TI SN74ALS234

× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
D
D
D
D
D
DW OR N PACKAGE
(TOP VIEW)
Asynchronous Operation
Organized as 64 Words by 4 Bits
Data Rates From 0 to 30 MHz
3-State Outputs
Package Options Include Plastic
Small-Outline Packages (DW), Plastic
J-Leaded Chip Carriers (FN), and Standard
Plastic 300-mil DIPs (N)
OE
IR
SI
D0
D1
D2
D3
GND
description
The SN74ALS234 is a 256-bit memory utilizing
advanced low-power Schottky IMPACT
technology. It features high speed with fast
fall-through times and is organized as 64 words by
4 bits.
1
16
2
15
3
14
4
13
5
12
6
11
7
10
8
9
VCC
SO
OR
Q0
Q1
Q2
Q3
RST
IR
OE
NC
VCC
SO
FN PACKAGE
(TOP VIEW)
A first-in, first-out (FIFO) memory is a storage
device that allows data to be written into and read
from its array at independent data rates. The
SN74ALS234 is designed to process data at rates
from 0 to 30 MHz in a bit-parallel format, word by
word.
SI
D0
NC
D1
D2
4
3 2 1 20 19
18
5
17
6
16
7
15
8
14
9 10 11 12 13
OR
Q0
NC
Q1
Q2
D3
GND
NC
RST
Q3
Data is written into memory on the rising edge of
the shift-in (SI) input. When SI goes low, the first
data word ripples through to the output (see
Figure 1). As the FIFO fills up, the data words
NC − No internal connection
stack up in the order they were written. When the
FIFO is full, additional shift-in pulses have no
effect. Data is shifted out of memory on the falling edge of the shift-out (SO) input (see Figure 2). When the FIFO
is empty, additional SO pulses have no effect. The last data word remains at the outputs until a new word falls
through or reset (RST) goes low.
Status of the SN74ALS234 FIFO memory is monitored by the output-ready (OR) and input-ready (IR) flags.
When OR is high, valid data is available at the outputs. OR is low when SO is high and stays low when the FIFO
is empty. IR is high when the inputs are ready to receive more data. IR is low when SI is high and stays low when
the FIFO is full.
When the FIFO is empty, input data is shifted to the output automatically when SI goes low. If SO is held high
during this time, the OR flag pulses high indicating valid data at the outputs (see Figure 3).
When the FIFO is full, data can be shifted in automatically by holding SI high and taking SO low. One propagation
delay after SO goes low, IR will go high. If SI is still high when IR goes high, data at the inputs are automatically
shifted in. Since IR is normally low when the FIFO is full and SI is high, only a high-level pulse is seen on the
IR output (see Figure 4).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
IMPACT is a trademark of Texas Instruments Incorporated.
Copyright  1993, Texas Instruments Incorporated
! " #$%! " &$'(#! )!%*
)$#!" # ! "&%##!" &% !+% !%" %," "!$%!"
"!)) -!.* )$#! &#%""/ )%" ! %#%""(. #($)%
!%"!/ (( &%!%"*
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1
× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
description (continued)
The FIFO must be reset after power up with a low-level pulse on the master reset (RST) input. This sets IR high
and OR low signifying that the FIFO is empty. Resetting the FIFO sets the outputs to a low logic level (see
Figure 1). If SI is high when RST goes high, the input data is shifted in and IR goes low and remains low until
SI goes low. If SI goes low before RST goes high, the input data will not be shifted in and IR goes high. Data
outputs are noninverting with respect to the data inputs and are at high impedance when the output-enable (OE)
input is high. OE does not affect the IR or OR.
The SN74ALS234 is characterized for operation from 0°C to 70°C.
logic symbol†
FIFO 64 × 4
SI
CTR
3
5 + /C1
G2
SO
15
14
3CT > 0
OR
(CT > 0) G4
4−
2
2CT < 64
G3
IR
(CT < 64) G5
CT = 0
9
RST
OE
D0
D1
D2
D3
R
1
EN6
4
1D
5
13
6
12
6
11
7
10
Q0
Q1
Q2
Q3
† This symbol is in accordance with ANSI/IEEE Standard 91-1984 and IEC Publication 617-12.
functional block diagram
D0
D1
D2
D3
IR
SI
RST
4
5
6
7
2
3
FIFO
Input
Stage
62 × 4 Bit
Register
FIFO
Output
Stage
InputControl
Logic
RegisterControl
Logic
OutputControl
Logic
9
Pin numbers shown are for the DW and N packages.
