HITACHI BB504C

BB504C
Build in Biasing Circuit MOS FET IC
VHF&UHF RF Amplifier
ADE-208-983D (Z)
5th. Edition
Dec. 2000
Features
•
•
•
•
Build in Biasing Circuit; To reduce using parts cost & PC board space.
Low noise; NF = 1.0 dB typ. at f = 200 MHz,NF =1.75 dB typ. at f =900 MHz
High gain; PG = 30 dB typ. at f = 200 MHz, PG = 22 dB typ. at f = 900 MHz
Withstanding to ESD;
Build in ESD absorbing diode. Withstand up to 200 V at C = 200 pF, Rs = 0 conditions.
• Provide mini mold packages; CMPAK-4 (SOT-343mod)
Outline
CMPAK-4
2
3
1
4
Notes:
1.
2.
1. Source
2. Gate1
3. Gate2
4. Drain
Marking is “DS–”.
BB504C is individual type number of HITACHI BBFET.
BB504C
Absolute Maximum Ratings (Ta = 25°C)
Item
Symbol
Ratings
Unit
Drain to source voltage
VDS
6
V
Gate1 to source voltage
VG1S
+6
–0
V
Gate2 to source voltage
VG2S
+6
–0
V
Drain current
ID
30
mA
Channel power dissipation
Pch
100
mW
Channel temperature
Tch
150
°C
Storage temperature
Tstg
–55 to +150
°C
Electrical Characteristics (Ta = 25°C)
Item
Symbol
Min
Typ
Max
Unit
Test Conditions
Drain to source breakdown
voltage
V(BR)DSS
6
—
—
V
I D = 200µA, VG1S = VG2S = 0
Gate1 to source breakdown
voltage
V(BR)G1SS
+6
—
—
V
I G1 = +10µA, VG2S = VDS = 0
Gate2 to source breakdown
voltage
V(BR)G2SS
+6
—
—
V
I G2 = +10µA, VG1S = VDS = 0
Gate1 to source cutoff current I G1SS
—
—
+100
nA
VG1S = +5V, V G2S = VDS = 0
Gate2 to source cutoff current I G2SS
—
—
+100
nA
VG2S = +5V, V G1S = VDS = 0
Gate1 to source cutoff voltage VG1S(off)
0.6
0.85
1.1
V
VDS = 5V, VG2S = 4V, ID = 100µA
Gate2 to source cutoff voltage VG2S(off)
0.6
0.85
1.1
V
VDS = 5V, VG1S = 5V, ID = 100µA
Drain current
I D(op)
13
16
19
mA
VDS = 5V, VG1 = 5V
VG2S = 4V, RG = 120kΩ
Forward transfer admittance
|yfs|
24
29
34
mS
VDS = 5V, VG1 = 5V, VG2S =4V
RG = 120kΩ, f = 1kHz
Input capacitance
c iss
1.7
2.1
2.5
pF
VDS = 5V, VG1 = 5V
Output capacitance
c oss
1.0
1.4
1.8
pF
VG2S =4V, RG = 120kΩ
Reverse transfer capacitance
c rss
—
0.027
0.05
pF
f = 1MHz
Power gain (1)
PG
25
30
—
dB
VDS = 5V, VG1 = 5V
VG2S =4V, RG = 120kΩ
Noise figure (1)
NF
—
1.0
1.8
dB
f = 200MHz
Power gain (2)
PG
17
22
—
dB
VDS = 5V, VG1 = 5V
VG2S =4V, RG = 120kΩ
Noise figure (2)
NF
—
1.75
2.3
dB
f = 900MHz
2
BB504C
Test Circuits
• DC Biasing Circuit for Operating Characteristics Items (ID(op), |yfs|, Ciss, Coss, Crss, NF, PG)
VG2
VG1
RG
Gate 2
Gate 1
Drain
Source
A
ID
• 200MHz Power Gain, Noise Figure Test Circuit
1000p
1000p
47k
VT
VG2
VT
1000p
47k
1000p
47k
BBFET
Output(50Ω)
1000p
L2
Input(50Ω)
L1
10p max
1000p
1000p
36p
1SV70
RG
RFC
120k
1SV70
1000p
V D = V G1
Unit Resistance (Ω)
Capacitance (F)
L1 : Φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
