INFINEON BUZ103SL-4

BUZ 103SL-4
Preliminary data
SIPMOS ® Power Transistor
• Quad-channel
• Enhancement mode
• Logic level
• Avalanche-rated
• dv/dt rated
Type
VDS
ID
RDS(on)
Package
Ordering Code
BUZ 103SL-4
55 V
4.8 A
0.055 Ω
P-DSO-28
C67078-S. . . .- . .
Maximum Ratings
Parameter
Symbol
Continuous drain current one channel active
ID
TA = 25 °C
Values
Unit
A
4.8
Pulsed drain current one channel active
IDpuls
TA = 25 °C
19.2
EAS
Avalanche energy, single pulse
mJ
ID = 4.8 A, VDD = 25 V, RGS = 25 Ω
L = 12 mH, Tj = 25 °C
140
Reverse diode dv/dt
dv/dt
kV/µs
IS = 4.8 A, VDS = 40 V, diF/dt = 200 A/µs
Tjmax = 175 °C
6
Gate source voltage
VGS
Power dissipation ,one channel active
Ptot
TA = 25 °C
± 14
V
W
2.4
Operating temperature
Tj
-55 ... + 175
Storage temperature
Tstg
-55 ... + 175
IEC climatic category, DIN IEC 68-1
Semiconductor Group
°C
55 / 175 / 56
1
05/Sep/1997
BUZ 103SL-4
Preliminary data
Thermal Characteristics
Symbol
Parameter
Values
Unit
min.
typ.
max.
Thermal resistance, junction - soldering point 1)
RthJS
-
tbd
-
Thermal resistance, junction - ambient 2)
RthJA
-
62.5
-
K/W
1) Device on 50mm*50mm*1.5mm epoxy PCB FR4 with 6 cm2 (one layer,70µm thick) copper area for
Drain connection. PCB is vertical without blown air.
2) one channel active
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Static Characteristics
Drain- source breakdown voltage
V(BR)DSS
VGS = 0 V, ID = 0.25 mA, Tj = 25 °C
Gate threshold voltage
55
-
-
1.2
1.6
2
VGS(th)
VGS=VDS, ID = 50 µA
Zero gate voltage drain current
V
IDSS
µA
VDS = 55 V, VGS = 0 V, Tj = -40 °C
-
-
0.1
VDS = 55 V, VGS = 0 V, Tj = 25 °C
-
0.1
1
VDS = 55 V, VGS = 0 V, Tj = 150 °C
-
-
100
Gate-source leakage current
IGSS
VGS = 20 V, VDS = 0 V
Drain-Source on-resistance
-
10
100
Ω
RDS(on)
VGS = 5 V, ID = 4.8 A
Semiconductor Group
nA
-
2
0.0403
0.055
05/Sep/1997
BUZ 103SL-4
Preliminary data
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Dynamic Characteristics
Transconductance
gfs
VDS≥ 2 * ID * RDS(on)max, ID = 0 A
Input capacitance
tbd
pF
-
770
960
-
230
290
-
130
165
Crss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Turn-on delay time
-
Coss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Reverse transfer capacitance
-
Ciss
VGS = 0 V, VDS = 25 V, f = 1 MHz
Output capacitance
S
td(on)
ns
VDD = 30 V, VGS = 5 V, ID = 4.8 A
RG = 6.5 Ω
Rise time
-
50
75
-
30
45
-
20
30
-
40
60
tr
VDD = 30 V, VGS = 5 V, ID = 4.8 A
RG = 6.5 Ω
Turn-off delay time
td(off)
VDD = 30 V, VGS = 5 V, ID = 4.8 A
RG = 6.5 Ω
Fall time
tf
VDD = 30 V, VGS = 5 V, ID = 4.8 A
RG = 6.5 Ω
Gate charge at threshold
Qg(th)
VDD = 40 V, ID ≥ 0.1 A, VGS =0 to 1 V
Gate charge at 5.0 V
2
-
20
30
-
32.6
50
V(plateau)
VDD = 40 V, ID = 28 A
Semiconductor Group
1.33
Qg(total)
VDD = 40 V, ID = 4.8 A, VGS =0 to 10 V
Gate plateau voltage
-
Qg(5)
VDD = 40 V, ID = 4.8 A, VGS =0 to 5 V
Gate charge total
nC
V
-
3
2.94
05/Sep/1997
BUZ 103SL-4
Preliminary data
Electrical Characteristics, at Tj = 25°C, unless otherwise specified
Parameter
Symbol
Values
min.
typ.
Unit
max.
