VISHAY SIHFR420ATL-E3

IRFR420A, IRFU420A, SiHFR420A,
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
• Low Gate Charge Qg Results in Simple Drive
Requirement
500
RDS(on) (Ω)
VGS = 10 V
3.0
Qg (Max.) (nC)
17
Qgs (nC)
4.3
Qgd (nC)
8.5
Configuration
• Improved Gate, Avalanche and Dynamic dV/dt
Ruggedness
COMPLIANT
• Fully Characterized Capacitance and Avalanche Voltage
and Current
Single
• Effective Coss Specified
D
DPAK
(TO-252)
Available
RoHS*
• Lead (Pb)-free Available
IPAK
(TO-251)
APPLICATIONS
• Switch Mode Power Supply (SMPS)
G
• Uninterruptible Power Supply
• High Speed Power Switching
S
N-Channel MOSFET
ORDERING INFORMATION
Package
Lead (Pb)-free
SnPb
DPAK (TO-252)
DPAK (TO-252)
IRFR420APbF
IRFR420ATRPbFa
DPAK (TO-252)
IPAK (TO-251)
IRFR420ATRLPbF
IRFU420APbF
SiHFR420A-E3
SiHFR420AT-E3a
SiHFR420ATL-E3
SiHFU420A-E3
IRFR420A
-
-
IRFU420A
SiHFR420A
-
-
SiHFU420A
Note
a. See device orientation.
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
LIMIT
Drain-Source Voltage
VDS
500
Gate-Source Voltage
VGS
± 30
Continuous Drain Current
VGS at 10 V
TC = 25 °C
ID
TC = 100 °C
Pulsed Drain Currenta
IDM
Linear Derating Factor
UNIT
V
3.3
2.1
A
10
0.67
W/°C
Single Pulse Avalanche Energyb
EAS
140
mJ
Repetitive Avalanche Currenta
IAR
2.5
A
EAR
5.0
mJ
PD
83
W
dV/dt
3.4
V/ns
TJ, Tstg
- 55 to + 150
Repetitive Avalanche
Energya
TC = 25 °C
Maximum Power Dissipation
Peak Diode Recovery dV/dtc
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
for 10 s
300d
°C
Notes
a.
b.
c.
d.
Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
Starting TJ = 25 °C, L = 45 mH, RG = 25 Ω, IAS = 2.5 A (see fig. 12).
ISD ≤ 2.5 A, dI/dt ≤ 270 A/µs, VDD ≤ VDS, TJ ≤ 150 °C.
1.6 mm from case.
* Pb containing terminations are not RoHS compliant, exemptions may apply
Document Number: 91274
S-Pending-Rev. A, 21-Jul-08
WORK-IN-PROGRESS
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IRFR420A, IRFU420A, SiHFR420A,
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambient
RthJA
-
62
Case-to-Sink, Flat, Greased Surface
RthCS
0.50
-
Maximum Junction-to-Case (Drain)
RthJC
-
1.5
UNIT
°C/W
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
VDS
VGS = 0 V, ID = 250 µA
500
-
-
V
ΔVDS/TJ
Reference to 25 °C, ID = 1 mA
-
0.60
-
V/°C
VGS(th)
VDS = VGS, ID = 250 µA
2.0
-
4.5
V
nA
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
Drain-Source On-State Resistance
Forward Transconductance
IGSS
IDSS
RDS(on)
gfs
VGS = ± 30 V
-
-
± 100
VDS = 500 V, VGS = 0 V
-
-
25
VDS = 400 V, VGS = 0 V, TJ = 125 °C
-
-
250
-
-
3.0
Ω
VDS = 50 V, ID = 1.5 A
1.4
-
-
S
VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5
-
340
-
-
53
-
-
2.7
-
VDS = 1.0 V, f = 1.0 MHz
-
490
-
VDS = 400 V, f = 1.0 MHz
-
15
-
-
28
-
-
-
17
ID = 1.5 Ab
VGS = 10 V
µA
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Output Capacitance
Coss
Effective Output Capacitance
VGS = 0 V
Coss eff.
