FDD8896_F085 N-Channel PowerTrench® MOSFET 30V, 94A, 5.7mΩ General Description Features This N-Channel MOSFET has been designed specifically to improve the overall efficiency of DC/DC converters using either synchronous or conventional switching PWM controllers. It has been optimized for low gate charge, low rDS(ON) and fast switching speed. • rDS(ON) = 5.7mΩ, VGS = 10V, ID = 35A • rDS(ON) = 6.8mΩ, VGS = 4.5V, ID = 35A • High performance trench technology for extremely low rDS(ON) • Low gate charge • High power and current handling capability Applications • Qualified to AEC Q101 • DC/DC converters • RoHS Compliant D D G S G D-PAK TO-252 (TO-252) S MOSFET Maximum Ratings TC = 25°C unless otherwise noted Symbol VDSS Drain to Source Voltage Parameter Ratings 30 Units V VGS Gate to Source Voltage ±20 V Continuous (TC = 25oC, VGS = 10V) (Note 1) 94 A Continuous (TC = 25oC, VGS = 4.5V) (Note 1) 85 A Continuous (Tamb = 25oC, VGS = 10V, with RθJA = 52oC/W) 17 A Drain Current ID Pulsed EAS PD TJ, TSTG Single Pulse Avalanche Energy (Note 2) Power dissipation Derate above 25oC Operating and Storage Temperature Figure 4 A 168 mJ 80 W 0.53 W/oC -55 to 175 oC Thermal Characteristics RθJC Thermal Resistance Junction to Case TO-252 1.88 o C/W RθJA Thermal Resistance Junction to Ambient TO-252 100 o C/W RθJA Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area 52 ©2012 Fairchild Semiconductor Corporation FDD8896_F085 Rev. C2 1 oC/W www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET January 2012 Device Marking FDD8896 Device FDD8896_F085 Package TO-252AA Reel Size 13” Tape Width 12mm Quantity 2500 units Electrical Characteristics TC = 25°C unless otherwise noted Symbol Parameter Test Conditions Min Typ Max Units V Off Characteristics BVDSS Drain to Source Breakdown Voltage IDSS Zero Gate Voltage Drain Current IGSS Gate to Source Leakage Current ID = 250μA, VGS = 0V VDS = 24V VGS = 0V TC = 150oC VGS = ±20V 30 - - - - 1 - - 250 - - ±100 nA - 2.5 V μA On Characteristics VGS(TH) rDS(ON) Gate to Source Threshold Voltage Drain to Source On Resistance VGS = VDS, ID = 250μA 1.2 ID = 35A, VGS = 10V - 0.0047 0.0057 ID = 35A, VGS = 4.5V - 0.0057 0.0068 ID = 35A, VGS = 10V, TJ = 175oC - 0.0075 0.0092 Ω Dynamic Characteristics CISS Input Capacitance COSS Output Capacitance CRSS Reverse Transfer Capacitance RG Gate Resistance Qg(TOT) Total Gate Charge at 10V - 2525 - - 490 - pF - 300 - pF VGS = 0.5V, f = 1MHz - 2.1 - Ω VGS = 0V to 10V - 46 60 nC VDS = 15V, VGS = 0V, f = 1MHz Qg(5) Total Gate Charge at 5V VGS = 0V to 5V Qg(TH) Threshold Gate Charge VGS = 0V to 1V Qgs Gate to Source Gate Charge Qgs2 Gate Charge Threshold to Plateau Qgd Gate to Drain “Miller” Charge Switching Characteristics VDD = 15V ID = 35A Ig = 1.0mA pF - 24 32 nC - 2.3 3.0 nC - 6.9 - nC - 4.6 - nC - 9.8 - nC (VGS = 10V) tON Turn-On Time - - 171 ns td(ON) Turn-On Delay Time - 9 - ns tr Rise Time ns td(OFF) Turn-Off Delay Time tf tOFF - 106 - - 53 - ns Fall Time - 41 - ns Turn-Off Time - - 143 ns V VDD = 15V, ID = 35A VGS = 10V, RGS = 6.2Ω Drain-Source Diode Characteristics ISD = 35A - - 1.25 ISD = 15A - - 1.0 V Reverse Recovery Time ISD = 35A, dISD/dt = 100A/μs - - 27 ns Reverse Recovered Charge ISD = 35A, dISD/dt = 100A/μs - - 12 nC VSD Source to Drain Diode Voltage trr QRR Notes: 1: Package current limitation is 35A. 2: Starting TJ = 25°C, L = 0.43mH, IAS = 28A, VDD = 27V, VGS = 10V. FDD8896_F085 Rev. C2 2 www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET Package Marking and Ordering Information 100 CURRENT LIMITED BY PACKAGE 1.0 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER 1.2 0.8 0.6 0.4 75 50 25 0.2 0 0 25 50 75 100 150 125 0 175 25 50 75 TC , CASE TEMPERATURE (oC) 100 125 150 175 TC, CASE TEMPERATURE (oC) Figure 1. Normalized Power Dissipation vs Case Temperature Figure 2. Maximum Continuous Drain