NEC UPA1757

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µ PA1757
SWITCHING
N-CHANNEL POWER MOS FET
INDUSTRIAL USE
Description
Package Drawing (Unit : mm)
This product is Dual N-Channel MOS Field Effect Transistor
designed for power management application of
notebook computers, and Li-ion battery application.
8
5
1 ; Source 1
2 ; Gate 1
7, 8 ; Drain 1
Features
• Dual MOS FET chips in small package
3 ; Source 2
4 ; Gate 2
5, 6 ; Drain 2
• 2.5 V gate drive type and low on-resistance
RDS(on)1 = 23 mΩ (MAX.) (VGS = 4.5 V, ID = 3.5 A)
0.05 Min.
• Small and surface mount package
(Power SOP8)
4.4
5.37 Max.
0.8
+0.10
–0.05
• Built-in G-S protection diode
6.0 ±0.3
4
0.15
Ciss = 750 pF Typ.
1.8 Max.
• Low Ciss
1.44
1
RDS(on)2 = 32 mΩ (MAX.) (VGS = 2.5 V, ID = 3.5 A)
1.27
0.40
0.5 ±0.2
0.10
0.78 Max.
+0.10
–0.05
0.12 M
Ordering information
Part Number
Package
µ PA1757G
Power SOP8
Absolute Maximum Ratings (TA = 25 °C)
Drain to source voltage
VDSS
20
V
Gate to source voltage
VGSS
±12.0
V
Drain current (DC)
ID(DC)
±7.0
A
ID(pulse)
±28
A
Drain current (pulse)
Note1
Total power dissipation (1 unit)
Note2
PT
1.7
W
Total power dissipation (2 unit)
Note2
PT
2.0
W
Channel temperature
Tch
150
°C
Storage temperature
Tstg
−55 to +150
°C
Notes 1. PW ≤ 10 µ s, Duty Cycle ≤ 1 %
Drain
Body
Diode
Gate
Gate
Protection
Diode
Source
2
2. TA = 25 °C, Mounted on ceramic substrate of 2000 mm x 1.1 mm
The diode connected between the gate and source of the transistor serves as a protector against ESD. When this
device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may
be applied to this device.
The information in this document is subject to change without notice.
Document No. D12910EJ2V0DS00 (2nd edition)
Date Published September 1998 NS CP (K)
Printed in Japan
©
1998
µ PA1757
Electrical Characteristics (TA = 25 °C)
Characteristics
Symbol
Drain to source on-state resistance
Test Conditions
MIN.
TYP.
MAX.
Unit
RDS(on)1
VGS = 4.5 V, ID = 3.5 A
16.2
23
mΩ
RDS(on)2
VGS = 2.5 V, ID = 3.5 A
22
32
mΩ
Gate to source cutoff voltage
VGS(off)
VDS = 10 V, ID = 1.0 mA
0.5
0.8
1.5
V
Forward transfer admittance
| yfs |
VDS = 10 V, ID = 3.5 A
5.0
13
Drain leakage current
IDSS
VDS = 20 V, VGS = 0 V
10
µA
Gate to source leakage current
IGSS
VGS = ±12.0 V, VDS = 0 V
±10
µA
Input capacitance
Ciss
VDS = 10 V
750
pF
Output capacitance
Coss
VGS = 0 V
420
pF
140
pF
ID = 3.5 A
57
ns
VGS(on) = 4.0 V
206
ns
593
ns
815
ns
Reverse transfer capacitance
Crss
Turn-on delay time
td(on)
Rise time
f = 1 MHz
tr
Turn-off delay time
VDD = 10 V
td(off)
Fall time
RG = 10 Ω
tf
Total gate charge
Gate to source charge
Gate to drain charge
QG
ID = 7.0 A
13.0
nC
QGS
VDD = 16 V
2.6
nC
5.3
nC
0.75
V
VGS = 4.0 V
QGD
Body diode forward voltage
VF(S-D)
IF = 7.0 A, VGS = 0 V
Test circuit 1 Switching time
Test circuit 2 Gate charge
D.U.T.
D.U.T.
RL
RG
RG = 10 Ω
PG.
VGS
VGS
Wave Form
0
PG.
