SHENZHENFREESCALE AO4629

AO4629
30V Complementary MOSFET
General Description
AO4629 uses advanced trench technology to provide excellent RDS(ON) and low gate charge. This
complementary N and P channel MOSFET configuration is ideal for low Input Voltage inverter applications.
Features
N-Channel
VDS= 30V
P-Channel
-30V
ID= 6A (VGS=10V)
-5.5A (VGS=-10V)
RDS(ON)
RDS(ON)
< 30mΩ (VGS=10V)
< 41mΩ (VGS=-10V)
< 42mΩ (VGS=4.5V)
< 74mΩ (VGS=-4.5V)
D2
D1
Top View
S2
G2
S1
G1
1
2
3
4
D2
D2
D1
D1
8
7
6
5
G2
G1
S2
n-channel
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Symbol
Max n-channel
Drain-Source Voltage
VDS
30
Gate-Source Voltage
VGS
TA=25°C
Continuous Drain
Current
Pulsed Drain Current
ID
TA=70°C
C
Max p-channel
-30
Units
V
±20
±20
V
6
-5.5
5
-4.5
A
IDM
30
-25
Avalanche Current C
IAS, IAR
10
17
A
Avalanche energy L=0.1mH C
EAS, EAR
5
14
mJ
TA=25°C
Power Dissipation B
PD
TA=70°C
Junction and Storage Temperature Range
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A
Maximum Junction-to-Ambient A D
Maximum Junction-to-Lead
1/9
S1
p-channel
Steady-State
Steady-State
2
1.3
TJ, TSTG
Symbol
t ≤ 10s
2
1.3
RθJA
RθJL
-55 to 150
Typ
48
74
32
W
°C
Max
62.5
90
40
Units
°C/W
°C/W
°C/W
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AO4629
30V Complementary MOSFET
N-Channel Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
Conditions
Min
ID=250µA, VGS=0V
uses
Gate-Body leakage current
VDS=0V, VGS= ±20V
VGS(th)
Gate Threshold Voltage
On state drain current
VDS=VGS ID=250µA
1.2
VGS=10V, VDS=5V
30
TJ=55°C
5
VGS=10V, ID=6A
100
nA
2.4
V
25
30
40
48
42
mΩ
1
V
2.5
A
310
pF
A
Static Drain-Source On-Resistance
VGS=4.5V, ID=5A
33
gFS
Forward Transconductance
VDS=5V, ID=6A
15
VSD
Diode Forward Voltage
IS=1A,VGS=0V
0.76
IS
Maximum Body-Diode Continuous Current
DYNAMIC PARAMETERS
Input Capacitance
Ciss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
255
VGS=0V, VDS=15V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
mΩ
S
45
1.6
µA
1.8
RDS(ON)
TJ=125°C
Units
V
1
Zero Gate Voltage Drain Current
Coss
Max
30
VDS=30V, VGS=0V
IDSS
ID(ON)
Typ
pF
35
50
pF
3.25
4.9
Ω
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
4
5.2
6.3
nC
Qg(4.5V) Total Gate Charge
2
2.55
3.2
nC
Qgs
Gate Source Charge
Qgd
Gate Drain Charge
VGS=10V, VDS=15V, ID=6A
0.85
nC
1.3
nC
4.5
ns
2.5
ns
tD(on)
Turn-On DelayTime
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
Turn-Off Fall Time
trr
Body Diode Reverse Recovery Time
IF=6A, dI/dt=100A/µs
8.5
12
Qrr
Body Diode Reverse Recovery Charge IF=6A, dI/dt=100A/µs
2.2
3
VGS=10V, VDS=15V, RL=2.5Ω,
RGEN=3Ω
14.5
ns
3.5
ns
ns
nC
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The value
in any given application depends on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initialTJ=25°C.
D. The RθJA is the sum of the thermal impedence from junction to lead RθJL and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in2 FR-4 board with 2oz.
