V6203629 VID

REVISIONS
LTR
DESCRIPTION
DATE
APPROVED
A
Add device type 02 and case outline Y.
Make changes to 1.2.1, Table I, figure 1, figure 2,
and 6.3. - ro
06-01-18
R. MONNIN
B
Add footnote 1/ to section 1.2.2 and footnote 3/
to section 6.3. Update boilerplate paragraphs to
current requirements. - PHN
11-12-21
Thomas M. Hess
CURRENT DESIGN ACTIVITY CAGE CODE 16236
HAS CHANGED NAMES TO:
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
Prepared in accordance with ASME Y14.24
Vendor item drawing
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PMIC N/A
PREPARED BY
RICK OFFICER
Original date of drawing
YY-MM-DD
CHECKED BY
TOM HESS
03-04-08
TITLE
MICROCIRCUIT, DIGITAL-LINEAR, TRIPLE
PROCESSOR SUPERVISORY CIRCUIT,
MONOLITHIC SILICON
APPROVED BY
RAYMOND MONNIN
SIZE
CODE IDENT. NO.
A
REV
AMSC N/A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DWG NO.
V62/03629
16236
B
PAGE
1
OF
15
5962-V014-12
1. SCOPE
1.1 Scope. This drawing documents the general requirements of a high performance triple processor supervisory microcircuit, with
an operating temperature range of -55°C to +125°C.
1.2 Vendor Item Drawing Administrative Control Number. The manufacturer’s PIN is the item of identification. The vendor item
drawing establishes an administrative control number for identifying the item on the engineering documentation:
V62/03629
-
Drawing
number
01
X
E
Device type
(See 1.2.1)
Case outline
(See 1.2.2)
Lead finish
(See 1.2.3)
1.2.1 Device type(s).
Device type
Generic
01
02
Circuit function
TPS3307-18-EP
TPS3307-33-EP
Triple processor supervisory circuit
Triple processor supervisory circuit
1.2.2 Case outline(s). The case outline(s) are as specified herein.
Outline letter
Number of pins
X
Y 1/
8
8
JEDEC PUB 95
Package style
MS-012
MO-187
Plastic small outline
Plastic small outline with thermal pad
1.2.3 Lead finishes. The lead finishes are as specified below or other lead finishes as provided by the device manufacturer:
Finish designator
A
B
C
D
E
Z
Material
Hot solder dip
Tin-lead plate
Gold plate
Palladium
Gold flash palladium
Other
________
1/
The manufacture has changed lead frames NiPdAu to NiPdAuAg and location of assembly from their Hana facility to their
Shanghai facility. Product with a Lot Trace Code of 1CxxxxH and earlier is a NiPdAu frame from the Hana facility.
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1.3 Absolute maximum ratings.
2/
Supply voltage (VDD) ........................................................................ 7 V 3/
All other pins ..................................................................................... -0.3 V to 7 V
Maximum low output current (IOL) .................................................... 5 mA
3/
Maximum high output current (IOH) .................................................. -5 mA
Input clamp current (IIK), (VI < 0 or VI > VDD) ................................... ±20 mA
Output clamp current (IOK), (VO < 0 or VO > VDD) ........................... ±20 mA
Storage temperature range (TSTG) .................................................. -65°C to +150°C 4/
Soldering temperature ...................................................................... +260°C
Maximum junction temperature (TJ) ................................................. +150°C
Package thermal impedance (θJA):
Case X .......................................................................................... +126°C/W 5/
Case Y .......................................................................................... +58.4°C/W 5/
1.4 Recommended operating conditions. 6/
Supply voltage range (VDD) ............................................................. 2 V to 6 V
Input voltage (VI) at MR and SENSE 3 pins .................................... 0 V to VDD + 0.3 V
Input voltage (VI) at SENSE 1 and SENSE 2 pins ............................ 0 V to (VDD + 0.3 V) VIT / 1.25 V
High level input voltage (VIH) at MR ................................................ 0.7 x VDD minimum
Low level input voltage (VIL) at MR ................................................. 0.3 x VDD maximum
Input transition rise and fall rate (∆t / ∆V) at MR .............................. 50 ns / V maximum
Operating free air temperature range (TA) ........................................ -55°C to +125°C
2/
3/
4/
5/
6/
Stresses beyond those listed under “absolute maximum rating” may cause permanent damage to the device. These are
stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “
recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods
may affect device reliability.
