SLIS037 − NOVEMBER 1994 • • • • • Low rDS(on) . . . 0.23 Ω Typ High Voltage Output . . . 60 V Extended ESD Capability . . . 4000 V Pulsed Current . . . 11.25 A Per Channel Fast Commutation Speed DW PACKAGE (TOP VIEW) OUTPUT1 GATE4 SOURCE4 SOURCE4 GND GND GATE5 SOURCE6 SOURCE6 GATE6 OUTPUT3 OUTPUT3 description 1 24 2 23 3 22 4 21 5 20 6 19 OUTPUT1 GATE1 DRAIN1 DRAIN1 DRAIN2 DRAIN2 OUTPUT2 OUTPUT2 GATE2 DRAIN3 DRAIN3 GATE3 The TPIC1301 is a monolithic gate-protected 7 18 power DMOS array that consists of six electrically 8 17 isolated N-channel enhancement-mode DMOS 9 16 transistors configured as three half H-bridges. 10 15 Each transistor features integrated high-current 11 14 zener diodes (ZCXa and ZCXb) to prevent gate 12 13 damage in the event that an overstress condition occurs. These zener diodes also provide up to 4000 V of ESD protection when tested using the human-body model of a 100-pF capacitor in series with a 1.5-kΩ resistor. The TPIC1301 is offered in a 24-pin wide-body surface-mount (DW) package and is characterized for operation over the case temperature range of − 40°C to 125°C. schematic OUTPUT2 17, 18 DRAIN1 GATE5 7 21, 22 GATE2 DRAIN2 16 19, 20 Q2 Q1 GATE1 ZC1b ZC2b D1 OUTPUT1 SOURCE4 13 ZC3a 11, 12 D4 2 GATE3 ZC3b D2 D3 1, 24 D5 Q5 Q4 GATE4 Z3 ZC2a ZC1a DRAIN3 Q3 Z2 Z1 23 14, 15 OUTPUT3 Q6 Z4 Z5 Z6 10 ZC4b ZC5b ZC6b ZC4a ZC5a ZC6a 8, 9 3, 4 GATE6 SOURCE6 5, 6 GND NOTE: For correct operation, no terminal pin may be taken below GND. Copyright 1994, Texas Instruments Incorporated !"# $ %&'# "$ (&)*%"# +"#', +&%#$ %! # $('%%"#$ (' #-' #'!$ '."$ $#&!'#$ $#"+"+ /""#0, +&%# (%'$$1 +'$ # '%'$$"*0 %*&+' #'$#1 "** (""!'#'$, • DALLAS, TEXAS 75265 • HOUSTON, TEXAS 77251−1443 POST OFFICE BOX 655303 POST OFFICE BOX 1443 2−1 SLIS037 − NOVEMBER 1994 absolute maximum ratings over operating case temperature range (unless otherwise noted)† Drain-to-GND voltage, VDG . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 V Drain-to-source voltage, VDS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 V Output-to-GND voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 V SOURCE4, SOURCE6-to-GND voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 V Gate-to-source voltage range, VGS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −9 V to 18 V Continuous drain current, each output, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.25 A Continuous source-to-drain diode current, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.25 A Pulsed drain current, each output, Imax, TC = 25°C (see Note 1 and Figure 15) . . . . . . . . . . . . . . . . . 11.25 A Continuous gate-to-source zener-diode current, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 50 mA Pulsed gate-to-source zener-diode current, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 500 mA Single-pule avalanche energy, EAS, TC = 25°C (see Figures 4, 15, and 16) . . . . . . . . . . . . . . . . . . . . 