TYSEMI FDN358P

SMD Type
Product specification
FDN358P
General Description
Features
SuperSOTTM-3 P-Channel logic level enhancement mode
power field effect transistors are produced using Fairchild's
proprietary, high cell density, DMOS technology. This very
high density process is especially tailored to minimize
on-state resistance. These devices are particularly suited for
low voltage applications in notebook computers, portable
phones, PCMCIA cards, and other battery powered circuits
where fast switching, and low in-line power loss are needed
in a very small outline surface mount package.
SuperSOTTM-8
SuperSOTTM-6
SuperSOTTM-3
-1.5 A, -30 V, RDS(ON) = 0.125 Ω @ VGS = -10 V
RDS(ON) = 0.20 Ω @ VGS = - 4.5 V.
High power version of industry SOT-23 package: identical
pin out to SOT-23; 30% higher power handling capability.
High density cell design for extremely low RDS(ON).
Exceptional on-resistance and maximum DC current
capability.
SO-8
SOIC-16
SOT-223
D
D
8
35
S
S
G
TM
SuperSOT -3
Absolute Maximum Ratings
G
TA = 25oC unless other wise noted
Symbol
Parameter
FDN358P
VDSS
Drain-Source Voltage
-30
V
VGSS
Gate-Source Voltage
±20
V
ID
Drain/Output Current - Continuous
-1.5
A
- Pulsed
PD
Maximum Power Dissipation
-5
(Note 1a)
(Note 1b)
TJ,TSTG
Units
Operating and Storage Temperature Range
0.5
W
0.46
-55 to 150
°C
THERMAL CHARACTERISTICS
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1a)
250
°C/W
RθJC
Thermal Resistance, Junction-to-Case
(Note 1)
75
°C/W
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SMD Type
Product specification
FDN358P
Electrical Characteristics (TA = 25 OC unless otherwise noted )
Symbol
Parameter
Conditions
Min
Typ
Max
Units
OFF CHARACTERISTICS
BVDSS
Drain-Source Breakdown Voltage
∆BVDSS/∆TJ
Breakdown Voltage Temp. Coefficient
VGS = 0 V, ID = -250 µA
-30
ID = -250 µA, Referenced to 25 C
IDSS
Zero Gate Voltage Drain Current
VDS = -24 V, VGS = 0 V
IGSSF
Gate - Body Leakage, Forward
VGS = 20 V, VDS = 0 V
IGSSR
Gate - Body Leakage, Reverse
VGS = -20 V, VDS = 0 V
-100
nA
o
V
TJ = 55°C
ON CHARACTERISTICS
mV/ oC
-28
-1
µA
-10
µA
100
nA
(Note 2)
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = -250 µA
∆VGS(th)/∆TJ
Gate Threshold Voltage Temp. Coefficient
ID = -250 µA, Referenced to 25 oC
-1
RDS(ON)
Static Drain-Source On-Resistance
VGS = -10 V, ID = -1.5 A
-1.5
-2
TJ =125°C
VGS = -4.5 V, ID = -1.2 A
V
mV/ oC
3
0.11
0.125
0.15
0.21
0.175
0.2
-5
Ω
ID(ON)
On-State Drain Current
VGS = -4.5 V, VDS = -5 V
gFS
Forward Transconductance
VDS = -10 V, ID = -1.5 A
7
A
S
VDS = -10 V, VGS = 0 V,
f = 1.0 MHz
270
pF
150
pF
45
pF
DYNAMIC CHARACTERISTICS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
SWITCHING CHARACTERISTICS
tD(on)
Turn - On Delay Time
tr
Turn - On Rise Time
tD(off)
Turn - Off Delay Time
tf
Turn - Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
(Note 2)
8
16
ns
7
14
ns
17
27
ns
10
1.8
ns
6.5
9.1
nC
VDD = -15 V, ID = -1 A,
VGS = -10 V, RGEN = 6 Ω
VDS = -5 V, ID = -1.5 A,
VGS = -10 V
1
nC
1.1
nC
DRAIN-SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS
IS
Maximum Continuous Drain-Source Diode Forward Current
VSD
Drain-Source Diode Forward Voltage
VGS = 0 V, IS = -0.42 A
-0.74
(Note 2)
-0.42
A
-1.2
V
Note:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the
drain pins. RθJC is guaranteed by
design while RθCA is determined by the user's board design.
Typical RθJA using the board layouts shown below on FR-4 PCB in a still air environment :
a. 250oC/W when mounted on
0.02 in2 pad of 2oz Cu.
a
b. 270oC/W when mounted on
a 0.001 in2 pad of 2oz Cu.
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%.
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