All voltage values are with respect to GND. For reliable operation the device must not be operated at 7 V for morethan t
= 1000 h continuously.
Long term, high temperature storage and / or extended use at maximum recommended operating conditions may result in a
reduction of overall device life.
The thermal impedance, θJA, for the case X package is determined for JEDEC high-K PCB (JESD51-7). The thermal
impedance value for case Y package is determined for Texas Instruments recommended assembly for thermal pad packages.
See manufacturer briefs SLMA002 and SLMA004 for more information about utilizing the thermally enhanced package. Thermal
impedance, θJA, values for the cases X and Y packages using JEDEC low-K PCB (JESD51-3) are 215°C/W and 296°C/W,
respectively.
Use of this product beyond the manufacturers design rules or stated parameters is done at the user’s risk. The manufacturer
and/or distributor maintain no responsibility or liability for product used beyond the stated limits.
DEFENSE SUPPLY CENTER, COLUMBUS
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2. APPLICABLE DOCUMENTS
JEDEC PUB 95
–
Registered and Standard Outlines for Semiconductor Devices
(Applications for copies should be addressed to the Electronic Industries Alliance, 2500 Wilson Boulevard, Arlington,
VA 22201-3834 or online at http://www.jedec.org)
3. REQUIREMENTS
3.1 Marking. Parts shall be permanently and legibly marked with the manufacturer’s part number as shown in 6.3 herein and as
follows:
A.
B.
C.
Manufacturer’s name, CAGE code, or logo
Pin 1 identifier
ESDS identification (optional)
3.2 Unit container. The unit container shall be marked with the manufacturer’s part number and with items A and C (if applicable)
above.
3.3 Electrical characteristics. The maximum and recommended operating conditions and electrical performance characteristics are
as specified in 1.3, 1.4, and table I herein.
3.4 Design, construction, and physical dimension. The design, construction, and physical dimensions are as specified herein.
3.5 Diagrams.
3.5.1 Case outlines. The case outlines shall be as shown in 1.2.2 and figure 1.
3.5.2 Terminal connections. The terminal connections shall be as shown in figure 2.
3.5.3 Truth table. The truth table shall be as shown in figure 3.
3.5.4 Logic diagram. The logic diagram shall be as shown in figure 4.
3.5.5 Timing waveforms. The timing waveforms shall be as shown in figure 5.
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TABLE I. Electrical performance characteristics. 1/
Test
Symbol
Conditions
Temperature,
TA
Device
type
Limits
Min
Unit
Max
Electrical characteristics section
High level output
voltage
Low level output
voltage
VOH
VOL
Power-up reset voltage
Negative going input
threshold voltage
Hysteresis at
VSENSEn input
-VIT
Vhys
VDD = 2 V to 6 V, IOH = -20 µA
-55°C to +125°C
01,02
VDD = 3.3 V, IOH = -2 mA
VDD –
0.4 V
VDD = 6 V, IOH = -3 mA
VDD –
0.4 V
VDD = 2 V to 6 V, IOL = 20 µA
-55°C to +125°C
V
VDD –
0.2 V
01,02
0.2
VDD = 3.3 V, IOL = 2 mA
0.4
VDD = 6 V, IOL = 3 mA
0.4
VDD ≥ 1.1 V, IOL = 20 µA 2/
-55°C to +125°C
01,02
SENSE3 pin, VDD = 2 V to 6 V 3/
-55°C to +125°C
01,02
V
0.4
V
1.2
1.29
V
SENSE1, SENSE2 pins,
VSENSE = 1.8 V,
VDD = 2 V to 6 V 3/
1.6
1.73
SENSE1, SENSE2 pins,
VSENSE = 3.3 V,
VDD = 2 V to 6 V 3/
2.8
3.02
SENSE1, SENSE2 pins,
VSENSE = 5 V,
VDD = 2 V to 6 V 3/
4.4
4.67
2
30
-VIT = 1.68 V
2
40
-VIT = 2.93 V
3
60
-VIT = 4.55 V
3
80
-55°C to +125°C
-VIT = 1.25 V
01,02
mV
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions
Temperature,
TA
Device
type
Limits
Min
Unit
Max
Electrical characteristics section – continued.