VDS = 0 V to 400
Vc
Total Gate Charge
Qg
Gate-Source Charge
Qgs
-
-
4.3
Gate-Drain Charge
Qgd
-
-
8.5
Turn-On Delay Time
td(on)
-
8.1
-
tr
-
12
-
-
16
-
-
13
-
-
-
3.3
-
-
10
Rise Time
Turn-Off Delay Time
Fall Time
td(off)
VGS = 10 V
ID = 2.5 A, VDS = 400 V,
see fig. 6 and 13b
VDD = 250 V, ID = 2.5 A,
RG = 21 Ω, RD = 97 Ω, see fig. 10b
tf
pF
pF
nC
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
Pulsed Diode Forward Currenta
Body Diode Voltage
IS
ISM
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Forward Turn-On Time
ton
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
TJ = 25 °C, IS = 2.5 A, VGS = 0
S
Vb
TJ = 25 °C, IF = 2.5 A, dI/dt = 100 A/µsb
-
-
1.6
V
-
330
500
ns
-
760
1140
µC
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width ≤ 300 µs; duty cycle ≤ 2 %.
c. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80 % VDS.
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Document Number: 91274
S-Pending-Rev. A, 21-Jul-08
IRFR420A, IRFU420A, SiHFR420A,
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
10
10
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
I D , Drain-to-Source Current (A)
I D , Drain-to-Source Current (A)
TOP
1
0.1
4.5V
20μs PULSE WIDTH
TJ = 25 °C
0.01
0.1
1
10
100
TJ = 150 ° C
1
TJ = 25 ° C
0.1
0.01
4.0
Fig. 1 - Typical Output Characteristics
I D , Drain-to-Source Current (A)
1
4.5V
20μs PULSE WIDTH
TJ = 150 ° C
10
VDS , Drain-to-Source Voltage (V)
Fig. 2 - Typical Output Characteristics
Document Number: 91274
S-Pending-Rev. A, 21-Jul-08
100
RDS(on) , Drain-to-Source On Resistance
(Normalized)
3.0
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
1
6.0
7.0
8.0
9.0
Fig. 3 - Typical Transfer Characteristics
TOP
0.1
5.0
VGS , Gate-to-Source Voltage (V)
VDS , Drain-to-Source Voltage (V)
10
V DS = 50V
20μs PULSE WIDTH
ID = 2.5A
2.5
2.0
1.5
1.0
0.5
0.0
-60 -40 -20
VGS = 10V
0
20
40
60
80 100 120 140 160
TJ , Junction Temperature ( °C)
Fig. 4 - Normalized On-Resistance vs. Temperature
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IRFR420A, IRFU420A, SiHFR420A,
Vishay Siliconix
10000
VGS = 0V,
f = 1 MHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
C, Capacitance(pF)
ISD , Reverse Drain Current (A)
Coss = Cds + Cgd
1000
10
Ciss
100
Coss
10
Crss
TJ = 150 ° C
1
TJ = 25 ° C
1
1
10
100
1000
0.1
0.4
VDS, Drain-to-Source Voltage (V)
V GS = 0 V
0.6
0.8
1.0
1.2
VSD ,Source-to-Drain Voltage (V)
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
Fig. 7 - Typical Source-Drain Diode Forward Voltage
ID = 2.5A
100
VDS = 400V
VDS = 250V
VDS = 100V
OPERATION IN THIS AREA LIMITED
BY RDS(on)
15
I D , Drain Current (A)
VGS , Gate-to-Source Voltage (V)
20
10
5
0
10
100us
1
FOR TEST CIRCUIT
SEE FIGURE 13
0
4
8
12
16
QG , Total Gate Charge (nC)
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
10us
0.1
1ms
TC = 25 ° C
TJ = 150 ° C
Single Pulse
10
10ms
100
1000
10000
VDS, Drain-to-Source Voltage (V)
Fig. 8 - Maximum Safe Operating Area
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Document Number: 91274
S-Pending-Rev. A, 21-Jul-08
IRFR420A, IRFU420A, SiHFR420A,
Vishay Siliconix
RD
VDS
5.0
VGS
D.U.T.
