VISHAY SIHFBC40LC-E3

IRFBC40LC, SiHFBC40LC
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
•
•
•
•
•
•
•
600 V
RDS(on) (Ω)
VGS = 10 V
1.2
Qg (Max.) (nC)
39
Qgs (nC)
10
Qgd (nC)
19
Configuration
Single
D
Available
RoHS*
COMPLIANT
DESCRIPTION
TO-220
This new series of low charge Power MOSFETs achieve
significantly lower gate charge over conventional Power
MOSFETs. Utilizing the new LCDMOS technology, the
device improvements are achieved without added product
cost, allowing for reduced gate drive requirements and total
system savings. In addition reduced switching losses and
improved efficiency are achievable in a variety of high
frequency applications. Frequencies of a few MHz at high
current are possible using the new low charge Power
MOSFETs.
These device improvements combined with the proven
ruggedness and reliability that are characteristic of Power
MOSFETs offer the designer a new standard in power
transistors for switching applications.
G
S
G
Ultra Low Gate Charge
Reduced Gate Drive Requirement
Enhanced 30 V, VGS Rating
Reduced Ciss, Coss, Crss
Extremely High Frequency Operation
Repetitive Avalanche Rated
Lead (Pb)-free Available
D
S
N-Channel MOSFET
ORDERING INFORMATION
Package
TO-220
IRFBC40LCPbF
SiHFBC40LC-E3
IRFBC40LC
SiHFBC40LC
Lead (Pb)-free
SnPb
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER
Gate-Source Voltage
Continuous Drain Current
Pulsed Drain Currenta
Linear Derating Factor
Single Pulse Avalanche Energyb
Repetitive Avalanche Currenta
Repetitive Avalanche Energya
Maximum Power Dissipation
Peak Diode Recovery dV/dtc
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
Mounting Torque
VGS at 10 V
TC = 25 °C
TC = 100 °C
SYMBOL
LIMIT
UNIT
VGS
± 30
6.2
3.9
25
1.0
530
6.2
13
125
3.0
- 55 to + 150
300d
10
1.1
V
ID
IDM
TC = 25 °C
for 10 s
6-32 or M3 screw
EAS
IAR
EAR
PD
dV/dt
TJ, Tstg
A
W/°C
mJ
A
mJ
W
V/ns
°C
lbf · in
N·m
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. VDD = 50 V, starting TJ = 25 °C, L = 25 mH, RG = 25 Ω, IAS = 6.2 A (see fig. 12).
c. ISD ≤ 6.2 A, dI/dt ≤ 80 A/µs, VDD ≤ VDS, TJ ≤ 150 °C.
d. 1.6 mm from case.
* Pb containing terminations are not RoHS compliant, exemptions may apply
Document Number: 91114
S-81567-Rev. A, 28-Jul-08
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IRFBC40LC, SiHFBC40LC
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambient
RthJA
-
62
Case-to-Sink, Flat, Greased Surface
RthCS
0.50
-
Maximum Junction-to-Case (Drain)
RthJC
-
1.0
UNIT
°C/W
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
VDS
VGS = 0 V, ID = 250 µA
600
-
-
V
ΔVDS/TJ
Reference to 25 °C, ID = 1 mA
-
0.70
-
V/°C
VGS(th)
VDS = VGS, ID = 250 µA
2.0
-
4.0
V
Gate-Source Leakage
IGSS
VGS = ± 20
-
-
± 100
nA
Zero Gate Voltage Drain Current
IDSS
VDS = 600 V, VGS = 0 V
-
-
100
VDS = 480 V, VGS = 0 V, TJ = 125 °C
-
-
500
Gate-Source Threshold Voltage
Drain-Source On-State Resistance
Forward Transconductance
RDS(on)
gfs
ID = 3.7 Ab
VGS = 10 V
VDS = 100 V, ID = 3.7 Ab
µA
-
-
1.2
Ω
3.7
-
-
S
-
1100
-
-
140
-
-
15
-
-
-
39
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Total Gate Charge
Qg
Gate-Source Charge
Qgs
-
-
10
Gate-Drain Charge
Qgd
-
-
19
Turn-On Delay Time
td(on)
-
12
-
tr
-