High level input current
IH
-55°C to +125°C
MR pin = 0.7 x VDD, VDD = 6 V
01,02
VSENSE1 pin = VDD = 6 V
8
VSENSE2 pin = VDD = 6 V
9
-1
VSENSE3 pin = VDD
Low level input current
IL
-55°C to +125°C
MR pin = 0 V, VDD = 6 V
01,02
VSENSE1,2,3 pins = 0 V
Supply current
IDD
Input capacitance
CI
-180
VI = 0 V to VDD
+1
-600
-1
µA
µA
+1
40
µA
typical
pF
-55°C to +125°C
01,02
-55°C to +125°C
01,02
10
+25°C
01,02
6
µs
100
ns
Timing requirements section. 4/
Pulse width
tW
SENSEn pin,
VSENSEnL = -VIT - 0.2 V,
VSENSEnH = +VIT + 0.2 V
MR pin, VIH = 0.7 x VDD,
VIL = 0.3 x VDD
Switching characteristics section. 4/
Delay time
td
VI(SENSEn) ≥ +VIT + 0.2 V,
+25°C
01,02
+25°C
+25°C
140
280
ms
01,02
600
ns
01,02
600
ns
MR ≥ 0.7 x VDD, figure 5
Propagation (delay)
time, high-to-low output
tPHL
MR to RESET ,
VI(SENSEn) ≥ +VIT + 0.2 V,
VIH = 0.7 x VDD, VIL = 0.3 x VDD
Propagation (delay)
time, low-to-high output
tPLH
MR to RESET,
VI(SENSEn) ≥ +VIT + 0.2 V,
VIH = 0.7 x VDD, VIL = 0.3 x VDD
See footnotes at end of table.
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CODE IDENT NO.
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TABLE I. Electrical performance characteristics – Continued. 1/
Test
Symbol
Conditions
Temperature,
TA
Device
type
Limits
Min
Unit
Max
Switching characteristics section – continued. 4/
Propagation (delay)
time, high-to-low output
tPHL
SENSEn to RESET ,
+25°C
01,02
5
µs
+25°C
01,02
5
µs
VIH ≥ +VIT +0.2 V,
VIL ≤ -VIT - 0.2 V,
MR ≥ 0.7 x VDD
Propagation (delay)
time, low-to-high output
tPLH
SENSEn to RESET,
VIH ≥ +VIT +0.2 V,
VIL ≤ -VIT - 0.2 V,
MR ≥ 0.7 x VDD
1/
Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over
the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters
may not necessarily be tested. In the absence of specific parametric testing, product performance is assured by characterization
and/or design.
2/
3/
The lowest supply voltage at which RESET becomes active. tr, VDD ≥ 15 µs / V.
To ensure best stability of the threshold voltage, a bypass capacitor (ceramic 0.1 µF) should be placed close to the
supply terminals.
Unless otherwise specified, VDD = 2 V to 6 V, RL = 1 MΩ, CL = 50 pF.
4/
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Case X
FIGURE 1. Case outlines.
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Case X
Dimensions
Inches
Symbol
Millimeters
Min
Max
Min
Max
A
---
0.069
---
1.75
A1
0.004
0.010
0.10
0.25
b
0.014
0.020
0.35
0.51
c
D
0.008 nominal
0.189
e
0.20 nominal
0.197
4.80
0.050
5.00
1.27
E
0.150
0.157
3.81
4.00
E1
0.228
0.244
5.80
6.20
L
0.016
0.044
0.40
1.12
n
8 leads
8 leads
NOTE:
1. Controlling dimensions are inches, millimeter dimensions are given for reference only.
2. Body dimensions do not include mold flash or protrusion. Mold flash and protrusion shall not exceed 0.006 inch
( 0.15 mm ).
3. Falls within JEDEC MS-012 variation AA.
FIGURE 1. Case outlines. – continued.
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Case Y
FIGURE 1. Case outlines. – continued.
