NEC UPA1817

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
µ PA1817
P-CHANNEL MOS FIELD EFFECT TRANSISTOR
FOR SWITCHING
DESCRIPTION
PACKAGE DRAWING (Unit: mm)
The µPA1817 is a switching device which can be
driven directly by a 2.5 V power source.
This device features a low on-state resistance and
excellent switching characteristics, and is suitable for
applications such as power management of notebook
computers and so on.
8
5
1, 2, 3 : Source
4
: Gate
5, 6, 7, 8: Drain
1.2 MAX.
1.0±0.05
0.25
FEATURES
• 2.5 V drive available
• Low on-state resistance
RDS(on)1 = 12 mΩ MAX. (VGS = −4.5 V, ID = −6.0 A)
RDS(on)2 = 12.5 mΩ MAX. (VGS = −4.0 V, ID = −6.0 A)
RDS(on)3 = 19.2 mΩ MAX. (VGS = −2.5 V, ID = −6.0 A)
• Built-in G-S protection diode against ESD
3° +5°
–3°
0.1±0.05
1
4
6.4 ±0.2
PACKAGE
µPA1817GR-9JG
Power TSSOP8
0.65
0.27 +0.03
–0.08
4.4 ±0.1
0.145 ±0.055
3.15 ±0.15
3.0 ±0.1
ORDERING INFORMATION
PART NUMBER
0.5
0.6 +0.15
–0.1
1.0 ±0.2
0.1
0.8 MAX.
0.10 M
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage (VGS = 0 V)
VDSS
−20
V
Gate to Source Voltage (VDS = 0 V)
VGSS
m 12
V
Drain Current (DC) (TA = 25°C)
ID(DC)
m 12
A
ID(pulse)
m 48
A
PT
2.0
W
Channel Temperature
Tch
150
°C
Storage Temperature
Tstg
−55 to +150
°C
Drain Current (pulse)
Note1
Total Power Dissipation
Note2
EQUIVALENT CIRCUIT
Drain
Body
Diode
Gate
Gate
Protection
Diode
Source
Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1%
2
2. Mounted on ceramic substrate of 5000 mm x 1.1 mm
Remark
The diode connected between the gate and source of the transistor serves as a protector against ESD. When
this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated
voltage may be applied to this device.
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. G16253EJ1V0DS00 (1st edition)
Date Published August 2002 NS CP(K)
Printed in Japan
©
2002
µ PA1817
ELECTRICAL CHARACTERISTICS (TA = 25°C)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
Zero Gate Voltage Drain Current
IDSS
VDS = −20 V, VGS = 0 V
Gate Leakage Current
IGSS
VGS =
Gate Cut-off Voltage
Drain to Source On-state Resistance
TYP.
m 12 V, VDS = 0 V
VDS = −10 V, ID = −1.0 mA
VGS(off)
Forward Transfer Admittance
MIN.
−0.5
−1.1
15
30
MAX.
UNIT
−1.0
µA
m 10
µA
−1.5
V
| yfs |
VDS = −10 V, ID = −6.0 A
RDS(on)1
VGS = −4.5 V, ID = −6.0 A
9.6
12
mΩ
RDS(on)2
VGS = −4.0 V, ID = −6.0 A
10
12.5
mΩ
RDS(on)3
VGS = −2.5 V, ID = −6.0 A
14.5
19.2
mΩ
S
Input Capacitance
Ciss
VDS = −10 V
3100
pF
Output Capacitance
Coss
VGS = 0 V
730
pF
Reverse Transfer Capacitance
Crss
f = 1.0 MHz
450
pF
Turn-on Delay Time
td(on)
VDD = −10 V, ID = −6.0 A
29
ns
VGS = −4.0 V
235
ns
RG = 10 Ω
170
ns
230
ns
Rise Time
tr
Turn-off Delay Time
td(off)
Fall Time
tf
Total Gate Charge
QG
VDD = −16 V
27
nC
Gate to Source Charge
QGS
VGS = −4.0 V
5.6
nC
Gate to Drain Charge
QGD
ID = −12 A
12
nC
Body Diode Forward Voltage
VF(S-D)
IF = 12 A, VGS = 0 V
0.82
V
Reverse Recovery Time
trr
IF = 12 A, VGS = 0 V
70
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/µs
52
nC
TEST CIRCUIT 1 SWITCHING TIME
TEST CIRCUIT 2 GATE CHARGE
VGS(−)
D.U.T.
VGS
RL
RG
PG.
Wave Form
0
VGS
10 %
VDS(−)
VDD
PG.
90 %
90 %
VDS
VDS
VGS (−)
0
Wave Form
10 % 10 %
0
td(on)
τ
tr
ton
td(off)
tf
toff
τ = 1 µs
Duty Cycle ≤ 1%
2
D.U.T.