2
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•
13
12
11
10
15
14
Q0
Q1
Q2
Q3
SO
OR
× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
SI
RST
D1
D2
D3
D0
OE
Word 64
Data Inputs
logic diagram (positive logic)
Word 63
Words 4 − 6
Same as 3 or 63
Word 3
Word 2
Word 1
Q1
Q2
Q3
SO
OR
IR
Q0
Data Outputs
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3
× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
timing diagram
RST
SI
D3 −D0
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
W1
Don’t Care
W2
W1
W2
W63
W64
W1
SO
Word 1
Q3 −Q0
Invalid†
Word 2
Word 1‡
Word 2
Word 3
IR
OR
Clear
Shift In
W1
Full
Shift Out
W2
Empty
† The last data word shifted out of the FIFO remains at the output until a new word falls through or a RST pulse clears the FIFO.
‡ While the output data is considered valid only when the OR flag is high, the stored data remains at the outputs. Any additional words written into
the FIFO will stack up behind the first word and will not appear at the output until SO is taken low.
4
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•
× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
RST
tsu
SI
ÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎ
th
tsu
D3 −D0
tPLH
IR
tPHL
tPLH
Full
tPHL
tPLH
Empty
OR
tpd
tpd
Q3 −Q0
NOTE: SO is low.
Figure 1. Master Reset and Data-In Waveforms
SO
tPLH
OR
tPHL
tPLH
IR
Full
td(SOL-QX)
Q3 −Q0
tdis
ten
tpd
OE
NOTE: SI is low.
Figure 2. Data-Out Waveforms
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5
× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
ÎÎÎ
ÎÎÎ
D3 −D0
tsu
th
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎÎ
SI
SO
tPLH
OR
tw
Empty
td(QV-ORH)
Q3 −Q0
Invalid
Figure 3. Data Fall-Through Waveforms
SO
SI
IR
tPLH
tw
Full
Full
ÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎ
ÎÎÎÎÎÎÎÎ
D3 −D0
Figure 4. Automatic Data-In Waveforms
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage, VCC (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Input voltage, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Voltage applied to a disabled 3-state output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5.5 V
Operating free-air temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to GND.
6
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•
× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
recommended operating conditions
VCC
VIH
Supply voltage
VIL
Low-level input voltage
IOH
High-level output current
IOL
Low-level output current
fclock
Clock frequency
tw
Pulse duration
tsu
Setup time before SI↑
th
TA
Hold time, data after SI↑
High-level input voltage
MIN
NOM
MAX
4.5
5
5.5
2
Q outputs
− 2.6
IR and OR
− 0.4
Q outputs
24
IR and OR
8
0
SI or SO
High or low
15
RST
Low
15
Data
V
V
0.8
SI or SO
UNIT
30
V
mA
mA
MHz
ns
0
High (inactive)
RST
ns
15
17
Operating free-air temperature
ns
0
70
°C
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
VIK
TEST CONDITIONS
VCC = 4.5 V,
MIN
TYP†
II = − 18 mA
IOH = − 1 mA
MAX
UNIT
−1.2
V
Any Q
VCC = 4.5 V
IR, OR
VCC = 4.5 V,
0.4
VCC = 4.5 V
IOL = 12 mA
IOL = 24 mA
0.25
Any Q
0.35
0.5
0.25
0.4
VCC = 4.5 V
IOL = 4 mA
IOL = 8 mA
0.35
0.5
IOZH
IOZL
VCC = 5.5 V,
VCC = 5.5 V,
VO = 2.7 V
VO = 0.4 V
II
IIH
VCC = 5.5 V,
VCC = 5.5 V,
VI = 7 V
VI = 2.7 V
IIL
IO‡
VCC = 5.5 V,
VCC = 5.5 V,
VI = 0.4 V
VO = 2.25 V
VOH
VOL
IR, OR
ICC
VCC = 5.5 V
IOH = − 2.6 mA
IOH = − 0.4 mA
2.4
3.2
2.7
3.4
V
20
−30
V
µA
−20
µA
0.1
mA
20
µA
−0.1
mA
−112
mA
Low
100
145
High
97
142
mA
Disabled
103
148
† All typical values are at VCC = 5 V, TA = 25°C.