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Case Y
Dimensions
Inches
Symbol
Millimeters
Min
Max
Min
Max
A
---
.042
---
1.07
A1
.001
.005
0.05
0.15
b
.009
.014
0.25
0.38
c
D
e
.005 nominal
.116
0.15 nominal
.120
2.95
.025 nominal
3.05
0.65 nominal
E
.116
.120
2.95
3.05
E1
.188
.196
4.78
4.98
L
.016
.027
0.41
0.69
n
8 leads
8 leads
NOTE:
1. Controlling dimensions are millimeter, inch dimensions are given for reference only.
2. Body dimensions do not include mold flash or protrusion.
3. This package is designed to be soldered to a thermal pad on the board. Refer to technical brief, power pad
thermally enhanced package, manufacturer’s literature number SLMA002 for information regarding recommended
board layout. This document is available at www.ti.com http://www.ti.com.
4. Falls within JEDEC MO-187.
FIGURE 1. Case outlines. – continued.
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Device types
01 and 02
Case outlines
X and Y
Terminal number
Terminal symbol
1
SENSE1
2
SENSE2
3
SENSE3
4
GND
5
RESET
6
RESET
7
MR
8
VDD
FIGURE 2. Terminal connections.
MR
SENSE1 > VIT1
SENSE2 > VIT2
SENSE3 > VIT3
RESET
RESET
L
X
X
X
L
H
H
0
0
0
L
H
H
0
0
1
L
H
H
0
1
0
L
H
H
0
1
1
L
H
H
1
0
0
L
H
H
1
0
1
L
H
H
1
1
0
L
H
H
1
1
1
H
L
H = High voltage level
L = Low voltage level
X = Don’t care
FIGURE 3. Truth table.
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NOTES:
1. R1 and R2 form an internal divider. It determines the threshold on the comparator positive input
coming from SENSE 1 pin.
2. R3 and R4 form an internal divider. It determines the threshold on the comparator positive input
coming from SENSE 2 pin.
FIGURE 4. Logic diagram.
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FIGURE 5. Timing waveforms.
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4. VERIFICATION
4.1 Product assurance requirements. The manufacturer is responsible for performing all inspection and test requirements as
indicated in their internal documentation. Such procedures should include proper handling of electrostatic sensitive devices,
classification, packaging, and labeling of moisture sensitive devices, as applicable.
5. PREPARATION FOR DELIVERY
5.1 Packaging. Preservation, packaging, labeling, and marking shall be in accordance with the manufacturer’s standard commercial
practices for electrostatic discharge sensitive devices.
6. NOTES
6.1 ESDS. Devices are electrostatic discharge sensitive and are classified as ESDS class 1 minimum.
6.2 Configuration control. The data contained herein is based on the salient characteristics of the device manufacturer’s data book.
The device manufacturer reserves the right to make changes without notice. This drawing will be modified as changes are provided.
6.3 Suggested source(s) of supply. Identification of the suggested source(s) of supply herein is not to be construed as a guarantee
of present or continued availability as a source of supply for the item.
Vendor item drawing
administrative control
number 1/
Device
manufacturer
CAGE code
Package
V62/03629-01XE
01295
Small outline
V62/03629-02YE
01295
Thermal pad
µ small outline
Vendor part number
Top-side
marking
Tape and
reel
TPS3307-18MDREP
301718E
Tape and
reel
TPS3307-33MDGNREP
3/
BNP 2/
1/ The vendor item drawing establishes an administrative control number for identifying the item on the engineering
documentation.
2/ Due to space limitations, BNP are three characters assigned by manufacturer that specifies the unique product type.
3/ The manufacture has changed lead frames NiPdAu to NiPdAuAg and location of assembly from their Hana facility to their
Shanghai facility. Product with a Lot Trace Code of 1CxxxxH and earlier is a NiPdAu frame from the Hana facility.
CAGE code
01295
DEFENSE SUPPLY CENTER, COLUMBUS
COLUMBUS, OHIO
Source of supply
Texas Instruments, Inc.
Semiconductor Group
8505 Forest Lane
P.O. Box 660199
Dallas, TX 75243
Point of contact: U.S. Highway 75 South
P.O. Box 84, M/S 853
Sherman, TX 75090-9493
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