SHENZHENFREESCALE AO4627

AO4627
30V Complementary MOSFET
General Description
The AO4627 uses advanced trench technology to provide excellent RDS(ON) and low gate charge. This
complementary N and P channel MOSFET configuration is ideal for low Input Voltage inverter application s.
Features
N-Channel
VDS= 30V
P-Channel
-30V
ID= 4.5A (VGS=10V)
-3.5A (VGS=-10V)
RDS(ON)
RDS(ON)
< 50mΩ (VGS=10V)
< 100mΩ (VGS=-10V)
< 68mΩ (VGS=4.5V)
< 165mΩ (VGS=-4.5V)
D1
D2
Top View
S2
G2
S1
G1
1
2
3
4
8
7
6
5
D2
D2
D1
D1
G2
G1
S2
n-channel
Absolute Maximum Ratings TA=25°C unless otherwise noted
Symbol
Max n-channel
Parameter
Drain-Source Voltage
VDS
30
Gate-Source Voltage
VGS
TA=25°C
Continuous Drain
Current
ID
TA=70°C
p-channel
Max p-channel
-30
Units
V
±20
±20
V
4.5
-3.5
A
3.5
-2.5
Pulsed Drain Current C
IDM
25
-20
Avalanche Current C
IAS, IAR
8
-8
A
Avalanche energy L=0.1mH C
EAS, EAR
3
3
mJ
2
2
1.3
1.3
TA=25°C
Power Dissipation
B
PD
TA=70°C
Junction and Storage Temperature Range
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A
Maximum Junction-to-Ambient A D
Maximum Junction-to-Lead
1/9
S1
TJ, TSTG
Symbol
t ≤ 10s
Steady-State
Steady-State
RθJA
RθJL
-55 to 150
Typ
48
74
32
W
°C
Max
62.5
90
40
Units
°C/W
°C/W
°C/W
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AO4627
30V Complementary MOSFET
N-Channel Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
Conditions
Min
ID=250µA, VGS=0V
Max
30
1
Zero Gate Voltage Drain Current
IGSS
Gate-Body leakage current
VDS=0V, VGS=±20V
VGS(th)
Gate Threshold Voltage
VDS=VGS,ID=250µA
1.5
ID(ON)
On state drain current
VGS=10V, VDS=5V
25
Units
V
VDS=30V, VGS=0V
IDSS
TJ=55°C
5
µA
±100
nA
2
2.5
V
39
50
63
78
VGS=4.5V, ID=3A
50
68
10
VGS=10V, ID=4.5A
RDS(ON)
Typ
Static Drain-Source On-Resistance
TJ=125°C
gFS
Forward Transconductance
VDS=5V, ID=4.5A
VSD
Diode Forward Voltage
IS=1A,VGS=0V
IS
Maximum Body-Diode Continuous Current
DYNAMIC PARAMETERS
Input Capacitance
Ciss
A
0.79
mΩ
mΩ
S
1
V
2.5
A
135
170
210
pF
VGS=0V, VDS=15V, f=1MHz
25
35
45
pF
13
23
33
pF
VGS=0V, VDS=0V, f=1MHz
1.7
3.5
5.3
Ω
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
4.05
5
nC
Qg(4.5V) Total Gate Charge
2
3
nC
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
Qgs
Gate Source Charge
Qgd
Gate Drain Charge
tD(on)
Turn-On DelayTime
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
VGS=10V, VDS=15V, ID=4.5A
VGS=10V, VDS=15V, RL=3.3Ω,
RGEN=3Ω
0.55
nC
1
nC
4.5
ns
1.5
ns
18.5
ns
tf
Turn-Off Fall Time
trr
Body Diode Reverse Recovery Time
IF=4.5A, dI/dt=100A/µs
7.5
Qrr
Body Diode Reverse Recovery Charge IF=4.5A, dI/dt=100A/µs
2.5
15.5
ns
10
ns
nC
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
value in any given application depends on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initialTJ=25°C.