20
-
-
27
-
-
17
-
-
4.5
-
Rise Time
Turn-Off Delay Time
Fall Time
Internal Drain Inductance
Internal Source Inductance
td(off)
VGS = 0 V
VDS = 25 V
f = 1.0 MHz, see fig. 5
VGS = 10 V
ID = 6.2 A, VDS = 360 V,
see fig. 6 and 13b
VDD = 300 V, ID = 6.2 A
RG = 9.1 Ω, RD = 47 Ω, see fig. 10b
tf
LD
LS
Between lead,
6 mm (0.25") from
package and center of
die contact
D
pF
nC
ns
nH
G
-
7.5
-
-
-
6.2
S
-
-
25
Vb
-
-
1.5
V
-
440
680
ns
-
2.1
3.2
µC
S
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
Pulsed Diode Forward Currenta
Body Diode Voltage
IS
ISM
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Forward Turn-On Time
ton
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
TJ = 25 °C, IS = 6.2 A, VGS = 0
TJ = 25 °C, IF = 6.2 A, dI/dt = 100 A/µsb
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width ≤ 300 µs; duty cycle ≤ 2 %.
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Document Number: 91114
S-81567-Rev. A, 28-Jul-08
IRFBC40LC, SiHFBC40LC
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
100
VGS
15 V
10 V
8.0 V
7.0 V
6.0 V
5.5 V
5.0 V
Bottom 4.5 V
Top
101
4.5 V
10-1
ID, Drain Current (A)
ID, Drain Current (A)
101
25 °C
100
20 µs Pulse Width
TC = 25 °C
10-2
10-2
10-1
100
101
4
4.5 V
10-1
10-2
10-2
91114_02
20 µs Pulse Width
TC = 150 °C
10-1
100
101
102
VDS, Drain-to-Source Voltage (V)
Fig. 2 - Typical Output Characteristics, TC = 150 °C
Document Number: 91114
S-81567-Rev. A, 28-Jul-08
6
7
8
9
10
Fig. 3 - Typical Transfer Characteristics
RDS(on), Drain-to-Source On Resistance
(Normalized)
ID, Drain Current (A)
100
VGS
15 V
10 V
8.0 V
7.0 V
6.0 V
5.5 V
5.0 V
Bottom 4.5 V
Top
5
VGS, Gate-to-Source Voltage (V)
91114_03
Fig. 1 - Typical Output Characteristics, TC = 25 °C
101
20 µs Pulse Width
VDS = 100 V
10-1
102
VDS, Drain-to-Source Voltage (V)
91114_01
150 °C
91114_04
3.5
3.0
ID = 6.2 A
VGS = 10 V
2.5
2.0
1.5
1.0
0.5
0.0
- 60 - 40 - 20 0
20 40 60 80 100 120 140 160
TJ, Junction Temperature (°C)
Fig. 4 - Normalized On-Resistance vs. Temperature
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IRFBC40LC, SiHFBC40LC
2400
VGS = 0 V, f = 1 MHz
Ciss = Cgs + Cgd, Cds Shorted
Crss = Cgd
Coss = Cds + Cgd
Capacitance (pF)
2000
1600
Ciss
1200
Coss
800
Crss
400
ISD, Reverse Drain Current (A)
Vishay Siliconix
101
25 °C
0
101
0.6
VDS, Drain-to-Source Voltage (V)
91114_05
Operation in this area limited
by RDS(on)
5
2
VDS = 300 V
102
ID, Drain Current (A)
VDS = 240 V
VDS = 180 V
8
5
10 µs
2
10
100 µs
5
2
1 ms
1
10 ms
5
2
0.1
4
TC = 25 °C
TJ = 150 °C
Single Pulse
5
For test circuit
see figure 13
0
0
91114_06
8
16
24
32
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
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4
2
10-2
0.1
40
QG, Total Gate Charge (nC)
1.4
1.2
VSD, Source-to-Drain Voltage (V)
103
16
1.0
Fig. 7 - Typical Source-Drain Diode Forward Voltage
ID = 5.2 A
12
0.8
91114_07
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
VGS, Gate-to-Source Voltage (V)
VGS = 0 V
100
100
20
150 °C
91114_08
2
5
1
2
5
10
2
5
102
2
5
103
2
5
104
VDS, Drain-to-Source Voltage (V)
Fig. 8 - Maximum Safe Operating Area
Document Number: 91114
S-81567-Rev. A, 28-Jul-08
IRFBC40LC, SiHFBC40LC
Vishay Siliconix
RD
VDS
VGS
D.U.T.