RG
+
- VDD
4.0
ID , Drain Current (A)
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
3.0
Fig. 10a - Switching Time Test Circuit
2.0
VDS
1.0
90 %
0.0
25
50
75
100
125
150
( ° C)
TC , Case Temperature
10 %
VGS
td(on)
Fig. 9 - Maximum Drain Current vs. Case Temperature
td(off) tf
tr
Fig. 10b - Switching Time Waveforms
Thermal Response
(Z thJC )
10
1
D = 0.50
0.20
0.10
P DM
0.1
0.05
t1
SINGLE PULSE
(THERMAL RESPONSE)
0.02
0.01
t2
Notes:
1. Duty factor D =
2. Peak T
0.01
0.00001
0.0001
0.001
0.01
t1/ t 2
J = P DM x Z thJC
+T C
0.1
1
t 1, Rectangular Pulse Duration (sec)
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
VDS
15 V
tp
L
VDS
D.U.T
RG
IAS
20 V
tp
Driver
+
A
- VDD
IAS
0.01 Ω
Fig. 12a - Unclamped Inductive Test Circuit
Document Number: 91274
S-Pending-Rev. A, 21-Jul-08
Fig. 12b - Unclamped Inductive Waveforms
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IRFR420A, IRFU420A, SiHFR420A,
300
TOP
250
BOTTOM
ID
1.1A
1.6A
2.5A
200
150
100
700
V DSav , Avalanche Voltage ( V )
EAS , Single Pulse Avalanche Energy (mJ)
Vishay Siliconix
650
600
50
550
0.0
0.5
0
25
50
75
100
125
Starting TJ , Junction Temperature ( °C)
150
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
1.0
1.5
2.0
2.5
IAV , Avalanche Current ( A)
Fig. 12d - Maximum Avalanche Energy vs. Drain Current
Current regulator
Same type as D.U.T.
QG
50 kΩ
12 V
10 V
0.2 µF
0.3 µF
QGS
QGD
+
D.U.T.
VG
-
VDS
VGS
3 mA
Charge
IG
ID
Current sampling resistors
Fig. 13a - Basic Gate Charge Waveform
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Fig. 13b - Gate Charge Test Circuit
Document Number: 91274
S-Pending-Rev. A, 21-Jul-08
IRFR420A, IRFU420A, SiHFR420A,
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T.
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
RG
•
•
•
•
dV/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by duty factor "D"
D.U.T. - device under test
Driver gate drive
P.W.
+
Period
D=
+
-
VDD
P.W.
Period
VGS = 10 V*
D.U.T. ISD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
VDD
Body diode forward drop
Inductor current
Ripple ≤ 5 %
ISD
* VGS = 5 V for logic level devices
Fig. 14 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?91274.
Document Number: 91274
S-Pending-Rev. A, 21-Jul-08
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Vishay
Disclaimer
All product specifications and data are subject to change without notice.
Vishay Intertechnology, Inc., its affiliates, agents, and employees, and all persons acting on its or their behalf
(collectively, “Vishay”), disclaim any and all liability for any errors, inaccuracies or incompleteness contained herein
or in any other disclosure relating to any product.
Vishay disclaims any and all liability arising out of the use or application of any product described herein or of any
information provided herein to the maximum extent permitted by law. The product specifications do not expand or
otherwise modify Vishay’s terms and conditions of purchase, including but not limited to the warranty expressed
therein, which apply to these products.
No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this
document or by any conduct of Vishay.
The products shown herein are not designed for use in medical, life-saving, or life-sustaining applications unless
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Document Number: 91000
Revision: 18-Jul-08
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