‡ The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
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7
× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
switching characteristics (see Figure 5)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 5 V,
CL = 50 pF,
R1 = 500 Ω,
R2 = 500 Ω,
TA = 25°C
MIN
fmax
tw‡
tw§
TYP
SO
35
30
IR high
15
8
ns
OR high
19
8
ns
6
Q valid after SO↓
13
SI↓
SI↓
tpd
tPHL
SO↓
tPLH
tPLH¶
SO↓
Q
9
−5
12
4
ns
ns
800
350
1000
20
26
8
30
16
21
6
25
OR
600
800
350
1000
ns
Q
13
17
4
22
ns
23
27
7
33
20
24
6
30
IR
SO↑
OR
ns
ns
ns
IR
600
800
350
1000
OR
22
26
10
34
IR
17
21
6
27
RST↓
Q
14
17
5
19
ns
OE↑
Q
7
13
2
15
ns
13
ns
tPHL
tPLH
RST↓
tPHL
tdis
ten
OE↓
Q
6
12
2
† For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
‡ The IR output pulse occurs when the FIFO is full, SI is high, and SO is pulsed (see Figure 4).
§ The OR output pulse occurs when the FIFO is empty, SO is high, and SI is pulsed (see Figure 3).
¶ Data throughput or fall-through times
8
MHz
600
SI↑
SO↓
MAX
30
Q valid before OR↑
tPLH
tPLH¶
MIN
35
td(SOL-QX)
SI↓
MAX
UNIT
SI
td(QV-ORH)
tpd
tPHL
VCC = 4.5 V to 5.5 V,
CL = 50 pF,
R1 = 500 Ω,
R2 = 500 Ω,
TA = MIN to MAX†
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•
ns
ns
× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
PARAMETER MEASUREMENT INFORMATION
7V
SWITCH POSITION TABLE
Open
S1
R1 = 500 Ω
From Output
Under Test
CL = 50 pF
(see Note A)
Test Point
R2 = 500 Ω
TEST
S1
tPLH
tPHL
Open
Open
tPZH
tPZL
Open
Closed
tPHZ
Open
tPLZ
Closed
LOAD CIRCUIT FOR 3-STATE OUTPUTS
3.5 V
High-Level
Pulse
1.3 V
0.3 V
tw
3.5 V
Timing
Input
1.3 V
Data
Input
3.5 V
1.3 V
1.3 V
0.3 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.3 V
1.3 V
3.5 V
Low-Level
Pulse
0.3 V
th
tsu
1.3 V
0.3 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
3.5 V
Output
Control
1.3 V
tPZL
1.3 V
tPLZ
0.3 V
In-Phase
Output
Waveform 1
S1 Closed
(see Note C)
VOH
1.3 V
VOL
1.3 V
VOL
0.3 V
tPZH
Waveform 2
S1 Open
(see Note C)
VOH
1.3 V
1.3 V
tPHZ
tPLH
tPHL
Out-of-Phase
Output
3.5 V
tPHL
tPLH
1.3 V
0.3 V
3.5 V
Input
(see Note B)
1.3 V
1.3 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOH
1.3 V
0.3 V
0V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, Zo = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
D. The outputs are measured one at a time with one transition per measurement.
Figure 5. Load Circuit and Voltage Waveforms
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9
× SDAS106B − OCTOBER 1986 − REVISED SEPTEMBER 1993
APPLICATION INFORMATION
IR
SO
IR
SO
IR
SO
SI
D0
D1
OR
Q0
Q1
SI
D0
D1
OR
Q0
Q1
SI
D0
D1
OR
Q0
Q1
D2
Q2
D2
Q2
D2
Q2
D3
Q3
D3
Q3
D3
Q3
RST
IR
RST
SI
RST
IR
SO
IR
SO
IR
SO
SI
D0
D1
OR
Q0
Q1
SI
D0
D1
OR
Q0
Q1
SI
D0
D1
OR
Q0
Q1
D2
Q2
D2
Q2
D2
Q2
D3
Q3
D3
Q3
D3
Q3
RST
RST
SO
IR
SO
IR
SO
SI
D0
D1
OR
Q0
Q1
SI
D0
D1
OR
Q0
Q1
SI
D0
D1
OR
Q0
Q1
D2
Q2
D2
Q2
D2
Q2
D3
Q3
D3
Q3
D3
Q3
RST
OR
RST
IR
RST
SO
RST
RST
Figure 6. 192-Word by 12-Bit Expansion
10
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