D. The RθJA is the sum of the thermal impedance from junction to lead RθJL and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-ambient thermal impedance which is measured with the device mounted on 1in2 FR-4 board with
2oz. Copper, assuming a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
2/9
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AO4627
30V Complementary MOSFET
N-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
10
15
10V
VDS=5V
4.5V
12
4V
8
7V
ID(A)
6
ID (A)
9
3.5V
6
3
2
VGS=3V
0
25°C
0
0
1
2
3
4
5
1
VDS (Volts)
Fig 1: On-Region Characteristics (Note E)
2
3
4
5
VGS(Volts)
Figure 2: Transfer Characteristics (Note E)
2
Normalized On-Resistance
60
VGS=4.5V
RDS(ON) (mΩ
Ω)
125°C
4
50
40
VGS=10V
30
1.8
VGS=10V
ID=4.5A
1.6
17
5
2
VGS=4.5V
10
I =3A
1.4
1.2
D
1
0.8
0
2
4
6
8
ID (A)
Figure 3: On-Resistance vs. Drain Current and
Gate Voltage (Note E)
10
0
110
25
50
75
100
125
150
175
Temperature (°C)
0
Figure 4: On-Resistance vs. Junction Temperature
18
(Note E)
1.0E+02
ID=4.5A
1.0E+01
40
1.0E+00
IS (A)
RDS(ON) (mΩ
Ω)
90
125°C
70
1.0E-01
1.0E-02
1.0E-03
50
125°C
25°C
1.0E-04
25°C
30
1.0E-05
2
4
6
8
10
VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
3/9
0.0
0.2
0.4
0.6
0.8
1.0
1.2
VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
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AO4627
30V Complementary MOSFET
N-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
300
10
VDS=15V
ID=4.5A
250
Capacitance (pF)
VGS (Volts)
8
6
4
200
Ciss
150
100
Coss
2
50
Crss
0
0
0
1
2
3
4
Qg (nC)
Figure 7: Gate-Charge Characteristics
0
5
5
10
15
20
25
VDS (Volts)
Figure 8: Capacitance Characteristics
30
1000
100.0
TA=25°C
10µs
RDS(ON)
limited
100
100µs
1.0
1ms
10ms
0.1
TJ(Max)=150°C
TA=25°C
DC
Power (W)
ID (Amps)
10.0
10
10s
1
0.0
0.01
0.1
1
VDS (Volts)
10
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
100
0.00001
0.001
0.1
10
1000
Pulse Width (s)
Figure 10: Single Pulse Power Rating
Junction-to-Ambient (Note F)
Zθ JA Normalized Transient
Thermal Resistance
10
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
1
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
RθJA=90°C/W
0.1
PD
0.01
Ton
T
0.001
0.00001
4/9
0.0001
0.001
0.01
0.1
1
10
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
100
1000
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AO4627
30V Complementary MOSFET
Gate Charge Test Circuit & W aveform
Vgs
Qg
10V
+
+ Vds
VDC
-
Qgs
Qgd
VDC
-
DUT
Vgs
Ig
Charge
Resistive Switching Test Circuit & W aveforms
RL
Vds
Vds
Vgs
90%
+ Vdd
DUT
VDC
-
Rg
10%
Vgs
Vgs
t d(on)
tr
t d(off)
ton
tf
toff
Unclamped Inductive Switching (UIS) Test Circuit & W aveforms
L
2
E AR = 1/2 LIAR
Vds
BVDSS
Vds
Id
+ Vdd
Vgs
Vgs
I AR
VDC
-
Rg
Id
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Q rr = - Idt
Vds +
DUT
Vgs
Vds Isd
Vgs
Ig
5/9
L
Isd
+ Vdd
t rr
dI/dt
I RM
Vdd
VDC
-
IF
Vds
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AO4627
30V Complementary MOSFET
P-Channel Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
Drain-Source Breakdown Voltage
BVDSS
Conditions
Min
ID=-250µA, VGS=0V
VDS=-30V, VGS=0V
-30
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate-Body leakage current
VDS=0V, VGS=±20V
VGS(th)
Gate Threshold Voltage
ID(ON)
On state drain current
VDS=VGS, ID=-250µA
VGS=-10V, VDS=-5V
VGS=-10V, ID=-3.5A
RDS(ON)
Typ
-5
-1.4
VGS=-4.5V, ID=-2A
VDS=-5V, ID=-3.5A
IS=-1A,VGS=0V
gFS
Forward Transconductance
VSD
Diode Forward Voltage
IS
Maximum Body-Diode Continuous Current
DYNAMIC PARAMETERS
Ciss
Input Capacitance
µA
±100
nA
-1.9
-2.4
V
78
100
111
140
120
165
mΩ
-1
V
-2.5
A
-20
TJ=125°C
Units
V
-1
TJ=55°C
Static Drain-Source On-Resistance
Max
A
6
mΩ
S
-0.8
155
197
240
pF
VGS=0V, VDS=-15V, f=1MHz
28
42
55
pF
15
26
37
pF
VGS=0V, VDS=0V, f=1MHz
3.5
7.2
11
Ω
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
4.3
5.2
nC
Qg(4.5V) Total Gate Charge
2.2
3
nC
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
Qgs
Gate Source Charge
Qgd
Gate Drain Charge
tD(on)
Turn-On DelayTime
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
Turn-Off Fall Time
trr
Body Diode Reverse Recovery Time
Qrr
VGS=10V, VDS=-15V, ID=-3.5A
0.7
nC
1.1
nC
7.5
ns
4.1
ns
11.8
ns
VGS=10V, VDS=-15V, RL=4Ω,
RGEN=3Ω
IF=-3.5A, dI/dt=100A/µs
11.3
Body Diode Reverse Recovery Charge IF=-3.5A, dI/dt=100A/µs
4.4
3.8
ns
14
ns
nC
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
value in any given application depends on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initialTJ=25°C.