Current vs Case Temperature 2 ZθJC, NORMALIZED THERMAL IMPEDANCE 1 DUTY CYCLE - DESCENDING ORDER 0.5 0.2 0.1 0.05 0.02 0.01 PDM 0.1 t1 t2 NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZθJC x RθJC + TC SINGLE PULSE 0.01 10-5 10-4 10-3 10-2 10-1 100 101 t, RECTANGULAR PULSE DURATION (s) Figure 3. Normalized Maximum Transient Thermal Impedance IDM, PEAK CURRENT (A) 1000 TC = 25oC FOR TEMPERATURES TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS: VGS = 4.5V 175 - TC I = I25 150 100 30 10-5 10-4 10-3 10-2 10-1 100 101 t, PULSE WIDTH (s) Figure 4. Peak Current Capability FDD8896_F085 Rev. C2 3 www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET Typical Characteristics TC = 25°C unless otherwise noted 1000 500 IAS, AVALANCHE CURRENT (A) ID, DRAIN CURRENT (A) 10μs 100 100μs 10 OPERATION IN THIS AREA MAY BE LIMITED BY rDS(ON) 1ms 1 10ms SINGLE PULSE TJ = MAX RATED TC = 25oC If R = 0 tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD) If R ≠ 0 tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1] 100 STARTING TJ = 25oC 10 DC STARTING TJ = 150oC 1 0.01 0.1 1 60 10 0.1 1 10 tAV, TIME IN AVALANCHE (ms) VDS, DRAIN TO SOURCE VOLTAGE (V) Figure 5. Forward Bias Safe Operating Area NOTE: Refer to Fairchild Application Notes AN7514 and AN7515 Figure 6. Unclamped Inductive Switching Capability 100 100 PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX VDD = 15V PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX 60 TJ = 25oC 40 VGS = 4V TC = 25oC 80 ID, DRAIN CURRENT (A) ID , DRAIN CURRENT (A) 80 VGS = 5V VGS = 3V 60 VGS = 10V 40 20 20 TJ = 175oC VGS = 2.5V TJ = -55oC 0 0 1.5 2.0 2.5 3.0 VGS , GATE TO SOURCE VOLTAGE (V) 0 3.5 0.2 0.4 0.6 0.8 VDS , DRAIN TO SOURCE VOLTAGE (V) Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics 14 1.6 NORMALIZED DRAIN TO SOURCE ON RESISTANCE PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX ID = 35A rDS(ON), DRAIN TO SOURCE ON RESISTANCE (mΩ) 100 12 10 8 6 ID = 1A PULSE DURATION = 80μs DUTY CYCLE = 0.5% MAX 1.4 1.2 1.0 0.8 VGS = 10V, ID = 35A 4 2 4 6 8 0.6 -80 10 VGS, GATE TO SOURCE VOLTAGE (V) Figure 9. Drain to Source On Resistance vs Gate Voltage and Drain Current FDD8896_F085 Rev. C2 -40 0 40 80 120 TJ, JUNCTION TEMPERATURE (oC) 160 200 Figure 10. Normalized Drain to Source On Resistance vs Junction Temperature 4 www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET Typical Characteristics TC = 25°C unless otherwise noted 1.2 1.2 ID = 250μA NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE NORMALIZED GATE THRESHOLD VOLTAGE VGS = VDS, ID = 250μA 1.0 0.8 0.6 0.4 -80 -40 0 40 80 120 160 1.1 1.0 0.9 -80 200 -40 TJ, JUNCTION TEMPERATURE (oC) Figure 11. Normalized Gate Threshold Voltage vs Junction Temperature 80 120 160 200 10 VGS , GATE TO SOURCE VOLTAGE (V) CISS = CGS + CGD C, CAPACITANCE (pF) 40 Figure 12. Normalized Drain to Source Breakdown Voltage vs Junction Temperature 5000 COSS ≅ CDS + CGD 1000 CRSS = CGD VDD = 15V 8 6 4 WAVEFORMS IN DESCENDING ORDER: ID = 35A ID = 5A 2 VGS = 0V, f = 1MHz 100 0.1 0 TJ , JUNCTION TEMPERATURE (oC) 0 1 10 VDS , DRAIN TO SOURCE VOLTAGE (V) 0 30 Figure 13. Capacitance vs Drain to Source Voltage FDD8896_F085 Rev. C2 10 20 30 Qg, GATE CHARGE (nC) 40 50 Figure 14. Gate Charge Waveforms for Constant Gate Current 5 www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET Typical Characteristics TC = 25°C unless otherwise noted VDS BVDSS tP L VDS VARY tP TO OBTAIN REQUIRED PEAK IAS IAS + RG VDD VDD - VGS DUT tP IAS 0V 0 0.01Ω tAV Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms VDS VDD Qg(TOT) VDS L VGS VGS = 10V VGS Qg(5) + Qgs2 VDD VGS = 5V DUT VGS = 1V Ig(REF) 0 Qg(TH) Qgs Qgd Ig(REF) 0 Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms VDS tON tOFF td(ON) td(OFF) RL tf tr VDS 90% 90% + VGS VDD - 10% 0 10% DUT 90% RGS VGS VGS 0 Figure 19. Switching Time