ILX551A 2048-pixel CCD Linear Sensor (B/W) Description The ILX551A is a reduction type CCD linear sensor designed for facsimile, image scanner and OCR use. This sensor reads B4 size documents at a density of 200DPI (Dot Per Inch). A built-in timing generator and clock-drivers ensure direct drive at 5V logic for easy use. Features • Number of effective pixels: 2048 pixels • Pixel size: 14µm × 14µm (14µm pitch) • Built-in timing generator and clock-drivers • Ultra low lag • Maximum clock frequency: 5MHz 22 pin DIP (Cer-DIP) 9 VDD2 11 φROG Block Diagram 15 NC VDD2 9 14 NC NC 10 13 NC φROG 11 Clock pulse generator Sample-and-hold pulse generator Output amplifier Sample-and-hold circuit SHSW 4 21 VDD2 Read out gate 14 15 22 18 20 VDD2 NC D14 VDD1 D15 1 12 GND VOUT 2048 19 8 GND VDD2 5 16 NC φCLK 7 8 NC VDD2 17 GND 7 6 NC NC 6 18 NC NC 5 3 φCLK NC 19 GND 21 VDD2 Clock-drivers 4 16 SHSW NC 20 VDD1 17 3 S1 NC 1 D33 2 GND S2 NC 22 VDD2 CCD analog shift register NC NC S2047 1 2 D34 S2048 VOUT Read out gate pulse generator 12 D35 Pin Configuration (Top View) Mode selector GND 13 D36 NC D37 V V °C °C NC 10 D38 NC D39 Absolute Maximum Ratings • Supply voltage VDD1 11 VDD2 6 • Operating temperature –10 to +55 • Storage temperature –30 to +80 Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits. –1– E00439-PS ILX551A Pin Description Pin No. Symbol Pin No. Description Symbol Description 1 VOUT Signal output 12 GND GND 2 NC NC 13 NC NC 3 NC NC 14 NC NC 4 SHSW Switch 15 NC NC 5 φCLK Clock pulse 16 NC NC 6 NC NC 17 GND GND 7 NC NC 18 NC NC 8 VDD2 5V power supply 19 GND GND 9 VDD2 5V power supply 20 VDD1 9V power supply 10 NC NC 21 VDD2 5V power supply 11 φROG Clock pulse 22 VDD2 5V power supply S/H → GND { with without S/H → V DD2 Recommended Supply Voltage Item Min. Typ. Max. Unit VDD1 8.5 9.0 9.5 V VDD2 4.75 5.0 5.25 V Note) Rules for raising and lowering power supply voltage To raise power supply voltage, first raise VDD1 (9V) and then VDD2 (5V). To lower voltage, first lower VDD2 (5V) and then VDD1 (9V). Mode Description Mode in use Pin condition S/H Pin 4 SHSW Yes GND No VDD2 Input Capacity of Pins Item Symbol Min. Typ. Max. Unit Input capacity of φCLK pin CφCLK — 10 — pF Input capacity of φROG pin CφROG — 10 — pF Recommended Input Pulse Voltage Min. Typ. Max. Unit Input clock high level 4.5 5.0 5.5 V Input clock low level 0.0 — 0.5 V Item –2– ILX551A Electrooptical Characteristics (Ta = 25°C, VDD1 = 9V, VDD2 = 5V, Clock frequency = 1MHz, Light source = 3200K, IR cut filter: CM-500S (t = 1.0mm)) Item Symbol Min. Typ. Max. Unit Remarks Secsitivity R 30 40 50 V/(lx · s) Note 1 Sensitivity nonuniformity PRNU — 2.0 8.0 % Note 2 Saturation output voltage VSAT 1.5 1.8 — V — Dark voltage average VDRK — 0.3 2.0 mV Note 3 Dark signal nonuniformity DSNU — 0.5 3.0 mV Note 3 Image lag IL — 0.02 — % Note 4 Dynamic range DR — 6000 — — Note 5 Saturation exposure SE — 0.045 — lx · s Note 6 9V supply current IVDD1 — 4.0 8.0 mA — 5V supply current IVDD2 — 1.8 5.0 mA — Total transfer efficiency TTE 92.0 97.0 — % — Output impedance ZO — 600 — Ω — Offset level VOS — 4.0 — V Note 7 Notes) 1. For the sensitivity test light is applied with a uniform intensity of illumination. 2. PRNU is defined as indicated below. Ray incidence conditions are the same as for Note 1. PRNU = (VMAX – VMIN)/2 VAVE × 100 [%] The maximum output is set to VMAX, the minimum output to VMIN and the average output to VAVE. 3. Integration time is 10ms. 4. VOUT = 500mV 5. DR = VSAT VDRK When optical accumulated time is shorter, the dynamic range gets wider because dark voltage is in proportion to optical accumulated time. VSAT R , 6. SE = 7. Vos is defined as indicated below. D31 OS D32 D33 S1 VOS GND –3– VOUT φCLK φROG 0 5 0 2 3 4 –4– 1-line output period (2087 pixels) Effective picture elements signal (2048 pixels) D31 D32 D33 S1 S2 S3 S4 Optical black (18 pixels) D11 D12 D13 D14 D15 D5 D6 Dummy signal (33 pixels) D2 D3 D4 5 2087 Dummy signal (6 pixels) S2045 S2046 S2047 S2048 D34 D35 D36 S37 S38 D39 1 Fig. 1. Clock Timing Diagram (without S/H mode) ILX551A 2 1 ILX551A Fig. 2. φCLK, VOUT Timing t1 t2 φCLK t4 , , , ,, t3 t5 VOUT t6 Item Symbol Min. Typ. Max. Unit φCLK pulse rise/fall time φCLK pulse duty ∗1 t1, t2 0 10 — ns — 40 50 60 % φCLK – VOUT 1 t5 50 80 110 ns φCLK – VOUT 2 t6 30 75 120 ns ∗1 100 × t3/(t3 + t4) Fig. 3. φROG, φCLK Timing φROG t8 t9 t10 φCLK t7 Item Symbol t11 Min. Typ. Max. Unit φROG, φCLK pulse timing t7, t11 500 1000 — ns φROG pulse rise/fall time t8, t10 0 10 — ns φROG pulse period t9 500 1000 — ns –5– ILX551A Example of Representative Characteristics Spectral sensitivity