D. The RθJA is the sum of the thermal impedance from junction to lead RθJL and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-ambient thermal impedance which is measured with the device mounted on 1in2 FR-4 board with
2oz. Copper, assuming a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
6/9
www.freescale.net.cn
AO4627
30V Complementary MOSFET
P-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
10
15
-10V
VDS=-5V
-6V
-8V
12
8
-5V
6
-ID(A)
-ID (A)
9
-4.5V
4
6
125°C
-4V
2
3
25°C
VGS=-3.5V
0
0
0
1
2
3
4
1
5
-VDS (Volts)
Fig 1: On-Region Characteristics (Note E)
2
3
4
5
6
-VGS(Volts)
Figure 2: Transfer Characteristics (Note E)
200
1.6
Normalized On-Resistance
180
160
RDS(ON) (mΩ
Ω)
VGS=-4.5V
140
120
100
80
VGS=-10V
60
40
VGS=-10V
ID=-3.5A
1.4
17
5
2
VGS=-4.5V
10
1.2
1
ID=-2A
0.8
0
2
4
6
8
-ID (A)
Figure 3: On-Resistance vs. Drain Current and
Gate Voltage (Note E)
10
0
25
50
75
100
125
150
175
Temperature (°C)
0
Figure 4: On-Resistance vs. Junction Temperature
18
(Note E)
1.0E+02
300
ID=-3.5A
1.0E+01
260
40
1.0E+00
-IS (A)
RDS(ON) (mΩ
Ω)
220
180
125°C
1.0E-01
1.0E-02
125°C
25°C
140
1.0E-03
100
25°C
1.0E-04
60
1.0E-05
2
4
6
8
10
-VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
7/9
0.0
0.2
0.4
0.6
0.8
1.0
1.2
-VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
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AO4627
30V Complementary MOSFET
P-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
300
10
VDS=-15V
ID=-3.5A
250
Ciss
Capacitance (pF)
-VGS (Volts)
8
6
4
200
150
100
2
50
0
0
Coss
Crss
0
1
2
3
4
Qg (nC)
Figure 7: Gate-Charge Characteristics
5
10
15
20
25
-VDS (Volts)
Figure 8: Capacitance Characteristics
30
1000
100.0
TA=25°C
10µs
RDS(ON)
limited
100µs
1.0
1ms
10ms
0.1
TJ(Max)=150°C
TA=25°C
100
Power (W)
10.0
-ID (Amps)
0
5
10
10s
DC
0.0
1
0.01
0.1
1
-VDS (Volts)
10
100
0.00001
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
0.001
0.1
10
1000
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junctionto-Ambient (Note F)
Zθ JA Normalized Transient
Thermal Resistance
10
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
1
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
RθJA=90°C/W
0.1
PD
0.01
Ton
T
0.001
0.00001
0.0001
0.001
0.01
0.1
1
10
100
1000
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
8/9
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AO4627
30V Complementary MOSFET
Gate Charge Test Circuit & W aveform
Vgs
Qg
-10V
-
-
VDC
+
VDC
Qgs
Vds
Qgd
+
DUT
Vgs
Ig
Charge
Resistive Switching Test Circuit & Waveforms
RL
Vds
t off
ton
Vgs
-
DUT
Vgs
VDC
td(on)
td(off)
tr
tf
90%
Vdd
+
Rg
Vgs
10%
Vds
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
2
L
E AR= 1/2 LIAR
Vds
Vds
Id
-
Vgs
Vgs
VDC
+
Rg
BVDSS
Vdd
Id
I AR
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Q rr = - Idt
Vds +
DUT
Vds -
Isd
Vgs
Ig
9/9
Vgs
L
-Isd
+ Vdd
t rr
dI/dt
-I RM
Vdd
VDC
-
-I F
-Vds
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