TPIC2601 6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998 D D D D D Low rDS(on) . . . 0.25 Ω Typ High Output Voltage . . . 60 V Pulsed Current . . . 10 A Per Channel Avalanche Energy Capability . . . 105 mJ Input Transient Protection . . . 2000 V KTC or KTD† PACKAGE (TOP VIEW) 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 description The TPIC2601 is a monolithic power DMOS array that consists of six electrically isolated N-channel enhancement-mode DMOS transistors configured with a common source and open drains. Each transistor features integrated high-current zener diodes to prevent gate damage in the event that an overstress condition occurs. These zener diodes also provide up to 2000 V of ESD protection when tested using the human-body model. DRAIN6 GATE6 DRAIN5 GATE5 DRAIN4 DRAIN4 GATE4 SOURCE/GND GATE3 DRAIN3 DRAIN3 GATE2 DRAIN2 GATE1 DRAIN1 † TI Japan only The TPIC2601 is offered in a 15-pin PowerFLEX (KTC) package and is characterized for operation over the case temperature range of – 40°C to 125°C. A 15-pin PowerFLEX (KTD) package is also available for TI Japan only. schematic DRAIN1 1 Q1 GATE1 DRAIN2 3 GATE2 4 Q2 DRAIN3 5, 6 GATE3 7 Q3 DRAIN4 DRAIN5 DRAIN6 10, 11 13 15 GATE4 GATE5 Q4 9 Q5 12 Q6 14 2 GATE6 8 SOURCE/GND NOTE A: For correct operation, no drain terminal may be taken below GND. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PowerFLEX is a trademark of Texas Intruments Incorporated. Copyright 1998, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 TPIC2601 6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998 absolute maximum ratings over operating case temperature range (unless otherwise noted)† Drain-to-source voltage, VDS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 V Gate-to-source voltage, VGS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 9 V to 18 V Continuous drain current, each output, all outputs on, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 A Pulsed drain current, each output, IOmax, TC = 25°C (see Note 1 and Figure 7) . . . . . . . . . . . . . . . . . . . 10 A Continuous gate-to-source zener diode current, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 25 mA Pulsed gate-to-source zener diode current, TC = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 250 mA Single-pulse avalanche energy, EAS, TC = 25°C (see Figures 4 and 16) . . . . . . . . . . . . . . . . . . . . . . . 105 mJ Continuous total power dissipation at (or below) TA = 25°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.7 W Power dissipation at (or below) TC = 75°C, all outputs on . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18.75 W Operating virtual junction temperature range, TJ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 150°C Operating case temperature range, TC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 125°C Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 125°C Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: Pulse duration = 10 ms, duty cycle = 2% electrical characteristics, TC = 25°C (unless otherwise noted) PARAMETER TEST CONDITIONS V(BR)DSX VGS(th) Drain-to-source breakdown voltage VGS(th)match V(BR)GS Gate-to-source threshold voltage matching V(BR)SG Source-to-gate breakdown voltage Gate-to-source threshold voltage Gate-to-source breakdown voltage ID = 250 µA, ID = 1 mA,, See Figure 5 60 VDS = VGS, 1.5 IGS = 250 µA ISG = 250 µA VDS(on) Drain-to-source on-state voltage ID = 2 A, See Notes 2 and 3 VF(SD) Forward on-state voltage, source-to-drain IS = 2A, VGS = 0, See Notes 2 and 3 and Figure 12 IDSS Zero gate voltage drain current Zero-gate-voltage VDS = 48 V,, VGS = 0 TC = 25°C TC = 125°C IGSSF Forward gate current, drain short circuited to source VGS = 10 V, IGSSR Reverse gate current, drain short circuited to source