17.2 mJ Continuous total dissipation, TC = 25°C (see Figure 15) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.39 W Operating virtual junction temperature range, TJ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to 150°C Operating case temperature range, TC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to 125°C Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to 150°C Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: Pulse duration = 10 ms, duty cycle = 2% 2−2 • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • SLIS037 − NOVEMBER 1994 electrical characteristics, TC = 25°C (unless otherwise noted) PARAMETER TEST CONDITIONS V(BR)DSX Drain-to-source breakdown voltage VGS(th) Gate-to-source threshold voltage V(BR)GS V(BR)SG Gate-to-source breakdown voltage ID = 250 µA, ID = 1 mA, See Figure 5 VGS = 0 VDS = VGS, Source-to-gate breakdown voltage IGS = 250 µA ISG = 250 µA V(BR) Reverse drain-to-GND breakdown voltage (across D1 −D5) Drain-to-GND current = 250 µA VDS(on) Drain-to-source on-state voltage ID = 2.25 A, See Notes 2 and 3 VF(SD) Forward on-state voltage, source-to-drain VF MIN TYP MAX 60 1.5 UNIT V 1.75 2.2 V 18 V 9 V 100 V VGS = 10 V, 0.52 0.62 V IS = 2.25 A, VGS = 0 (Z1 −Z6), See Notes 2 and 3 and Figure 12 1 1.2 V Forward on-state voltage, GND-to-drain ID = 2.25 A (D1 −D5) See Notes 2 and 3 5 IDSS Drain current-gate shorted to source VDS = 48 V, VGS = 0 TC = 25°C TC = 125°C IGSSF Forward-gate current, drain short circuited to source VGS = 15 V, IGSSR Reverse-gate current, drain short circuited to source Ilkg rDS(on) V 0.05 1 0.5 10 VDS = 0 20 200 nA VSG = 5 V, VDS = 0 10 100 nA Leakage current, drain-to-GND Gate shorted to source TC = 25°C TC = 125°C 0.05 1 VDGND = 48 V 0.5 10 TC = 25°C 0.23 0.275 Static drain-to-source on-state resistance VGS = 10 V, ID = 2.25 A, See Notes 2 and 3 and Figures 6 and 7 TC = 125°C 0.35 0.4 Forward transconductance Ciss Short-circuit input capacitance, common source Coss Short-circuit output capacitance, common source Crss Short-circuit reverse transfer capacitance, common source VDS = 25 V, f = 1 MHz, µA A Ω VDS = 15 V, ID = 1.125 A, See Notes 2 and 3 and Figure 9 gfs µA A 1.6 VGS = 0, See Figure 11 2.21 S 200 250 175 220 40 75 pF NOTES: 2. Technique should limit TJ − TC to 10°C maximum. 3. These parameters are measured with voltage-sensing contacts separate from the current-carrying contacts. source-to-drain and GND-to-drain diode characteristics, TC = 25°C PARAMETER trr QRR Reverse-recovery time Total diode charge TEST CONDITIONS IS = 1.125 A, VGS = 0, See Figures 1 and 14 VDS = 48 V, di/dt = 100 A/µs, • MIN MAX UNIT 50 ns 65 nC Z1, Z2, and Z3 POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • TYP 2−3 SLIS037 − NOVEMBER 1994 resistive-load switching characteristics, TC = 25°C PARAMETER TEST CONDITIONS MIN TYP MAX 25 50 25 50 15 30 td(on) td(off) Turn-on delay time tr tf Rise time Qg Total gate charge Qgs(th) Threshold gate-to-source charge Qgd Gate-to-drain charge LD LS Internal drain inductance 5 Internal source inductance 5 Rg Internal gate resistance Turn-off delay time RL = 20 Ω, See Figure 2 VDD = 25 V, tdis = 10 ns, ten = 10 ns, Fall time VDS = 48 V, See Figure 3 ID = 1.125 A, VGS = 10 V, 7 15 6.2 7.4 0.7 0.8 2.4 2.9 UNIT ns nC nH Ω 0.25 thermal resistance PARAMETER TEST CONDITIONS MIN TYP MAX UNIT RθJA Junction-to-ambient thermal resistance See Notes 4 and 7 90 °C/W RθJB Junction-to-board thermal resistance See Notes 5 and 7 45 °C/W RθJP Junction-to-pin thermal resistance See Notes 6 and 7 28 °C/W NOTES: 4. 