NEC UPA1816GR-9JG

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µ PA1816
P-CHANNEL MOS FIELD EFFECT TRANSISTOR
FOR SWITCHING
PACKAGE DRAWING (Unit: mm)
DESCRIPTION
The µPA1816 is a switching device which can be
driven directly by a 1.8 V power source.
This device features a low on-state resistance and
excellent switching characteristics, and is suitable for
applications such as power management of notebook
computers and so on.
8
5
1, 2, 3 : Source
4
: Gate
5, 6, 7, 8: Drain
1.2 MAX.
1.0 ±0.05
0.25
FEATURES
3° +5°
–3°
• 1.8 V drive available
• Low on-state resistance
RDS(on)1 = 15 mΩ MAX. (VGS = −4.5 V, ID = −4.5 A)
RDS(on)2 = 16 mΩ MAX. (VGS = −4.0 V, ID = −4.5 A)
RDS(on)3 = 22.5 mΩ MAX. (VGS = −2.5 V, ID = −4.5 A)
RDS(on)4 = 41.5 mΩ MAX. (VGS = −1.8 V, ID = −2.5 A)
• Built-in G-S protection diode against ESD
1
6.4 ±0.2
3.15 ±0.15
3.0 ±0.1
µPA1816GR-9JG
Power TSSOP8
0.65
0.27 +0.03
–0.08
4.4 ±0.1
0.145 ±0.055
PACKAGE
0.6 +0.15
–0.1
4
ORDERING INFORMATION
PART NUMBER
0.5
0.1 ±0.05
1.0 ±0.2
0.1
0.8 MAX.
0.10 M
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage (VGS = 0 V)
VDSS
−12
V
Gate to Source Voltage (VDS = 0 V)
VGSS
m 8.0
V
Drain Current (DC) (TA = 25°C)
ID(DC)
m 9.0
A
ID(pulse)
m 36
A
Drain Current (pulse)
Note1
Total Power Dissipation
Note2
PT
2.0
W
Channel Temperature
Tch
150
°C
Storage Temperature
Tstg
−55 to +150
°C
EQUIVALENT CIRCUIT
Drain
Body
Diode
Gate
Gate
Protection
Diode
Source
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1%
2
2. Mounted on ceramic substrate of 5000 mm x 1.1 mm
Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When
this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated
voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No.
G16252EJ1V0DS00 (1st edition)
Date Published July 2002 NS CP(K)
Printed in Japan
©
2002
µ PA1816
ELECTRICAL CHARACTERISTICS (TA = 25°C)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
Zero Gate Voltage Drain Current
IDSS
VDS = −12 V, VGS = 0 V
Gate Leakage Current
IGSS
VGS =
Gate Cut-off Voltage
Drain to Source On-state Resistance
TYP.
m 8.0 V, VDS = 0 V
VDS = −10 V, ID = −1.0 mA
VGS(off)
Forward Transfer Admittance
MIN.
−0.45 −0.75
MAX.
UNIT
−1.0
µA
m 10
µA
−1.5
V
| yfs |
VDS = −10 V, ID = −4.5 A
RDS(on)1
VGS = −4.5 V, ID = −4.5 A
12.0
15
mΩ
RDS(on)2
VGS = −4.0 V, ID = −4.5 A
12.5
16
mΩ
RDS(on)3
VGS = −2.5 V, ID = −4.5 A
16.2
22.5
mΩ
RDS(on)4
VGS = −1.8 V, ID = −2.5 A
23.7
41.5
mΩ
11
22
S
Input Capacitance
Ciss
VDS = −10 V
1570
pF
Output Capacitance
Coss
VGS = 0 V
400
pF
Reverse Transfer Capacitance
Crss
f = 1.0 MHz
240
pF
Turn-on Delay Time
td(on)
VDD = −10 V, ID = −4.5 A
16
ns
VGS = −4.0 V
132
ns
RG = 10 Ω
223
ns
295
ns
Rise Time
tr
Turn-off Delay Time
td(off)
Fall Time
tf
Total Gate Charge
QG
VDD = −10 V
15
nC
Gate to Source Charge
QGS
VGS = −4.0 V
3.0
nC
Gate to Drain Charge
QGD
ID = −9.0 A
4.5
nC
VF(S-D)
IF = 9.0 A, VGS = 0 V
0.82
V
Reverse Recovery Time
trr
IF = 9.0 A, VGS = 0 V
490
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/ µs
580
nC
Body Diode Forward Voltage
TEST CIRCUIT 1 SWITCHING TIME
TEST CIRCUIT 2 GATE CHARGE
VGS (−)
D.U.T.
VGS
RL
RG
PG.
Wave Form
0
VGS
10%
VDS (−)
VDD
PG.
90%
90%
VDS
VDS
VGS (−)
0
Wave Form
10%
0
td(on)
τ
tr
ton
10%
td(off)
tf
toff
τ = 1 µs
Duty Cycle ≤ 1%
2
D.U.T.