RG
+
- VDD
7.0
10 V
ID, Drain Current (A)
6.0
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
5.0
Fig. 10a - Switching Time Test Circuit
4.0
3.0
VDS
2.0
90 %
1.0
0.0
25
50
75
100
125
10 %
VGS
150
TC, Case Temperature (°C)
91114_09
td(on)
Fig. 9 - Maximum Drain Current vs. Case Temperature
td(off) tf
tr
Fig. 10b - Switching Time Waveforms
Thermal Response (ZthJC)
10
1
0 − 0.5
PDM
0.2
0.1
0.1
t1
0.05
t2
0.02
0.01
Notes:
1. Duty Factor, D = t1/t2
2. Peak Tj = PDM x ZthJC + TC
Single Pulse
(Thermal Response)
10-2
10-5
10-4
10-3
10-2
0.1
1
10
t1, Rectangular Pulse Duration (s)
91114_11
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
L
Vary tp to obtain
required IAS
VDS
VDS
tp
VDD
D.U.T.
RG
+
-
IAS
V DD
VDS
10 V
tp
0.01 Ω
Fig. 12a - Unclamped Inductive Test Circuit
Document Number: 91114
S-81567-Rev. A, 28-Jul-08
IAS
Fig. 12b - Unclamped Inductive Waveforms
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IRFBC40LC, SiHFBC40LC
Vishay Siliconix
EAS, Single Pulse Energy (mJ)
1200
ID
2.8 A
3.9 A
Bottom 5.2 A
Top
1000
800
600
400
200
0
VDD = 50 V
25
91114_12c
50
75
100
150
125
Starting TJ, Junction Temperature (°C)
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
Current regulator
Same type as D.U.T.
50 kΩ
QG
10 V
12 V
0.2 µF
0.3 µF
QGS
QGD
+
D.U.T.
VG
-
VDS
VGS
3 mA
Charge
IG
ID
Current sampling resistors
Fig. 13a - Basic Gate Charge Waveform
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Fig. 13b - Gate Charge Test Circuit
Document Number: 91114
S-81567-Rev. A, 28-Jul-08
IRFBC40LC, SiHFBC40LC
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
•
•
•
•
RG
dV/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by duty factor "D"
D.U.T. - device under test
Driver gate drive
P.W.
+
Period
D=
+
-
VDD
P.W.
Period
VGS = 10 V*
D.U.T. ISD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
Body diode
VDD
forward drop
Inductor current
Ripple ≤ 5 %
ISD
* VGS = 5 V for logic level devices
Fig. 14 -For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?91114.
Document Number: 91114
S-81567-Rev. A, 28-Jul-08
www.vishay.com
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Vishay
Disclaimer
All product specifications and data are subject to change without notice.
Vishay Intertechnology, Inc., its affiliates, agents, and employees, and all persons acting on its or their behalf
(collectively, “Vishay”), disclaim any and all liability for any errors, inaccuracies or incompleteness contained herein
or in any other disclosure relating to any product.
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information provided herein to the maximum extent permitted by law. The product specifications do not expand or
otherwise modify Vishay’s terms and conditions of purchase, including but not limited to the warranty expressed
therein, which apply to these products.
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Document Number: 91000
Revision: 18-Jul-08
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