Reverse Diode
Inverse diode continuous forward current IS
TA = 25 °C
Inverse diode direct current, pulsed
-
-
19.2
V
0.9
1.6
trr
ns
-
55
85
Qrr
VR = 30 V, IF=lS, diF/dt = 100 A/µs
Semiconductor Group
4.8
-
VR = 30 V, IF=lS, diF/dt = 100 A/µs
Reverse recovery charge
-
VSD
VGS = 0 V, IF = 9.6 A
Reverse recovery time
-
ISM
TA = 25 °C
Inverse diode forward voltage
A
nC
-
4
93
140
05/Sep/1997
BUZ 103SL-4
Preliminary data
Power dissipation
Ptot = ƒ(TA)
Drain current
ID = ƒ(TA)
parameter: VGS ≥ 5 V
5.0
2.8
W
A
2.4
Ptot
ID
2.2
2.0
4.0
3.5
1.8
3.0
1.6
2.5
1.4
1.2
2.0
1.0
1.5
0.8
0.6
1.0
0.4
0.5
0.2
0.0
0.0
0
20
40
60
80
100 120 140
°C
180
0
20
40
60
80
100 120 140
TA
Safe operating area
ID = ƒ(VDS)
parameter: D = 0, TC = 25°C
ID
10 2
S
=
A
R
(
DS
on
180
Transient thermal impedance
Zth JA = ƒ(tp)
parameter: D = tp / T
/I D
10 2
°C
TA
VD
K/W
)
10 1
tp = 1.4ms
ZthJC
10 1
10 ms
10 0
10 -1
10 0
10 -2
D = 0.50
0.20
10 -3
0.10
10 -1
0.05
10 -4
0.02
DC
0.01
10 -5
single pulse
10 -2
0
10
10
1
V 10
10 -6
-8
-7
-6
-5
-4
-3
-2
-1
0
10
10
10
10
10
10
10
10 s 10
2
VDS
Semiconductor Group
tp
5
05/Sep/1997
BUZ 103SL-4
Preliminary data
Typ. drain-source on-resistance
RDS (on) = ƒ(ID)
parameter: tp = 80 µs, Tj = 25 °C
Typ. output characteristics
ID = ƒ(VDS)
parameter: tp = 80 µs
11
A
0.17
Pj tot = 2W
a
Ω
lki
hgf e
b
d
ID
VGS [V]
a
2.0
9
8
7
6
5
4
c
3
b
2.5
c
3.0
d
3.5
e
4.0
f
4.5
g
5.0
h
5.5
i
6.0
j
7.0
k
8.0
l
10.0
0.14
RDS (on)
0.12
0.10
0.08
c
0.06
d
e
f
g
hi
j
0.04
2
0.02
1
b
0
a
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
V
0.00
0
5.0
VGS [V] =
a
2.0
2.5
3.0
b
3.5
2
c
4.0
d
4.5
e
f
5.0 5.5
4
g
6.0
6
h
i
j
7.0 8.0 10.0
8
A
11
ID
VDS
Typ. transfer characteristics ID = f (VGS)
parameter: tp = 80 µs
VDS≥2 x ID x RDS(on)max
90
A
ID
70
60
50
40
30
20
10
0
0
1
2
3
Semiconductor Group
4
5
6
7
8
V
VGS
10
6
05/Sep/1997
BUZ 103SL-4
Preliminary data
Drain-source on-resistance
RDS (on) = ƒ(Tj)
parameter: ID = 4.8 A, VGS = 5 V
Gate threshold voltage
VGS (th) = ƒ(Tj)
parameter: VGS = VDS, ID = 50 µA
0.15
4.6
Ω
V
0.13
4.0
RDS (on)0.12
VGS(th)
3.6
0.11
3.2
0.10
2.8
0.09
0.08
2.4
98%
98%
0.07
2.0
0.06
typ
typ
0.05
1.6
0.04
1.2
2%
0.03
0.8
0.02
0.01
0.00
-60
0.4
-20
20
60
100
°C
0.0
-60
180
-20
20
60
100
°C
Tj
180
Tj
Typ. capacitances
Forward characteristics of reverse diode
IF = ƒ(VSD)
parameter: Tj, tp = 80 µs
C = f (VDS)
parameter:VGS = 0V, f = 1MHz
10 4
10 3
A
C
IF
pF
10 2
10 3
Ciss
10 1
Tj = 25 °C typ
Tj = 175 °C typ
Tj = 25 °C (98%)
Coss
Tj = 175 °C (98%)
10 2
0
Crss
5
10
Semiconductor Group
15
20
25
30
V
40
VDS
7
10 0
0.0
0.4
0.8
1.2
1.6
2.0
2.4
V
3.0
VSD
05/Sep/1997
BUZ 103SL-4
Preliminary data
Avalanche energy EAS = ƒ(Tj)
parameter: ID = 4.8 A, VDD = 25 V
RGS = 25 Ω, L = 12 mH
Typ. gate charge
VGS = ƒ(QGate)
parameter: ID puls = 5 A
16
150
mJ
V
130
EAS 120
VGS
110
12
100
10
90
80
8
70
60
0,2 VDS max
6
0,8 VDS max
50
40
4
30
20
10
0
20
2
40
60
80
100
120
140
°C
0
0
180
Tj
5
10
15
20
25
30
35
40
nC
50
QGate
Drain-source breakdown voltage
V(BR)DSS = ƒ(Tj)
65
V
V(BR)DSS
61
59
57
55
53
51
49
-60
-20
20
60
100
°C
180
Tj
Semiconductor Group
8
05/Sep/1997