L2 : Φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
RFC : Φ1mm Enameled Copper Wire,Inside dia 5mm, 2Turns
3
BB504C
• 900 MHz Power Gain, Noise Figure Test Circuit
VD
VG1 VG2
C6
C4
C5
R1
R2
C3
R3
RFC
D
G2
Output
L3
L4
G1
Input
S
L1
L2
C1
C1, C2
C3
C4 to C6
R1
R2
R3
C2
:
:
:
:
:
:
Variable Capacitor (10pF MAX)
Disk Capacitor (1000pF)
Air Capacitor (1000pF)
120 kΩ
47 kΩ
4.7 kΩ
L2:
L1:
10
3
3
8
10
26
(Φ1mm Copper wire)
Unit:mm
21
L4:
L3:
18
10
10
7
7
29
RFC : Φ1mm Copper wire with enamel 4turns inside dia 6mm
4
Typical Output Characteristics
50
0
50
100
150
Ambient Temperature
Forward Transfer Admittance |y fs | (mS)
I D (mA)
Drain Current
V DS = 5 V
R G = 120 kΩ
4V
12
3V
2V
8
4
VG2S = 1 V
0
1
2
Gate1 Voltage
3
V G1
4
(V)
5
8k
=6
4
Ta (°C)
20
kΩ
0
18 Ω
0k
22
8
0
200
Drain Current vs. Gate1 Voltage
16
12
82
10 k Ω
15
0
1
2
k
0
kΩ 0 kΩ Ω
100
16
RG
150
V G2S = 4 V
V G1 = VDS
Ω
20
I D (mA)
200
Maximum Channel Power
Dissipation Curve
Drain Current
Channel Power Dissipation
Pch (mW)
BB504C
1
2
3
Drain to Source Voltage
4
5
V DS (V)
Forward Transfer Admittance
vs. Gate1 Voltage
30
24
V DS = 5 V
R G = 120 kΩ
f = 1 kHz
4V
3V
18
2V
12
6
VG2S = 1 V
0
1
2
3
4
Gate1 Voltage VG1 (V)
5
5
BB504C
Noise Figure vs. Gate Resistance
Power Gain vs. Gate Resistance
4
Power Gain PG (dB)
35
30
25
20
15
10
10
V DS = 5 V
V G1 = 5 V
V G2S = 4 V
f = 200 MHz
Noise Figure NF (dB)
40
3
2
1
0
10
20
50 100 200
500 1000
Gate Resistance R G (k Ω )
Power Gain vs. Gate Resistance
Power Gain PG (dB)
30
25
20
6
V DS = 5 V
V G1 = 5 V
V G2S = 4 V
f = 900 MHz
20
50 100 200
500 1000
Gate Resistance R G (k Ω )
Noise Figure NF (dB)
4
35
10
10
20
50 100 200
500 1000
Gate Resistance R G (k Ω )
Noise Figure vs. Gate Resistance
40
15
V DS = 5 V
V G1 = 5 V
V G2S = 4 V
f = 200MHz
3
V DS = 5V
V G1 = 5 V
V G2S = 4 V
f = 900 MHz
2
1
0
10
20
50 100 200
500 1000
Gate Resistance R G (k Ω )
BB504C
30
4
Input Capacitance Ciss (pF)
Drain Current I D (mA)
Input Capacitance vs.
Gate2 to Source Voltage
Drain Current vs. Gate Resistance
20
10
V DS = VG1 = 5 V
V G2S = 4 V
0
10
3
2
1
0
20
50 100 200
500 1000
Gate Resistance R G (k Ω )
V DS = VG1 = 5 V
R G = 120 kΩ
f = 1 MHz
0
3
4
Gain Reduction vs.
Gate2 to Source Voltage
0
0
Gain Reduction GR (dB)
Gain Reduction GR (dB)
2
Gate2 to Source Voltage V G2S (V)
Gain Reduction vs.
Gate2 to Source Voltage
10
20
30
VDS = VG1 = 5 V
R G = 120 kΩ
f = 200MHz
40
50
1
4
3
2
1
Gate2 to Source Voltage V G2S (V)
0
10
20
30
V DS = V G1 = 5 V
R G = 120 kΩ
f = 900MHz
40
50
4
3
2
1
0
Gate2 to Source Voltage V G2S (V)
7
BB504C
S21 Parameter vs. Frequency
S11 Parameter vs. Frequency
.8
1
.6
90°
1.5
Scale: 1 / div.