Copper, assuming a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
2/9
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AO4629
30V Complementary MOSFET
N-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
30
15
10V
VDS=5V
25
4.5V
6V
4V
9
ID(A)
ID (A)
20
12
15
3.5V
6
125°C
10
3
5
25°C
VGS=3V
0
0
0
1
2
3
4
5
0.5
VDS (Volts)
Fig 1: On-Region Characteristics (Note E)
Normalized On-Resistance
VGS=4.5V
RDS(ON) (mΩ
Ω)
2
2.5
3
3.5
4
4.5
2
40
35
30
25
VGS=10V
20
15
VGS=10V
ID=6A
1.8
1.6
17
5
2
VGS=4.5V
10
I =5A
1.4
1.2
D
1
0.8
0
2
4
6
8
10
ID (A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage (Note E)
0
25
50
75
100
125
150
175
Temperature (°C)
0
Figure 4: On-Resistance vs. Junction Temperature
18
(Note E)
1.0E+02
100
ID=6A
1.0E+01
40
80
1.0E+00
60
125°C
IS (A)
RDS(ON) (mΩ
Ω)
1.5
VGS(Volts)
Figure 2: Transfer Characteristics (Note E)
45
1.0E-01
125°C
25°C
1.0E-02
1.0E-03
40
25°C
1.0E-04
20
1.0E-05
2
6
8
10
VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
3/9
1
4
0.0
0.2
0.4
0.6
0.8
1.0
1.2
VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
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AO4629
30V Complementary MOSFET
N-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
10
500
VDS=15V
ID=6A
400
Ciss
Capacitance (pF)
VGS (Volts)
8
6
4
300
200
Coss
2
100
0
0
0
1
2
3
4
5
Qg (nC)
Figure 7: Gate-Charge Characteristics
0
6
100.0
Crss
5
10 V (Volts)
15
20
25
DS
Figure 8: Capacitance Characteristics
30
1000
TA=25°C
10µs
RDS(ON)
limited
100
100µs
1ms
1.0
10ms
0.1
TJ(Max)=150°C
TA=25°C
Power (W)
ID (Amps)
10.0
10
10s
DC
1
0.0
0.01
0.1
1
VDS (Volts)
10
Figure 9: Maximum Forward Biased Safe
Operating Area (Note F)
100
0.00001
0.001
0.1
10
1000
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junctionto-Ambient (Note F)
Zθ JA Normalized Transient
Thermal Resistance
10
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
1
RθJA=90°C/W
0.1
PD
0.01
Single Pulse
Ton
T
0.001
0.00001
4/9
0.0001
0.001
0.01
0.1
1
10
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
100
1000
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AO4629
30V Complementary MOSFET
Gate Charge Test Circuit & W aveform
Vgs
Qg
10V
+
+ Vds
VDC
-
Qgs
Qgd
VDC
-
DUT
Vgs
Ig
Charge
Resistive Switching Test Circuit & W aveforms
RL
Vds
Vds
Vgs
90%
+ Vdd
DUT
VDC
-
Rg
10%
Vgs
Vgs
t d(on)
tr
t d(off)
ton
tf
toff
Unclamped Inductive Switching (UIS) Test Circuit & W aveforms
L
2
E AR = 1/2 LIAR
Vds
BVDSS
Vds
Id
+ Vdd
Vgs
Vgs
I AR
VDC
-
Rg
Id
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Q rr = - Idt
Vds +
DUT
Vgs
Vds Isd
Vgs
Ig
5/9
L
Isd
+ Vdd
t rr
dI/dt
I RM
Vdd
VDC
-
IF
Vds
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AO4629
30V Complementary MOSFET
P-Channel Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
Conditions
Min
ID=-250µA, VGS=0V
VDS=-30V, VGS=0V
-30
IDSS
Zero Gate Voltage Drain Current
uses
Gate-Body leakage current
VDS=0V, VGS= ±20V
VGS(th)
Gate Threshold Voltage
On state drain current
VDS=VGS ID=-250µA
VGS=-10V, VDS=-5V
VGS=-10V, ID=-5.5A
ID(ON)
-1.5
gFS
Forward Transconductance
VSD
Diode Forward Voltage
IS
Maximum Body-Diode Continuous Current
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
100
nA
-2.5
V
32
41
47
58
51
74
-0.76
VGS=0V, VDS=-15V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
A
13
DYNAMIC PARAMETERS
Ciss
Input Capacitance
mΩ
mΩ
S
-1
V
-2.5
A
520
pF
100
pF
65
pF
Ω
7.5
11.5
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
9.2
11
nC
Qg(4.5V) Total Gate Charge
4.6
6
nC
VGS=-10V, VDS=-15V, ID=-5.5A
3.5
µA
-2
-25
VGS=-4.5V, ID=-4.5A
VDS=-5V, ID=-5.5A
IS=-1A,VGS=0V
Units
V
-5
TJ=125°C
Static Drain-Source On-Resistance
Max
-1
TJ=55°C
RDS(ON)
Coss
Typ
Qgs
Gate Source Charge
1.6
nC
Qgd
Gate Drain Charge
2.2
nC
tD(on)
Turn-On DelayTime
7.5
ns
tr
Turn-On Rise Time
5.5
ns
tD(off)
Turn-Off DelayTime
tf
Turn-Off Fall Time
trr
Body Diode Reverse Recovery Time
Qrr
VGS=-10V, VDS=-15V, RL=2.7Ω,
RGEN=3Ω
19
ns
7
ns
IF=-5.5A, dI/dt=500A/µs
11
Body Diode Reverse Recovery Charge IF=-5.5A, dI/dt=500A/µs
5.3
ns
nC
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The value
in any given application depends on the user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep
initialTJ=25°C.