drain to source on-state on state resistance Static drain-to-source rDS( DS(on)) Forward transconductance Ciss Short-circuit input capacitance, common source Coss Short-circuit output capacitance, common source Crss Short-circuit reverse transfer capacitance, common source TYP MAX 2.05 2.2 V 5 40 mV V 18 V 9 V VGS = 10 V, 0.5 0.6 V 0.85 1 V 1 0.5 10 VDS = 0 20 200 nA VSG = 5 V, VDS = 0 10 100 nA VGS = 10 V, ID =2 A,, See Notes 2 and 3 and Figures 6 and 7 TC = 25°C 0.25 0.3 TC = 125°C 0.4 0.5 VDS = 25 V, f = 1 MHz, ID = 1 A VGS = 0, See Figure 11 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 µA Ω 1.3 1.95 S 180 225 110 138 80 100 NOTES: 2. Technique should limit TJ – TC to 10°C maximum. 3. These parameters are measured with voltage-sensing contacts separate from the current-carrying contacts. 2 UNIT 0.05 VDS = 15 V, See Notes 2 and 3 and Figure 9 gfs MIN VGS = 0 pF TPIC2601 6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998 source-to-drain diode characteristics, TC = 25°C PARAMETER trr(SD) Reverse-recovery time QRR Total diode charge TEST CONDITIONS MIN IS = 1 A, VDS = 48 V, VGS = 0, 0 di/dt = 100 A/µs A/µs, See Figures 1 and 14 TYP MAX UNIT 72 ns 180 nC resistive-load switching characteristics, TC = 25°C PARAMETER TEST CONDITIONS MIN TYP td(on) td(off) Delay time, VGS↑ to VDS↓ turn on tr tf Rise time, VDS Qg Total gate charge Qgs(th) Threshold gate-to-source charge Qgd Gate-to-drain charge LD Internal drain inductance 5 LS Rg Internal source inductance 5 Delay time, VGS↓ to VDS↑ turn off MAX UNIT 194 VDD = 25 V,, tdis = 10 ns, RL = 25 Ω,, See Figure 2 430 ten = 10 ns,, ns 90 Fall time, VDS 180 VDD = 48 V, V See Figure 3 ID = 1 A, A VGS = 10 V, V Internal gate resistance 5.1 6.4 0.5 0.63 2.75 3.4 nC nH Ω 500 thermal resistance PARAMETER RθJA RθJC TEST CONDITIONS Junction-to-ambient thermal resistance Junction-to-case thermal resistance POST OFFICE BOX 655303 MIN TYP MAX All outputs with equal power 72 All outputs with equal power 4 One output dissipating power 7 • DALLAS, TEXAS 75265 UNIT °C/W 3 TPIC2601 6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998 PARAMETER MEASUREMENT INFORMATION 2 TJ = 25°C I SD – Source-to-Drain Diode Current – A 1 Reversed di/dt = 100 A/µs 0 –1 25% of lRM{ –2 –3 Shaded Area = QRR –4 lRM{ –5 trr(SD) –6 0 25 50 75 100 125 150 175 200 225 250 t – Time – ns †IRM = maximum recovery current Figure 1. Reverse-Recovery Current Waveform of Source-to-Drain Diode VDD ten Pulse Generator (see Note A) tdis 90% RL VDS VGS 10 V 90% 10% 0 VGS DUT Rgen 50 Ω td(off) td(on) 50 Ω 90% VDS 10% VOLTAGE WAVEFORMS TEST CIRCUIT NOTE A: The pulse generator has the following characteristics: ten ≤ 10 ns, tdis ≤ 10 ns, ZO = 50 Ω. 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 VDS(on) tr tf Figure 2. Resistive Switching VDD TPIC2601 6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998 PARAMETER MEASUREMENT INFORMATION Current Regulator 12-V Battery 0.2 µF Qg Same Type as DUT 50 kΩ 10 V Qgs(th) 0.3 µF VGS VDD DUT IG = 1 mA 0 Qgd Gate Voltage t – Time – s IG Sampling Resistor ID Sampling Resistor Qgs = Qg – Qgd WAVEFORM TEST CIRCUIT Figure 3. Gate Charge Test Circuit and Waveform 25 V tw 10 V L VGS Pulse Generator (see Note A) 50 Ω ID tav 0 VDS VGS IAS (see Note B) ID DUT 0 Rgen V(BR)DSX = 60 V MIN VDS 50 Ω 0 VOLTAGE AND CURRENT WAVEFORMS TEST CIRCUIT NOTES: A. The pulse generator has the following characteristics: tr ≤ 10 ns, tf ≤ 10 ns, ZO = 50 Ω. B. Input pulse duration (tw) is increased until peak current IAS = 2 A. Energy test level is defined as E AS + I AS V (BR)DSX 2 t av + 105 mJ minimum where t + avalanche time. av Figure 4. Single-Pulse Avalanche-Energy Test Circuit and Waveforms POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 5 TPIC2601 6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998 