90%
Data Sheet G16252EJ1V0DS
IG = −2 mA
RL
50 Ω
VDD
µ PA1816
TYPICAL CHARACTERISTICS (TA = 25°C)
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
2.5
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
120
100
80
60
40
20
2
1.5
1
Mounted on ceramic
substrate of
2
5000 mm x 1.1 mm
0.5
0
0
0
25
50
75
100
125
150
175
0
TA - Ambient Temperature - °C
25
50
75
100
125
150
175
TA - Ambient Temperature - °C
FORWARD BIAS SAFE OPERATING AREA
-100
PW = 1 ms
ID(DC)
-10
10 ms
-1
-0.1
R DS(on) Limited
(VGS = −4.5 V)
100 ms
DC
Single Pulse
Mounted on ceramic
substrate of
2
5000 mm x 1.1 mm
-0.01
-0.1
-1
-10
-100
VDS - Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
rth(ch-A) - Transient Thermal Resistance - °C/W
ID - Drain Current - A
ID(pulse)
100
62.5°C/W
10
Single Pulse
Mounted on ceramic
2
substrate of 5000 mm x 1.1 mm
1
1m
10 m
100 m
1
10
100
1000
PW - Pulse Width - s
Data Sheet G16252EJ1V0DS
3
µ PA1816
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
-40
-100
−4.0 V
V D S = −10 V
Pulsed
-10
−2.5 V
VGS = −4.5 V
-30
ID - Drain Current - A
ID - Drain Current - A
Pulsed
-20
−1.8 V
-1
T A = 125°C
75°C
25°C
−25°C
-0.1
-0.01
-10
-0.001
0
-0.0001
0
-0.2
-0.4
-0.6
-0.8
-1
0
VDS - Drain to Source Voltage - V
VGS(off) - Gate Cut-off Voltage - V
VDS = −10 V
ID = −1.0 mA
-0.8
-0.6
-0.4
0
50
100
-2
VDS = −10 V
Pulsed
10
T A = −25°C
25°C
75°C
125°C
1
-0.1
-1
-10
-100
Tch - Channel Temperature - °C
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
40
Pulsed
VGS = −1.8 V, ID = −1.5 A
30
VGS = −2.5 V, ID = −4.5 A
20
10
VGS = −4.0 V, ID = −4.5 A
VGS = −4.5 V, ID = −4.5 A
0
-50
0
50
100
150
40
Pulsed
30
20
ID = −4.5 A
10
Tch - Channel Temperature - °C
4
-1.5
100
0.1
-0.01
150
RDS(on) - Drain to Source On-state Resistance - mΩ
RDS(on) - Drain to Source On-state Resistance - mΩ
-50
-1
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
| yfs | - Forward Transfer Admittance - S
GATE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
-1
-0.5
VGS - Gate to Source Voltage - V
0
0
-2
-4
-6
VGS - Gate to Source Voltage - V
Data Sheet G16252EJ1V0DS
-8
µ PA1816
20
VGS = −4.5 V
Pulsed
TA = 125°C
15
75°C
25°C
−25°C
10
5
-0.01
-0.1
-1
-10
-100
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
RDS(on) - Drain to Source On-state Resistance - mΩ
RDS(on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
20
VGS = −4.0 V
Pulsed
TA = 125°C
75°C
15
25°C
−25°C
10
5
-0.01
-0.1
ID - Drain Current - A
VGS = −2.5 V
Pulsed
30
TA = 125°C
75°C
25°C
−25°C
20
10
0
-0.01
-0.1
-1
-10
-100
40
30
20
10
TA = 125°C
75°C
25°C
−25°C
0
-0.01
-0.1
-1
-10
ID - Drain Current - A
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
SWITCHING CHARACTERISTICS
C iss
1000
C oss
C rss
-1
-10
td(on), tr, td(off), tf - Switching Time - ns
10000
V GS = 0 V
f = 1.0 MHz
100
-0.1
-100
VGS = −1.8 V
Pulsed
ID - Drain Current - A
10000
Ciss, Coss, Crss - Capacitance - pF
-10
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
RDS(on) - Drain to Source On-state Resistance - mΩ
RDS(on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
40
-1
ID - Drain Current - A
1000
-100
V DD = −10 V
V GS = −4.0 V
R G = 10 Ω
tf
t d(off)
100
t d(on)
10
-100
VDS - Drain to Source Voltage - V
1
-0.01
tr
-0.1
-1
-10
ID - Drain Current - A
Data Sheet G16252EJ1V0DS
5
µ PA1816
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
-5
100
ID = −9.0 A
VGS - Gate to Source Voltage - V
IF - Diode Forward Current - A
Pulsed
10
1
VGS = 0 V
0.1
VDD = −10 V
−6.0 V
−2.0 V
-3
-2
-1
0
0.01
0.4
0.6
0.8
1
1.2
0
5
10
15
QG - Gate Charge - nC
VF(S-D) - Source to Drain Voltage - V
6
-4
Data Sheet G16252EJ1V0DS
20
µ PA1816
[MEMO]
Data Sheet G16252EJ1V0DS
7
µ PA1816
• The information in this document is current as of July, 2002. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
• While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
• NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4