D. The RθJA is the sum of the thermal impedence from junction to lead RθJL and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in2 FR-4 board with 2oz.
Copper, assuming a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
6/9
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AO4629
30V Complementary MOSFET
P-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
30
25
-10V
-5V
-8V
20
VDS=-5V
25
-4.5V
20
-ID(A)
-ID (A)
15
-4V
15
10
10
5
VGS=-3.5V
125°C
5
25°C
0
0
0
1
2
3
4
5
0.5
-VDS (Volts)
Fig 1: On-Region Characteristics (Note E)
1.5
2
2.5
3
3.5
4
4.5
5
5.5
-VGS(Volts)
Figure 2: Transfer Characteristics (Note E)
80
Normalized On-Resistance
1.8
70
VGS=-4.5V
60
RDS(ON) (mΩ
Ω)
1
50
40
30
VGS=-10V
20
10
VGS=-10V
ID=-5.5A
1.6
1.4
17
5
2
10
VGS=-4.5V
1.2
1
ID=-4.5A
0.8
0
2
4
6
8
-ID (A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage (Note E)
0
25
50
75
100
125
150
175
Temperature (°C)
0
Figure 4: On-Resistance vs. Junction Temperature
18
(Note E)
1.0E+02
120
ID=-5.5A
1.0E+01
100
40
80
-IS (A)
RDS(ON) (mΩ
Ω)
1.0E+00
60
125°C
1.0E-01
125°C
1.0E-02
25°C
1.0E-03
40
1.0E-04
25°C
20
1.0E-05
2
6
8
10
-VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
7/9
4
0.0
0.2
0.4
0.6
0.8
1.0
1.2
-VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
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AO4629
30V Complementary MOSFET
P-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
10
800
VDS=-15V
ID=-5.5A
700
Ciss
600
Capacitance (pF)
-VGS (Volts)
8
6
4
500
400
300
Coss
200
2
100
Crss
0
0
0
2
4 g (nC)
6
8
Q
Figure 7: Gate-Charge Characteristics
0
10
5
10
15
20
25
-VDS (Volts)
Figure 8: Capacitance Characteristics
30
1000
100.0
TA=25°C
10µs
RDS(ON)
100µs
1ms
1.0
10ms
0.1
TJ(Max)=150°C
TA=25°C
100
Power (W)
-ID (Amps)
10.0
10
10s
DC
0.0
1
0.01
0.1
1
-VDS (Volts)
10
100
0.00001
Figure 9: Maximum Forward Biased Safe
Operating Area (Note F)
0.001
0.1
10
1000
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junctionto-Ambient (Note F)
Zθ JA Normalized Transient
Thermal Resistance
10
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
1
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
RθJA=90°C/W
0.1
PD
0.01
Single Pulse
Ton
T
0.001
0.00001
0.0001
0.001
0.01
0.1
1
10
100
1000
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
8/9
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AO4629
30V Complementary MOSFET
Gate Charge Test Circuit & W aveform
Vgs
Qg
-10V
-
-
VDC
+
VDC
Qgs
Vds
Qgd
+
DUT
Vgs
Ig
Charge
Resistive Switching Test Circuit & Waveforms
RL
Vds
t off
ton
Vgs
-
DUT
Vgs
VDC
td(on)
td(off)
tr
tf
90%
Vdd
+
Rg
Vgs
10%
Vds
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
2
L
E AR= 1/2 LIAR
Vds
Vds
Id
-
Vgs
Vgs
VDC
+
Rg
BVDSS
Vdd
Id
I AR
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Q rr = - Idt
Vds +
DUT
Vds -
Isd
Vgs
Ig
9/9
Vgs
L
-Isd
+ Vdd
t rr
dI/dt
-I RM
Vdd
VDC
-
-I F
-Vds
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