TYPICAL CHARACTERISTICS STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE vs JUNCTION TEMPERATURE 2.5 1 VDS = VGS ID = 2 A 1.5 ID = 100 µA 1 0.5 0 – 40 – 20 0 20 40 60 0.8 On-State Resistance – Ω ID = 1 mA 2 r DS(on) – Static Drain-to-Source VGS(th) – Gate-to-Source Threshold Voltage – V GATE-TO-SOURCE THRESHOLD VOLTAGE vs JUNCTION TEMPERATURE 0.6 VGS = 10 V 0.4 VGS = 15 V 0.2 0 – 40 – 20 80 100 120 140 160 TJ – Junction Temperature – °C 0 Figure 5 VGS = 15 V VGS = 10 V I D – Drain Current – A 8 On-State Resistance –Ω rDS(on) – Static Drain-to-Source 80 100 120 140 160 10 9 VGS = 10 V VGS = 15 V Delta VGS = 0.4 V Unless Otherwise Noted TJ = 25°C 7 VGS = 6 V 6 5 4 3 VGS = 4 V 2 1 0.1 1 10 0 0 1 ID – Drain Current – A 2 3 4 5 Figure 8 POST OFFICE BOX 655303 6 7 8 VDS – Drain-to-Source Voltage – V Figure 7 6 60 DRAIN CURRENT vs DRAIN-TO-SOURCE VOLTAGE TJ = 25°C ÁÁ ÁÁ ÁÁ 40 Figure 6 STATIC DRAIN-TO-SOURCE ON-STATE RESISTANCE vs DRAIN CURRENT 1 20 TJ – Junction Temperature – °C • DALLAS, TEXAS 75265 9 10 TPIC2601 6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998 TYPICAL CHARACTERISTICS DRAIN CURRENT vs GATE-TO-SOURCE VOLTAGE DISTRIBUTION OF FORWARD TRANSCONDUCTANCE 40 30 TJ = 25°C 20 15 10 5 TJ = 150°C 4 3 2 5 1 1.85 1.875 1.9 1.925 1.95 1.975 0 2 0 gfs – Forward Transconductance – S 1 2 I SD – Source-to-Drain Diode Current – A Capacitance – pF 300 250 Ciss 150 Coss 100 Crss 50 0 10 6 7 8 9 10 10 f = 1 MHz TJ = 25°C Ciss(0) = 257 pF Coss(0) = 488 pF Crss(0) = 213 pF 200 5 SOURCE-TO-DRAIN DIODE CURRENT vs SOURCE-TO-DRAIN VOLTAGE 500 350 4 Figure 10 CAPACITANCE vs DRAIN-TO-SOURCE VOLTAGE 400 3 VGS – Gate-to-Source Voltage – V Figure 9 450 VDS = 15 V 6 25 0 TJ = – 40°C 7 I D – Drain Current – A Percentage of Units – % 35 8 Total Number of Units = 367 VDS = 15 V ID = 1 A TJ = 25°C 20 30 40 VDS – Drain-to-Source Voltage – V VGS = 0 TJ = – 40°C 1 0.1 0.1 TJ = 25°C TJ = 150°C 1 VSD – Source-To-Drain Voltage – V 10 Figure 12 Figure 11 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 7 TPIC2601 6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998 TYPICAL CHARACTERISTICS DRAIN-TO-SOURCE VOLTAGE AND GATE-TO-SOURCE VOLTAGE vs GATE CHARGE REVERSE-RECOVERY TIME vs REVERSE di/dt TC = 25°C See Figure 3 VDD = 30 V 8 30 6 20 4 VDD = 48 V 10 2 trr – Reverse-Recovery Time – ns 10 50 40 0 2 3 4 Qg – Gate Charge – nC 85 80 75 70 65 60 50 0 1 90 55 VDD = 20 V 0 VDS = 48 V VGS = 0 IS = 1 A TJ = 25°C See Figure 1 95 VDD = 20 V VGS – Gate-to-Source Voltage – V VDS – Drain-to-Source Voltage – V 100 12 60 5 6 0 50 100 150 200 Reverse di/dt – A/µs Figure 13 MAXIMUM PEAK AVALANCHE CURRENT vs TIME DURATION OF AVALANCHE 10 I D – Maximum Drain Current – A I AS – Maximum Peak Avalanche Current – A 100 TC = 25°C 10 ms 1 ms DC DC 0.5 ms 10 µs 0.1 See Figure 4 10 TC = 25°C TC = 125°C 1 10 VDS – Drain-To-Source Voltage 100 0.1 1 Figure 16 POST OFFICE BOX 655303 10 tav – Time Duration of Avalanche – ms Figure 15 8 300 Figure 14 MAXIMUM DRAIN CURRENT vs DRAIN-TO-SOURCE VOLTAGE 1 250 • DALLAS, TEXAS 75265 100 TPIC2601 6-CHANNEL COMMON-SOURCE POWER DMOS ARRAY SLIS048A – NOVEMBER 1996 – REVISED JANUARY 1998 THERMAL INFORMATION KTC PACKAGE† NORMALIZED JUNCTION-TO-AMBIENT THERMAL RESISTANCE vs PULSE DURATION 1 RθJA – Normalized Junction-to-Ambient Thermal Resistance – °C/W DC Conditions d = 0.2 d = 0.1 0.1 d = 0.05 d = 0.02 d = 0.01 Single Pulse tc tw ID 0 0.01 0.0001 0.001 0.1 0.01 1 10 tw – Pulse Duration – s † Device mounted on 24 in2, 4-layer FR4 printed-circuit board with no heatsink. NOTE A: ZθA(t) = r(t) RθJA tw = pulse duration tc = cycle time d = duty cycle = tw/tc Figure 17 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 9 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. 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