VDD
ID
90 %
90 %
10 %
0 10 %
Wave Form
τ = 1µ s
Duty Cycle ≤ 1 %
tr
td(on)
ton
IG = 2 mA
RL
50 Ω
VDD
90 %
ID
τ
2
VGS(on)
10 %
ID
VGS
0
S
td(off)
tf
toff
µ PA1757
Typical Characteristics (TA = 25 °C)
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
rth(t) - Transient Thermal Resistance - ˚C/W
1 000
100
10
1
0.1
0.01
0.001
Mounted on ceramic
substrate of 2000mm 2 x 1.1mm
Single Pulse , 1 unit
10µ
100 µ
1m
10 m
100 m
1
10
100
1 000
100
VDS=10V
Pulsed
TA=-50˚C
-25˚C
10
TA=25˚C
75˚C
150˚C
1
0.1
1
10
100
RDS(on) - Drain to Source On-State Resistance - mΩ
ID- Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
75
Pulsed
50
ID=3.5A
25
0
Pulsed
60
40
VGS=2.5V
20
VGS=4.5V
0
1
10
ID - Drain Current - A
100
2
4
8
6
10
12
14
VGS - Gate to Source Voltage - V
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
GATE TO SOURCE CUTOFF VOLTAGE vs.
CHANNEL TEMPERATURE
VGS(off) - Gate to Source Cutoff Voltage - V
| yfs | - Forward Transfer Admittance - S
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
RDS(on) - Drain to Source On-State Resistance - mW
PW - Pulse Width - S
VDS = 10 V
ID = 1 mA
1.0
0.5
0
- 50
0
50
100
150
Tch - Channel Temperature -˚C
3
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
Pulsed
40
IF - Diode Forward Current - A
VGS=2.5V
30
VGS=4.5V
20
10
100
VGS=2.5V
VGS=0
10
1
0.1
ID= 3.5A
0
- 50
0
50
100
0
150
Tch - Channel Temperature -˚C
VSD - Source to Drain Voltage - V
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
SWITCHING CHARACTERISTICS
1 000
VGS = 0
f = 1 MHz
td(on), tr, td(off), tf - Switching Time - ns
Ciss, Coss, Crss - Capacitance - pF
10000
1000
Ciss
Coss
100
10
0.1
Crss
1
10
100
trr - Reverse Recovery Time - ns
100
10
10
IF - Diode Current - A
4
100
VDS - Drain to Source Voltage - V
di/dt =100A/µ s
VGS = 0
1
tf
td(on)
100
10
1
0.1
VDD =10V
VGS(on) = 4V
RG =10Ω
10
100
1
ID - Drain Current - A
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
1
0.1
tr
td(off)
VDS - Drain to Source Voltage - V
1 000
1.5
1.0
0.5
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
8
40
ID=7.0A
30
VGS
VDD=16V
10V
4V
6
20
4
10
2
VDS
0
4
8
12
QG - Gate Charge - nC
0
16
VGS - Gate to Source Voltage - V
RDS(on) - Drain to Source On-State Resistance - mΩ
µ PA1757
µ PA1757
80
60
40
20
20
40
60
80
100 120 140 160
PT - Total Power Dissipation - W/package
100
0
2.8
Mounted on ceramic
substrate of
2000mm 2 x 1.1mm
2.4
2.0
2 unit
1 unit
1.6
1.2
0.8
0.4
0
20
40
60
80
100 120 140 160
TA - Ambient Temperature - ˚C
TA - Ambient Temperature - ˚C
FORWARD BIAS SAFE OPERATING AREA
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
100
d
ite
im 5V)
.
)L
on =4
S(
ID - Drain Current - A
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
Mounted on ceramic
substrate of
2000mm x 1.1mm21 unit
ID(pulse)
1
S
RD t VG
(a
10
m
s
10
ID(DC)
m
s
10
0m
s
Po
we
1
DC
rD
iss
ipa
tio
n
VGS=4.5V
20
15
2.5V
10
5
Lim
ite
TA = 25 ˚C
Single Pulse
0.1
0.1
Pulsed
25
ID - Drain Current - A
dT - Percentage of Rated Power - %
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
d
1
10
100
VDS - Drain to Source Voltage - V
0
0.2
0.4
0.6
0.8
VDS - Drain to Source Voltage - V
FORWARD TRANSFER CHARACTERISTICS
ID - Drain Current - A
100
Pulsed
10
TA=150˚C
125˚C
1
75˚C
TA=25˚C
-25˚C
-50˚C
0.1
VDS=10V
0
1
2
3
4
VGS - Gate to Source Voltage - V
5
µ PA1757
[MEMO]
6
µ PA1757
[MEMO]
7
µ PA1757
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consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on
a customer designated "quality assurance program" for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC’s Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96. 5