5. 6. 7. 2−4 Package mounted on an FR4 printed-circuit board with no heatsink. Package mounted on a 24 in2, 4-layer FR4 printed-circuit board. Package mounted in intimate contact with infinite heatsink. All outputs with equal power • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • SLIS037 − NOVEMBER 1994 PARAMETER MEASUREMENT INFORMATION 2.25 I S − Source-to-Drain Diode Current − A 1.5 VDS = 48 V VGS = 0 TJ = 25°C Z1, Z2, and Z3 trr (SD) IS Reverse di/dt = 100 A/µs 0.75 0 − 0.75 25% of IRM† − 1.5 Shaded Area = QRR − 2.25 IRM† −3 − 3.75 0 50 100 150 200 250 300 350 400 450 500 Time − ns † IRM = maximum recovery current Figure 1. Reverse-Recovery-Current Waveform of Source-to-Drain Diode VDD = 25 V RL Pulse Generator ten 10 V VDS VGS 0V VGS 50 Ω tr tf CL 30 pF (see Note A) 50 Ω td(off) td(on) DUT Rgen tdis VDD VDS VDS(on) VOLTAGE WAVEFORMS TEST CIRCUIT NOTE A: CL includes probe and jig capacitance. Figure 2. Resistive-Switching Test Circuit and Voltage Waveforms • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • 2−5 SLIS037 − NOVEMBER 1994 PARAMETER MEASUREMENT INFORMATION Current Regulator 12-V Battery 0.2 µF Qg Same Type as DUT 50 kΩ 10 V 0.3 µF Qgs(th) VDD VDS 0 VGS DUT IG = 100 µA Qgd Gate Voltage Time IG CurrentSampling Resistor ID CurrentSampling Resistor VOLTAGE WAVEFORM TEST CIRCUIT Figure 3. Gate-Charge Test Circuit and Voltage Waveform VDD = 25 V tw 160 µH Pulse Generator (see Note A) ID VDS 15 V VGS 0V IAS (see Note B) VGS 50 Ω tav ID DUT 0V Rgen 50 Ω V(BR)DSX = 60 V Min VDS 0V VOLTAGE AND CURRENT WAVEFORMS TEST CIRCUIT NOTES: A. The pulse generator has the following characteristics: tr ≤ 10 ns, tf ≤ 10 ns, ZO = 50 Ω. B. Input pulse duration (tw) is increased until peak current IAS = 11.25 A. I V t av AS (BR)DSX Energy test level is defined as E + + 17.2 mJ. AS 2 Figure 4. Single-Pulse Avalanche Energy Test Circuit and Waveforms 2−6 • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • SLIS037 − NOVEMBER 1994 TYPICAL CHARACTERISTICS STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE vs JUNCTION TEMPERATURE GATE-TO-SOURCE THRESHOLD VOLTAGE vs JUNCTION TEMPERATURE VGS(th) − Gate-to-Source Threshold Voltage − V 2.5 0.6 ID = 2.25 A r DS(on) − Static Drain-to-Source 2 ID = 1 mA 1.5 ID = 100 µA 1 0.5 0 − 40 − 20 0 20 40 60 On-State Resistance − Ω VDS = VGS 0.4 VGS = 10 V VGS = 15 V 0.2 0 − 40 − 20 80 100 120 140 160 0 Figure 5 10 TJ = 25°C VGS = 15 V 9 VGS = 10 V VGS = 5 V 0.5 0.4 0.3 ÁÁ ÁÁ VGS = 10 V 0.2 VGS = 15 V 7 ∆VGS = 0.2 V TJ = 25°C (unless otherwise noted) 6 5 VGS = 4 V 4 3 2 VGS = 3 V 1 0.1 0.1 80 100 120 140 160 8 I D − Drain Current − A On-State Resistance − Ω rDS(on) − Static Drain-to-Source 60 DRAIN CURRENT vs DRAIN-TO-SOURCE VOLTAGE 0.6 ÁÁ ÁÁ ÁÁ ÁÁ 40 Figure 6 STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE vs DRAIN CURRENT 1 0.9 0.8 0.7 20 TJ − Junction Temperature − °C TJ − Junction Temperature − °C 0 1 10 ID − Drain Current − A 0 100 1 7 8 9 2 3 4 5 6 VDS − Drain-to-Source Voltage − V Figure 7 10 Figure 8 • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • 2−7 SLIS037 − NOVEMBER 1994 TYPICAL CHARACTERISTICS DRAIN CURRENT vs GATE-TO-SOURCE VOLTAGE DISTRIBUTION OF FORWARD