Maximum Ratings
-55 ... +150
150
-55 ... +150
°C
°C
°C
300
260
°C
°C
20..120/4.5..25
N/lb
TJ
TJM
Tstg
TL
TSOLD
1.6 mm (0.062 in.) from case for 10 s
Plastic body for 10 seconds
FC
Mounting force (PLUS247)
Md
Mounting torque (TO-264)
Weight
TO-264
PLUS247
1.13/10 Nm/lb.in.
10
6
Symbol
Test Conditions
(TJ = 25° C unless otherwise specified)
g
g
Characteristic Values
Min. Typ.
Max.
BVDSS
VGS = 0 V, ID = 500 µA
500
VGS(th)
VDS = VGS, ID = 8 mA
3.0
IGSS
VGS = ± 30 VDC, VDS = 0
IDSS
VDS = VDSS
VGS = 0 V
RDS(on)
VGS = 10 V, ID = 0.5 ID25
© 2006 IXYS All rights reserved
= 500 V
= 80 A
≤ 65 mΩ
Ω
≤ 200 ns
TJ = 125° C
TO-264 (IXFK)
G
D
D (TAB)
S
PLUS247 (IXFX)
D
S
G = Gate
D = Drain
D (TAB)
S = Source
Tab = Collector
Features
l
l
l
International standard package
Unclamped Inductive Switching (UIS)
rated
Low package inductance
- easy to drive and to protect
V
Advantages
5.0
V
± 200
nA
l
25
2
µA
mA
l
65
l
Easy to mount
Space savings
High power density
mΩ
DS99437E(03/06)
IXFK 80N50P
IXFX 80N50P
Symbol
Test Conditions
Characteristic Values
(TJ = 25° C unless otherwise specified)
Min.
Typ.
Max.
gfs
VDS= 20 V; ID = 0.5 ID25, Note 1
45
Ciss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Coss
70
S
12.7
nF
1280
pF
120
pF
Crss
td(on)
25
ns
tr
VGS = 10 V, VDS = 0.5 VDSS, ID = 0.5 ID25
27
ns
td(off)
RG = 1 Ω (External)
70
ns
16
ns
197
nC
70
nC
64
nC
tf
Qg(on)
VGS= 10 V, VDS = 0.5 VDSS, ID = 0.5 ID25
Qgs
Qgd
0.12 ° CW
RthJC
RthCS
° C/W
0.15
Source-Drain Diode
Characteristic Values
(TJ = 25° C unless otherwise specified)
Min.
Typ.
Max.
Symbol
Test Conditions
IS
VGS = 0 V
80
A
ISM
Repetitive
200
A
VSD
IF = IS, VGS = 0 V,
1.5
V
trr
IF = 25 A, -di/dt = 100 A/µs
200
ns
QRM
VR = 100 V, VGS = 0 V
IRM
0.6
µC
6
A
PLUS 247TM (IXFX) Outline
Terminals: 1 - Gate
2 - Drain (Collector)
3 - Source (Emitter)
4 - Drain (Collector)
Dim.
A
A1
A2
b
b1
b2
C
D
E
e
L
L1
Q
R
Millimeter
Min. Max.
4.83
5.21
2.29
2.54
1.91
2.16
1.14
1.40
1.91
2.13
2.92
3.12
0.61
0.80
20.80 21.34
15.75 16.13
5.45 BSC
19.81 20.32
3.81
4.32
5.59
6.20
4.32
4.83
TO-264 (IXFK) Outline
Notes:
1. Pulse test, t ≤300 µs, duty cycle d≤ 2 %
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by 4,835,592
one or moreof the following U.S. patents: 4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1
6,534,343
6,583,505
Inches
Min. Max.
.190 .205
.090 .100
.075 .085
.045 .055
.075 .084
.115 .123
.024 .031
.819 .840
.620 .635
.215 BSC
.780 .800
.150 .170
.220 0.244
.170 .190
6,683,344
6,710,405B2
6,710,463
6,727,585
6,759,692
6,771,478 B2
IXFK 80N50P
IXFX 80N50P
Fig. 1. Output Characteristics
Fig. 2. Extended Output Characteristics
@ 25° C
VGS = 10V
70
VGS = 10V
160
8V
60
7V
50
40
30
8V
140
I D - Amperes
I D - Amperes
@ 25° C
180
80
6V
20
120
7V
100
80
60
6V
40
10
20
5V
5V
0
0
0
1
2
3
4
5
6
0
3
6
9
V D S - Volts
Fig. 3. Output Characteristics
80
18
21
24
27
3.4
VGS = 10V
70
3.1
R D S ( o n ) - Normalized
7V
60
I D - Amperes
15
Fig. 4. RDS(on) Norm alized to 0.5 ID25
Value vs. Junction Tem perature
@ 125° C
6V
50
40
30
20
5V
10
VGS = 10V
2.8
2.5
2.2
I D = 80A
1.9
1.6
I D = 40A
1.3
1
0.7
0
0.4
0
2
4
6
8
10
12
14
-50
-25
V D S - Volts
25
50
75
100
125
150
Fig. 6. Drain Current vs. Case
Tem perature
0.5 ID25 Value vs. ID
90
3.2
3
0
TJ - Degrees Centigrade
Fig. 5. RDS(on) Norm alized to
VGS = 10V
80
TJ = 125°C
2.8
70
2.6
2.4
I D - Amperes
R D S ( o n ) - Normalized
12
V D S - Volts
2.2
2
1.8
1.6
1.4
60
50
40
30
20
1.2
TJ = 25°C
1
10
0.8
0
0
20
40
60
80
100
120
I D - Amperes
© 2006 IXYS All rights reserved
140
160
180
-50
-25
0
25
50
75
100
TC - Degrees Centigrade
125
150
IXFK 80N50P
IXFX 80N50P
Fig. 8. Transconductance
140
140
120
120
100
100
80
g f s - Siemens
I D - Amperes
Fig. 7. Input Adm ittance
TJ = 125°C
25°C
60
-40°C
60
40
20
20
0
0
4.5
5
5.5
6
6.5
7
25°C
125°C
80
40
4
TJ = -40°C
0
7.5
20
40
V G S - Volts
80
100
120
140
I D - Amperes
Fig. 9. Source Current vs.
Source-To-Drain Voltage
Fig. 10. Gate Charge
10
250
VDS = 250V
9
VG S - Volts
200
I S - Amperes
60
150
100
8
I D = 40A
7
I G = 10mA
6
5
4
3
TJ = 125°C
50
2
TJ = 25°C
1
0
0
0.4
0.6
0.8
1
1.2
1.4
0
1.6
20
40
V S D - Volts
60
80
100 120 140 160 180 200
Q G - NanoCoulombs
Fig. 12. Forw ard-Bias
Safe Operating Area
Fig. 11. Capacitance
100000
1000
R DS(on) Limit
10000
C iss
I D - Amperes
Capacitance - PicoFarads
f = 1MHz
1000
C oss
100
25µs
100µs
1ms
10
100
TJ = 150°C
C rss
DC
10ms
TC = 25°C
10
1
0
5
10
15
20
25
30
35
40
V D S - Volts
IXYS reserves the right to change limits, test conditions, and dimensions.
10
100
V D S - Volts
1000
IXFK 80N50P
IXFX 80N50P
Fig. 13. Maxim um Transient Therm al Resistance
R ( t h ) J C - ºC / W
1.000
0.100
0.010
0.001
0.0001
0.001
0.01
0.1
Pulse Width - Seconds
© 2006 IXYS All rights reserved
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10