90 %
Data Sheet G16253EJ1V0DS
IG = −2 mA
RL
50 Ω
VDD
µ PA1817
TYPICAL CHARACTERISTICS (TA = 25°C)
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
2.5
100
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
120
80
60
40
20
Mounted on ceramic substrate of
2
5000 mm x 1.1 mm
2
Mounted on FR-4 board
2
of 2500 mm x 1.6 mm
1.5
1
0.5
0
0
0
25
50
75
100
125
150
175
0
TA - Ambient Temperature - °C
25
50
75
100
125
150
175
TA - Ambient Temperature - °C
FORWARD BIAS SAFE OPERATING AREA
- 100
I D(pulse)
PW = 1 m s
I D(DC )
10 m s
-1
R DS (on) Lim ited
(V G S = −4.5 V)
100 m s
DC
- 0.1
Single pulse
Mounted on ceram ic substrate of
2
5000 m m x 1.1 m m
- 0.01
- 0.1
-1
- 10
- 100
VDS - Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
1000
rth(ch-A) - Transient Thermal Resistance - °C/W
ID - Drain Current - A
- 10
Single pulse
Mounted on FR-4 board of
2500 mm2 x 1.6 mm
125°C/W
100
10
Mounted on ceramic substrate of
5000 mm2 x 1.1 mm
62.5°C/W
1
0.1
1m
10 m
100 m
1
10
100
1000
PW - Pulse Width - s
Data Sheet G16253EJ1V0DS
3
µ PA1817
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
- 100
- 50
Pulsed
V GS = −4.5 V
- 10
−4.0 V
ID - Drain Current - A
ID - Drain Current - A
- 40
- 30
−2.5 V
- 20
T A = 1 2 5 °C
7 5 °C
2 5 °C
− 2 5 °C
- 1
- 0 .1
- 0 .0 1
- 10
- 0 .0 0 1
0
0
- 0.2
- 0.4
- 0.6
- 0 .0 0 0 1
- 0 .5
- 0.8
VDS - Drain to Source Voltage - V
- 1
- 2 .5
100
| yfs | - Forward Transfer Admittance - S
V DS = −10 V
I D = −1.0 m A
- 1.2
-1
- 0.8
- 0.6
- 0.4
-50
0
50
100
150
V DS = −10 V
Pulsed
10
T A = 125°C
75°C
25°C
−25°C
1
0.1
- 0.01
- 0.1
Tch - Channel Temperature - °C
ID = −6.0 A
Pulsed
20
V GS = −2.5 V
15
10
−4.0 V
−4.5 V
5
0
-50
0
50
100
- 10
- 100
150
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
RDS(on) - Drain to Source On-state Resistance - mΩ
30
25
-1
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
RDS(on) - Drain to Source On-state Resistance - mΩ
- 2
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
- 1.4
Tch - Channel Temperature - °C
4
- 1 .5
VGS - Gate to Source Voltage - V
GATE CUT-OFF VOLTAGE vs.
CHANNEL TEMPERATURE
VGS(off) - Gate Cut-off Voltage - V
VDS = −10 V
P u ls e d
30
ID = −6.0 A
Pulsed
25
20
15
10
5
0
0
-2
-4
-6
-8
- 10
VGS - Gate to Source Voltage - V
Data Sheet G16253EJ1V0DS
- 12
µ PA1817
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
30
V GS = −4.5 V
Pulsed
25
T A = 125°C
20
75°C
15
10
25°C
5
0
- 0.01
−25°C
- 0.1
-1
- 10
- 100
RDS(on) - Drain to Source On-state Resistance - mΩ
RDS(on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
30
V GS = −4.0 V
Pulsed
25
T A = 125°C
20
75°C
15
10
25°C
5
−25°C
0
- 0.01
- 0.1
ID - Drain Current - A
10000
V GS = −2.5 V
Pulsed
Ciss, Coss, Crss - Capacitance - pF
RDS(on) - Drain to Source On-state Resistance - mΩ
- 100
CAPACITANCE vs.
DRAIN TO SOURCE VOLTAGE
30
T A = 125°C
75°C
20
15
10
25°C
−25°C
5
0
- 0.01
- 0.1
-1
- 10
V GS = 0 V
f = 1.0 M H z
C iss
1000
C oss
C rss
100
- 0.1
- 100
SWITCHING CHARACTERISTICS
VDD = −10 V
V G S = − 4 .0 V
R G = 10 Ω
tf
1 00 0
- 10
- 100
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
t d(off)
1 00
t d(on)
100
V GS = 0 V
Pulsed
IF - Diode Forward Current - A
1 00 00
-1
VDS - Drain to Source Voltage - V
ID - Drain Current - A
td(on), tr, td(off), tf - Switching Time - ns
- 10
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
25
-1
10
1
0.1
tr
10
- 0 .01
0.01
- 0 .1
-1
- 10
- 1 00
ID - Drain Current - A
0.4
0.6
0.8
1
1.2
VF(S-D) - Source to Drain Voltage - V
Data Sheet G16253EJ1V0DS
5
µ PA1817
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
VGS - Gate to Source Voltage - V
-5
ID = −12 A
-4
V DD = −4.0 V
−10 V
−16 V
-3
-2
-1
0
0
5
10
15
20
25
30
35
QG - Gate Charge - nC
6
Data Sheet G16253EJ1V0DS
µ PA1817
[MEMO]
Data Sheet G16253EJ1V0DS
7
µ PA1817
• The information in this document is current as of August, 2002. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all
products and/or types are available in every country. Please check with an NEC sales representative
for availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
• While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
• NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4