TRANSCONDUCTANCE 25 10 Total Number of Units = 2196 VDS = 15 V ID = 1.125 A TJ = 25°C TJ = 25°C TJ = 75°C 8 I D − Drain Current − A Percentage of Units − % 20 TJ = − 40°C 9 15 10 7 TJ = 125°C 6 TJ = 150°C 5 4 3 2 5 0 2.360 2.330 2.300 2.270 2.240 2.210 2.180 2.150 2.120 2.090 2.030 0 2.060 1 0 1 2 3 4 5 6 7 8 9 10 VGS − Gate-to-Source Voltage − V gfs − Forward Transconductance − S Figure 9 Figure 10 SOURCE-TO-DRAIN DIODE CURRENT vs SOURCE-TO-DRAIN VOLTAGE CAPACITANCE vs DRAIN-TO-SOURCE VOLTAGE 800 10 720 Capacitance − pF 640 560 I SD − Source-to-Drain Diode Current − A VGS = 0 f = 1 MHz TJ = 25°C Ciss(0) = 307 pF Coss(0) = 437 pF Crss(0) = 141 pF 480 400 320 Ciss 240 160 Coss Crss 80 VGS = 0 6 4 2 1 0.6 TJ = 125°C TJ = 150°C TJ = 25°C 0.2 TJ = 75°C 0 0.1 0 4 8 12 16 20 24 28 32 36 40 0.1 VDS − Drain-to-Source Voltage − V 1 VSD − Source-to-Drain Voltage − V Figure 11 2−8 TJ = − 40°C 0.4 Figure 12 • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • 10 SLIS037 − NOVEMBER 1994 TYPICAL CHARACTERISTICS DRAIN-TO-SOURCE VOLTAGE AND GATE-TO-SOURCE VOLTAGE vs GATE CHARGE 12 ID = 1.125 A TJ = 25°C See Figure 3 50 10 VDD = 20 V 40 8 VDD = 30 V 30 6 20 4 VDD = 48 V 10 2 VGS − Gate-to-Source Voltage − V VDS − Drain-to-Source Voltage − V 60 VDD = 20 V 0 0 0 1 2 3 4 5 6 7 8 Qg − Gate Charge − nC Figure 13 REVERSE RECOVERY TIME vs REVERSE di/dt trr − Reverse Recovery Time − ns 50 45 40 Z1, Z2, and Z3 35 VDS = 48 V VGS = 0 IS = 1.125 A TJ = 25°C See Figure 1 30 25 0 100 200 300 400 500 600 Reverse di/dt − A/µs Figure 14 • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • 2−9 SLIS037 − NOVEMBER 1994 THERMAL INFORMATION MAXIMUM DRAIN CURRENT vs DRAIN-TO-SOURCE VOLTAGE 100 I D − Maximum Drain Current − A TC = 25°C ÁÁ ÁÁ 1 µs† 10 10 ms† 1 ms† 1 500 µs† θ JA‡ θ JP§ DC Conditions 0.1 0.1 1 10 100 VDS − Drain-to-Source Voltage − V † Less than 2% duty cycle ‡ Device mounted on FR4 printed-circuit board with no heatsink. § Device mounted in intimate contact with infinite heatsink. Figure 15 MAXIMUM PEAK AVALANCHE CURRENT vs TIME DURATION OF AVALANCHE I AS − Maximum Peak Avalanche Current − A 100 See Figure 4 10 TC = 25°C TC = 125°C 1 0.01 0.1 1 10 tav − Time Duration of Avalanche − ms Figure 16 2−10 • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • 100 SLIS037 − NOVEMBER 1994 THERMAL INFORMATION DW PACKAGE† JUNCTION-TO-BOARD THERMAL RESISTANCE vs PULSE DURATION 100 RθJB − Junction-to-Board Thermal Resistance −°C/W DC Conditions d = 0.5 10 d = 0.2 d = 0.1 d = 0.05 d = 0.02 1 d = 0.01 tc tw ID Single Pulse 0 0.1 0.0001 0.001 0.01 0.1 1 10 100 tw − Pulse Duration − s † Device mounted on 24 in2, 4-layer FR4 printed-circuit board with no heatsink NOTE A. ZθB(t) = r(t) RθJB tw = pulse duration tc = cycle time d = duty cycle = tw / tc Figure 17 • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443 • 2−11 PACKAGE OPTION ADDENDUM www.ti.com 8-Apr-2005 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing TPIC1301DW OBSOLETE SOIC DW Pins Package Eco Plan (2) Qty 24 TBD Lead/Ball Finish Call TI MSL Peak Temp (3) Call TI (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS) or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. 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