characteristics (Standard characteristics) 1.0 Ta = 25°C 0.9 Relative sensitivity 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 400 500 600 700 800 900 1000 Wavelength [nm] Dark signal voltage rate vs. Ambient temperature (Standard characteristics) VDD1, VDD2 supply current vs. Clock frequency (Standard characteristics) 10 10 5 5 IVDD1, IVDD2 – VDD1, VDD2 supply current [mA] Dark signal voltage rate IVDD1 IVDD2 1 0.5 0.1 0 10 20 30 40 50 1 0.5 0.1 0.1M 60 Ta – Ambient temperature [°C] 1M Clock frequency [Hz] –6– 5M 0.01µ 9V Output signal 10µ/16V 3kΩ 1Ω 2SA1175 2 1 12 13 14 15 16 17 18 19 20 21 22 VDD2 (D) 5V VDD2 (D) VOUT –7– NC VDD1 (A) 4 φCLK 5 6 7 8 9 10 φROG 11 0.01µ 22µ/10V Application circuits shown are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits or for any infringement of third party patent and other right due to same. 3 NC GND (A) SHSW NC φCLK GND (A) NC NC NC NC VDD2 (D) NC VDD2 (D) NC NC GND (D) φROG Application Circuit ILX551A ILX551A Notes of Handling 1) Static charge prevention CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following protective measures. a) Either handle bare handed or use non chargeable gloves, clothes or material. Also use conductive shoes. b) When handling directly use an earth band. c) Install a conductive mat on the floor or working table to prevent the generation of static electricity. d) Ionized air is recommended for discharge when handling CCD image sensor. e) For the shipment of mounted substrates, use boxes treated for prevention of static charges. , , 2) Notes on Handling CCD Cer-DIP Packages The following points should be observed when handling and installing cer DIP packages. a) Remain within the following limits when applying static load to the ceramic portion of the package: (1) Compressive strength: 39N/surface (Do not apply load more than 0.7mm inside the outer perimeter of the glass portion.) (2) Shearing strength: 29N/surface (3) Tensile strength: 29N/surface (4) Torsional strength: 0.9Nm Upper ceramic layer 29N 39N 29N 0.9Nm Low-melting glass Lower ceramic layer (1) (2) (3) (4) b) In addition, if a load is applied to the entire surface by a hard component, bending stress may be generated and the package may fracture, etc., depending on the flatness of the ceramic portion. Therefore, for installation, either use an elastic load, such as a spring plate, or an adhesive. c) Be aware that any of the following can cause the glass to crack: because the upper and lower ceramic layers are shielded by low-melting glass, (1) Applying repetitive bending stress to the external leads. (2) Applying heat to the external leads for an extended period of time with soldering iron. (3) Rapid cooling or heating. (4) Rapid cooling or impact to a limited portion of the low-melting glass with a small-tipped tool such as tweezers. (5) Prying the upper or lower ceramic layers away at a support point of the low-melting glass. Note that the preceding notes should also be observed when removing a component from a board after it has already been soldered. 3) Soldering a) Make sure the package temperature does not exceed 80°C. b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a grounded 30W soldering iron and solder each pin in less then 2 seconds. For repairs and remount, cool sufficiently. c) To dismount an imaging device, do not use a solder suction equipment. When using an electric desoldering tool, ground the controller. For the control system, use a zero cross type. –8– ILX551A 4) Dust and dirt protection a) Operate in clean environments. b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized air is recommended.) c) Clean with a cotton bud and ethyl alcohol if the glass surface is grease stained. Be careful not to scratch the glass. d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when moving to a room with great temperature differences. 5) Exposure to high temperatures or humidity will affect the characteristics. Accordingly avoid storage or usage in such conditions. 6) CCD image sensors are precise optical equipment that should not be subject to mechanical shocks. –9– 5.0 ± 0.5 – 10 – V H 7.35 ± 0.5 1 22 41.6 ± 0.5 Cer-DIP TIN PLATING 42 ALLOY 5.20g LS-A18-01(E) PACKAGE MATERIAL LEAD TREATMENT LEAD MATERIAL PACKAGE MASS DRAWING NUMBER 2.54 11 12 0.51 22pin DIP (400mil) 28.672 (14µm X 2048Pixels) No.1 Pixel PACKAGE STRUCTURE 4.0 ± 0.5 Unit: mm 3.65 0.3 10.0 ± 0.5 M 4.35 ± 0.5 Package Outline 0.25 0° to 9° 2. The thickness of the cover glass is 0.7mm, and the refractive index is 1.5. 1. The height from the bottom to the sensor surface is 2.45 ± 0.3mm. ILX551A Sony Corporation