SSM2316GN N-channel Enhancement-mode Power MOSFET PRODUCT SUMMARY BVDSS 30V R DS(ON) 42mΩ ID 4.7A DESCRIPTION The SSM2316GN acheives fast switching performance with low gate charge without a complex drive circuit. It is suitable for low voltage applications such as DC/DC converters and general load-switching circuits. The SSM2316GN is supplied in an RoHS-compliant SOT-23-3 package, which is widely used for lower power commercial and industrial surface mount applications. Pb-free; RoHS-compliant SOT-23-3 D S SOT-23-3 G ABSOLUTE MAXIMUM RATINGS Symbol Parameter VDS Drain-source voltage VGS Gate-source voltage ID IDM PD Continuous drain current Pulsed drain current 3 , Value Units 30 V ± 20 V T A = 25°C 4.7 A TA = 70°C 3.7 A 10 A 1.38 W 0.01 W/°C 1,2 3 Total power dissipation , TA = 25°C Linear derating factor TSTG Storage temperature range -55 to 150 °C TJ Operating junction temperature range -55 to 150 °C THERMAL CHARACTERISTICS Symbol RΘJA Parameter Maximum thermal resistance, junction-ambient 3 Value Units 90 °C/W Notes: 1.Pulse width must be limited to avoid exceeding the maximum junction temperature of 150°C. 2.Pulse width <300us, duty cycle <2%. 3.Mounted on a square inch of copper pad on FR4 board ; 270°C/W when mounted on the minimum pad area required for soldering. 6/16/2006 Rev.3.01 www.SiliconStandard.com 1 of 5 SSM2316GN ELECTRICAL CHARACTERISTICS Symbol (at Tj = 25°C, unless otherwise specified) Parameter Test Conditions Min. Typ. Max. Units 30 - - V BVDSS Drain-source breakdown voltage VGS=0V, ID=250uA ∆ BV DSS/∆ Tj Breakdown voltage temperature coefficient Reference to 25°C, ID=1mA - 0.02 - V/°C RDS(ON) Static drain-source on-resistance VGS=10V, ID=4A - - 42 mΩ VGS=4.5V, ID=2A - - 72 mΩ VDS=VGS, ID=250uA 1 - 3 V 5 - S VGS(th) Gate threshold voltage gfs Forward transconductance VDS=10V, ID=4A - IDSS Drain-source leakage current VDS=30V, VGS=0V - - 1 uA VDS=24V ,VGS=0V, Tj = 70°C - - 10 uA VGS=±20V - - ±100 nA ID=4A - 5 8 nC IGSS Gate-source leakage current 2 Qg Total gate charge Qgs Gate-source charge VDS=24V - 1 - nC Qgd Gate-drain ("Miller") charge VGS=4.5V - 3 - nC VDS=15V - 7 - ns 2 td(on) Turn-on delay time tr Rise time ID=1A - 8 - ns td(off) Turn-off delay time RG=3.3Ω , VGS=10V - 12 - ns tf Fall time RD=15Ω - 3 - ns Ciss Input capacitance VGS=0V - 270 430 pF Coss Output capacitance VDS=25V - 70 - pF Crss Reverse transfer capacitance f=1.0MHz - 60 - pF Rg Gate Resistance f=1.0MHz - 1.4 2.1 Ω Min. Typ. Max. Units IS=1.2A, VGS=0V - - 1.2 V Source-Drain Diode Symbol Parameter Test Conditions VSD Forward voltage trr Reverse recovery time IS=4A, VGS=0V, - 14 - ns Qrr Reverse recovery charge dI/dt=100A/µs - 9 - nC 2 Notes: 1.Pulse width must be limited to avoid exceeding the maximum junction temperature of 150°C. 2.Pulse width <300us, duty cycle <2%. 6/16/2006 Rev.3.01 www.SiliconStandard.com 2 of 5 SSM2316GN 12 12 10V 7.0V 5.0V 4.5V ID , Drain Current (A) 10 V 7.0 V 5.0 V 4.5 V o T A = 150 C ID , Drain Current (A) o T A =25 C 8 4 8 4 V G = 3.0 V V G = 3.0 V 0 0 0 1 2 3 0 4 1 V DS , Drain-to-Source Voltage (V) 4 Fig 2. Typical Output Characteristics 65 1.8 ID=4A V G =10V ID=2A o 55 1.5 T A =25 C Normalized R DS(ON) RDS(ON) (mΩ ) 3 V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 45 1.2 0.9 35 0.6 25 2 4 6 8 -50 10 Fig 3. On-Resistance vs. Gate Voltage 50 100 150 Fig 4. Normalized On-Resistance vs. Junction Temperature 1.8 3.0 1.4 Normalized VGS(th) (V) 4.0 T j =150 o C 0 T j , Junction Temperature ( o C) V GS , Gate-to-Source Voltage (V) IS(A) 2 T j =25 o C 2.0 1.0 1.0 0.6 0.0 0.2 0 0.2 0.4 0.6 0.8 1 1.2 -50 0 50 100 150 o T j , Junction Temperature ( C) V SD , Source-to-Drain Voltage (V) Fig 5. Forward Characteristic of Reverse Diode 6/16/2006 Rev.3.01 Fig 6. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 3 of 5 SSM2316GN f=1.0MHz 1000 I D =4A 10 V DS =15V V DS =20V V DS =24V 8 C iss C (pF) VGS , Gate to Source Voltage (V) 12 6 100 C oss C rss 4 2 10 0 0 2 4 6 1 8 5 9 Q G , Total Gate Charge (nC) 13 17 21 25 29 V DS , Drain-to-Source Voltage (V) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 100 1 Normalized Thermal Response (Rthja) Duty factor=0.5 10 ID (A) 100us 1ms 1 10ms 100ms T A =25 o C Single Pulse 0.1 1s DC 0.2 0.1 0.1 0.05 PDM t 0.01 T 0.01 Single Pulse Duty factor = t/T Peak Tj = PDM x Rthja + Ta Rthja = 270°C/W 0.001 0.01 0.1 1 10 100 0.0001 0.001 0.01 V DS , Drain-to-Source Voltage (V) 0.1 1 10 100 1000 t , Pulse Width (s) Fig 9. Maximum Safe Operating Area Fig 10. Effective Transient Thermal Impedance 12 VG V DS =5V ID , Drain Current (A) 9 T j =25 o C QG T j =150 o C 4.5V QGS 6 QGD 3 Charge Q 0 0 2 4 6 V GS , Gate-to-Source Voltage (V) Fig 11. Transfer Characteristics 6/16/2006 Rev.3.01 Fig 12. Gate Charge Circuit www.SiliconStandard.com 4 of 5 SSM2316GN PHYSICAL DIMENSIONS SOT-23-3 SOT-23-3 SYMBOL MILLIMETERS MIN. MAX. A 0.89 1.45 A1 0 0.15 A2 0.70 1.30 b 0.30 0.50 c 0.08 0.25 D 2.65 3.10 E 2.10 3.00 E1 1.19 2.30 e 0.95BSC e1 1.90BSC L 0.30 L1 Θ 0.60 0.60REF 0° 8° *Dimensions do not include mold protrusions. PART MARKING PART NUMBER CODE: NI = SSM2316GN First character is underlined to indicate Pb-free part NIXX XX = DATE/LOT CODE - contact SSC for information on decoding this. PACKING: Moisture sensitivity level MSL3 3000 pcs in antistatic tape on a reel packed in a moisture barrier bag (MBB). Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 6/16/2006 Rev.3.01 www.SiliconStandard.com 5 of 5