Test Circuit FDD8896_F085 Rev. C2 50% 10% 50% PULSE WIDTH Figure 20. Switching Time Waveforms 6 www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET Test Circuits and Waveforms ( TJM – TA ) P DM = ----------------------------Rθ JA 125 RθJA = 33.32+ 23.84/(0.268+Area) EQ.2 RθJA = 33.32+ 154/(1.73+Area) EQ.3 RθJA (oC/W) 100 (EQ. 1) 75 50 In using surface mount devices such as the TO-252 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of PDM is complex and influenced by many factors: 25 0.01 (0.0645) 0.1 (0.645) 1 10 (6.45) (64.5) AREA, TOP COPPER AREA in2 (cm2) Figure 21. Thermal Resistance vs Mounting Pad Area 1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 2. The number of copper layers and the thickness of the board. 3. The use of external heat sinks. 4. The use of thermal vias. 5. Air flow and board orientation. 6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in. Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the RθJA for the device as a function of the top copper (component side) area. This is for a horizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized maximum transient thermal impedance curve. Thermal resistances corresponding to other copper areas can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeters square. The area, in square inches or square centimeters is the top copper area including the gate and source pads. 23.84 ( 0.268 + Area ) R θJA = 33.32 + ------------------------------------- (EQ. 2) Area in Inches Squared 154 ( 1.73 + Area ) R θJA = 33.32 + ---------------------------------- (EQ. 3) Area in Centimeters Squared FDD8896_F085 Rev. C2 7 www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET Thermal Resistance vs. Mounting Pad Area The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, PDM, in an application. Therefore the application’s ambient temperature, TA (oC), and thermal resistance RθJA (oC/W) must be reviewed to ensure that TJM is never exceeded. Equation 1 mathematically represents the relationship and serves as the basis for establishing the rating of the part. .SUBCKT FDD8896 2 1 3 ; rev July 2003 Ca 12 8 2.3e-9 Cb 15 14 2.3e-9 Cin 6 8 2.3e-9 LDRAIN DPLCAP 10 RSLC2 5 51 EVTHRES + 19 8 + LGATE GATE 1 11 + 17 EBREAK 18 - 50 RDRAIN 6 8 EVTEMP RGATE + 18 22 9 20 21 16 DBODY MWEAK 6 MMED MSTRO RLGATE LSOURCE CIN Lgate 1 9 4.6e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 1.7e-9 8 7 RSOURCE RLSOURCE S1A RLgate 1 9 46 RLdrain 2 5 10 RLsource 3 7 17 Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD ESLC ESG DBREAK + It 8 17 1 RLDRAIN RSLC1 51 Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD Ebreak 11 7 17 18 32.6 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1 5 12 S2A 13 8 15 14 13 S1B CA RBREAK 17 18 RVTEMP S2B 13 19 CB 6 8 EGS VBAT 5 8 EDS - IT 14 + + - Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 2.2e-3 Rgate 9 20 2.1 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 2e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD + 8 22 RVTHRES Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*500),10))} .MODEL DbodyMOD D (IS=5E-12 IKF=10 N=1.01 RS=2.6e-3 TRS1=8e-4 TRS2=2e-7 + CJO=8.8e-10 M=0.57 TT=1e-16 XTI=0.9) .MODEL DbreakMOD D (RS=8e-2 TRS1=1e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=9.4e-10 IS=1e-30 N=10 M=0.4) .MODEL MmedMOD NMOS (VTO=1.85 KP=10 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2.1 T_ABS=25) .MODEL MstroMOD NMOS (VTO=2.34 KP=350 IS=1e-30 N=10 TOX=1 L=1u W=1u T_ABS=25) .MODEL MweakMOD NMOS (VTO=1.55 KP=0.05 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=21 RS=0.1 T_ABS=25) .MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-4e-7) .MODEL RdrainMOD RES (TC1=1e-4 TC2=8e-6) .MODEL RSLCMOD RES (TC1=9e-4 TC2=1e-6) .MODEL RsourceMOD RES (TC1=7.5e-3 TC2=1e-6) .MODEL RvthresMOD RES (TC1=-1.7e-3 TC2=-8.8e-6) .MODEL RvtempMOD RES (TC1=-2.6e-3 TC2=2e-7) .MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-3) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3 VOFF=-4) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-0.5) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.5 VOFF=-2) .ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley. FDD8896_F085 Rev. C2 8 www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET PSPICE Electrical Model rev July 2003 template FDD8896 n2,n1,n3 =m_temp electrical n2,n1,n3 number m_temp=25 { var i iscl dp..model dbodymod = (isl=5e-12,ikf=10,nl=1.01,rs=2.6e-3,trs1=8e-4,trs2=2e-7,cjo=8.8e-10,m=0.57,tt=1e-16,xti=0.9) dp..model dbreakmod = (rs=8e-2,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=9.4e-10,isl=10e-30,nl=10,m=0.4) m..model mmedmod = (type=_n,vto=1.85,kp=10,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=2.34,kp=350,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.55,kp=0.05,is=1e-30, tox=1,rs=0.1) LDRAIN sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-3) DPLCAP 5 sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3,voff=-4) 10 sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-2,voff=-0.5) RLDRAIN RSLC1 sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-0.5,voff=-2) 51 c.ca n12 n8 = 2.3e-9 RSLC2 c.cb n15 n14 = 2.3e-9 ISCL c.cin n6 n8 = 2.3e-9 spe.ebreak n11 n7 n17 n18 = 32.6 GATE spe.eds n14 n8 n5 n8 = 1 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1 RDRAIN 6 8 ESG EVTHRES + 19 8 + LGATE DBREAK 50 - dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod EVTEMP RGATE + 18 22 9 20 21 11 DBODY 16 MWEAK 6 EBREAK + 17 18 - MMED MSTRO RLGATE CIN DRAIN 2 8 LSOURCE 7 SOURCE 3 RSOURCE RLSOURCE i.it n8 n17 = 1 S1A 12 l.lgate n1 n9 = 4.6e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 1.7e-9 S2A S1B 15 17 18 RVTEMP S2B 13 CA res.rlgate n1 n9 = 46 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 17 14 13 13 8 RBREAK CB 6 8 EGS 19 - IT 14 + + VBAT 5 8 EDS - m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u, temp=m_temp m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u, temp=m_temp m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u, temp=m_temp + 8 22 RVTHRES res.rbreak n17 n18 = 1, tc1=8.3e-4,tc2=-4e-7 res.rdrain n50 n16 = 2.2e-3, tc1=1e-4,tc2=8e-6 res.rgate n9 n20 = 2.1 res.rslc1 n5 n51 = 1e-6, tc1=9e-4,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 2e-3, tc1=7.5e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-1.7e-3,tc2=-8.8e-6 res.rvtemp n18 n19 = 1, tc1=-2.6e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/500))** 10)) } } FDD8896_F085 Rev. C2 9 www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET SABER Electrical Model th JUNCTION REV 23 July 2003 FDD8896T CTHERM1 TH 6 9e-4 CTHERM2 6 5 1e-3 CTHERM3 5 4 2e-3 CTHERM4 4 3 3e-3 CTHERM5 3 2 7e-3 CTHERM6 2 TL 8e-2 RTHERM1 CTHERM1 6 RTHERM1 TH 6 3.0e-2 RTHERM2 6 5 1.0e-1 RTHERM3 5 4 1.8e-1 RTHERM4 4 3 2.8e-1 RTHERM5 3 2 4.5e-1 RTHERM6 2 TL 4.6e-1 RTHERM2 CTHERM2 5 SABER Thermal Model SABER thermal model FDD8896T template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 6 =9e-4 ctherm.ctherm2 6 5 =1e-3 ctherm.ctherm3 5 4 =2e-3 ctherm.ctherm4 4 3 =3e-3 ctherm.ctherm5 3 2 =7e-3 ctherm.ctherm6 2 tl =8e-2 RTHERM3 CTHERM3 4 RTHERM4 rtherm.rtherm1 th 6 =3.0e-2 rtherm.rtherm2 6 5 =1.0e-1 rtherm.rtherm3 5 4 =1.8e-1 rtherm.rtherm4 4 3 =2.8e-1 rtherm.rtherm5 3 2 =4.5e-1 rtherm.rtherm6 2 tl =4.6e-1 } CTHERM4 3 RTHERM5 CTHERM5 2 RTHERM6 CTHERM6 tl FDD8896_F085 Rev. C2 10 CASE www.fairchildsemi.com FDD8896_F085 N-Channel PowerTrench® MOSFET PSPICE Thermal Model TRADEMARKS The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks. 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Obsolete Not In Production Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only. Rev. I61 FDD8896_F085 Rev. C2 11 www.fairchildsemi.com