60°
120°
2
.4
3
30°
150°
4
5
.2
10
.2
0
.4
.6 .8 1
1.5 2
3 45
10
180°
0°
-10
-5
-4
- .2
-3
- .4
- 30°
- 150°
-2
- .6
- .8
-1
- 90°
Test Condition: VDS = 5 V , VG1 = 5 V
VG2S = 4 V , R G = 120 k Ω ,
Zo = 50 Ω
50 to 1000 MHz (50 MHz step)
Test Condition: VDS = 5 V , VG1 = 5 V
VG2S = 4 V , R G = 120 k Ω ,
Zo = 50 Ω
50 to 1000 MHz (50 MHz step)
S12 Parameter vs. Frequency
90°
S22 Parameter vs. Frequency
Scale: 0.004/ div.
.8
60°
120°
- 60°
- 120°
- 1.5
1
.6
1.5
2
.4
3
30°
150°
4
5
.2
10
180°
0°
.2
0
.4
.6 .8 1
1.5 2
3 45
10
-10
-5
-4
- .2
- 30°
- 150°
-3
- .4
- 60°
- 120°
- 90°
Test Condition: VDS = 5 V , VG1 = 5 V
VG2S = 4 V , R G = 120 k Ω ,
Zo = 50 Ω
50 to 1000 MHz (50 MHz step)
8
-2
- .6
- .8
-1
- 1.5
Test Condition: VDS = 5 V , VG1 = 5 V
VG2S = 4 V , R G = 120 k Ω ,
Zo = 50 Ω
50 to 1000 MHz (50 MHz step)
BB504C
Sparameter (VDS = VG1 = 5V, VG2S = 4V, RG = 120kΩ, Zo = 50Ω)
S11
S21
S12
S22
f (MHz) MAG
ANG
MAG
ANG
MAG
ANG
MAG
ANG
50
1.000
-3.3
2.80
175.9
0.00106
58.8
0.990
-2.4
100
0.993
-7.2
2.78
170.9
0.00171
75.7
0.992
-4.7
150
0.991
-10.9
2.77
166.1
0.00253
75.1
0.991
-7.2
200
0.984
-15.0
2.74
161.2
0.00356
77.4
0.987
-9.6
250
0.978
-19.0
2.72
156.5
0.00442
78.2
0.985
-12.2
300
0.970
-22.8
2.68
151.8
0.00485
80.0
0.982
-14.7
350
0.958
-26.7
2.64
147.2
0.00576
74.7
0.978
-17.1
400
0.954
-30.3
2.60
142.7
0.00642
71.7
0.973
-19.6
450
0.945
-33.8
2.56
138.6
0.00689
73.3
0.968
-22.0
500
0.932
-37.5
2.50
134.1
0.00712
71.8
0.963
-24.2
550
0.920
-40.6
2.46
129.8
0.00765
70.7
0.958
-26.7
600
0.910
-44.3
2.41
125.7
0.00804
69.9
0.952
-28.9
650
0.900
-47.5
2.37
121.6
0.00798
69.1
0.947
-31.3
700
0.887
-50.9
2.31
117.8
0.00787
67.8
0.942
-33.4
750
0.870
-54.4
2.27
113.6
0.00785
70.8
0.936
-35.8
800
0.863
-57.6
2.22
110.0
0.00758
73.3
0.929
-37.9
850
0.853
-60.9
2.18
105.8
0.00721
75.2
0.924
-40.3
900
0.839
-63.6
2.12
102.2
0.00694
75.8
0.917
-42.5
950
0.827
-66.5
2.07
98.6
0.00716
88.1
0.912
-44.5
1000
0.819
-70.1
2.04
94.9
0.00667
92.7
0.906
-46.7
9
BB504C
Package Dimensions
As of January, 2001
Unit: mm
0.1
0.3 +– 0.05
0.2
0.65 0.6
1.25 ± 0.2
0.9 ± 0.1
0.1
0.4 +– 0.05
0 – 0.1
0.425
0.1
0.3 +– 0.05
+ 0.1
0.16– 0.06
2.1 ± 0.3
0.65 0.65
1.25 ± 0.1
0.1
0.3 +– 0.05
0.425
2.0 ± 0.2
1.3 ± 0.2
Hitachi Code
JEDEC
EIAJ
Mass (reference value)
10
CMPAK-4(T)
—
Conforms
0.006 g
BB504C
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
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Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URL
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:
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:
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For further information write to:
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(America) Inc.
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Copyright  Hitachi, Ltd., 2000. All rights reserved. Printed in Japan.
Colophon 2.0
11