CAS300M17BM2 1.7kV, 8.0 mΩ All-Silicon Carbide Half-Bridge Module C2M MOSFET and Z-Rec® Diode 1.7 kV RDS(on) 8.0 mΩ Esw, Total @ 300A, 150 ˚C Features • • • • • • • VDS Package 23.7 mJ 62mm x 106mm x 30mm Ultra Low Loss High-Frequency Operation Zero Reverse Recovery Current from Diode Zero Turn-off Tail Current from MOSFET Normally-off, Fail-safe Device Operation Ease of Paralleling Copper Baseplate and Aluminum Nitride Insulator System Benefits • • • • • Enables Compact and Lightweight Systems High Efficiency Operation Mitigates Over-voltage Protection Reduced Thermal Requirements Reduced System Cost Applications • • • • • HF Resonant Converters/Inverters Solar and Wind Inverters UPS and SMPS Motor Drive Traction Part Number Package Marking CAS300M17BM2 Half-Bridge Module CAS300M17BM2 Maximum Ratings (TC = 25˚C unless otherwise specified) Symbol BM2,Rev. - Value Unit Test Conditions VDSmax Drain - Source Voltage 1.7 kV VGSmax Gate - Source Voltage -10/+25 V Absolute maximum values VGSop Gate - Source Voltage -5/20 V Recommended operational values ID S300M17 Datasheet: CA Parameter ID(pulse) Continuous MOSFET Drain Current Pulsed Drain Current 325 225 900 A A 556 IF TJmax TC ,TSTG Continuous Diode Forward Current 353 A Junction Temperature -40 to +150 ˚C Case and Storage Temperature Range -40 to +125 ˚C VGS = 20 V, TC = 25 ˚C VGS = 20 V, TC = 90 ˚C Notes Fig. 26 Pulse width tp limited by TJ(max) VGS = -5 V, TC = 25 ˚C VGS = -5 V, TC = 90 ˚C Visol Case Isolation Voltage 4.5 kV AC, 50 Hz , 1 min LStray Stray Inductance 15 nH Measured between terminals 2 and 3 PD Power Dissipation 1760 W TC = 25 ˚C, TJ = 150 ˚C Subject to change without notice. www.cree.com Fig. 27 Fig. 25 1 Electrical Characteristics (TC = 25˚C unless otherwise specified) Symbol Parameter Min. V(BR)DSS Drain - Source Breakdown Voltage 1.7 VGS(th) Gate Threshold Voltage 1.8 IDSS Zero Gate Voltage Drain Current IGSS Gate-Source Leakage Current RDS(on) On State Resistance Typ. Max. Unit Test Conditions kV VGS, = 0 V, ID = 1 mA V VDS = 10 V, ID = 15 mA 500 2.3 1000 μA VDS = 1.7 kV, VGS = 0V 1500 3000 μA VDS = 1.7 kV,VGS = 0V, TJ = 150 ˚C 1 600 nA VGS = 20 V, VDS = 0V 8.0 10 16.2 20 mΩ 95 VGS = 20V, IDS = 225 A,TJ = 150 ˚C VDS = 20 V, IDS = 225 A Fig. 7 Fig. 4, 5, 6 gfs Transconductance Ciss Input Capacitance 20 Coss Output Capacitance 2.5 Crss Reverse Transfer Capacitance 0.08 Eon Turn-On Switching Energy 13.0 mJ EOff Turn-Off Switching Energy 10.0 mJ Internal Gate Resistance 3.7 Ω f = 1 MHz, VAC = 25 mV QGS Gate-Source Charge 273 QGD Gate-Drain Charge 324 nC Fig. 15 QG Total Gate Charge 1076 VDD= 900 V, VGS = -5V/+20V, ID= 300 A, Per JEDEC24 pg 27 td(on) Turn-on delay time 105 ns 72 ns 211 ns Fig. 24 56 ns VDD = 900V, VGS = -5/+20V, ID = 300 A, RG(ext) = 2.5 Ω, Timing relative to VDS Note: IEC 60747-8-4, pg 83 Inductive load IF = 300 A, VGS = 0 Fig. 10 IF = 300 A, VGS = 0 , TJ = 150 ˚C Fig. 11 RG (int) tr td(off) tf VSD QC S VGS = 20 V, IDS = 225 A Note 82 Rise Time Turn-off delay time Fall Time Diode Forward Voltage Total Capacitive Charge nF 1.7 2.0 2.2 2.5 4.4 V μC VDS = 20 V, ID = 225 A, TJ = 150 ˚C Fig. 8 VDS = 1 kV, f = 200 kHz, VAC = 25 mV Fig. 16, 17 VDD = 900 V, VGS = -5V/+20V ID = 300 A, RG(ext) = 2.5 Ω Load = 77 μH, TJ = 150 ˚C Note: IEC 60747-8-4 Definitions Fig. 19 ISD = 300 A, VDS = 900 V, TJ = 25°C, diSD/dt = 9 kA/μs, VGS = -5 V Thermal Characteristics Symbol Parameter Min. Typ. Max. RthJCM Thermal Resistance Juction-to-Case for MOSFET 0.067 0.071 RthJCD Thermal Resistance Juction-to-Case for Diode 0.060 0.065 Unit Test Conditions Fig. 27 ˚C/W Fig. 28 Additional Module Data Symbol Parameter Unit 300 g Test Condtion W Weight M Mounting Torque 5 Nm To heatsink and terminals Clearance Distance 9 mm Terminal to terminal 30 mm Terminal to terminal 40 mm Terminal to baseplate Creepage Distance 2 Max. CAS300M17BM2,Rev. - Note Typical Performance 600 600 VGS = 20 V VGS = 20 V 500 VGS = 18 V VGS = 14 V VGS = 16 V 400 Drain-Source Current, IDS (A) Drain-Source Current, IDS (A) 500 VGS = 12 V 300 VGS = 10 V 200 100 0 2 4 6 8 10 12 400 VGS = 16 V VGS = 10 V 300 200 Conditions: TJ = 25°C tp = 200 µs 0 14 0 2 4 Drain-Source Voltage VDS (V) 10 12 14 2.5 Conditions: IDS = 225 A VGS = 20 V tp = 200 µs VGS = 20 V 500 VGS = 18 V 2.0 VGS = 12 V VGS = 16 V 400 On Resistance, RDS On (p.u.) Drain-Source Current, IDS (A) 8 Figure 2. Output Characteristics TJ = 25 ˚C 600 VGS = 10 V VGS = 14 V 300 200 100 Conditions: TJ = 150°C tp = 200 µs 0 1.5 1.0 0.5 0.0 0 2 4 6 8 10 12 -50 14 -25 0 50 75 100 125 150 Figure 4. Normalized On-Resistance vs. Temperature Figure 3. Output Characteristics TJ = 150 ˚C 30 25 Junction Temperature, TJ (°C) Drain-Source Voltage VDS (V) 18 Conditions: VGS = 20 V tp = 200 µs 25 16 On Resistance, RDS On (mΩ) On-Resistance, RDS ON (mΩ) 6 Drain-Source Voltage VDS (V) Figure 1. Output Characteristics TJ = -40 ˚C 20 Tj = 150 °C 15 Tj = 25 °C 10 Tj = -40 °C 5 VGS = 12 V 14 VGS = 14 V 12 VGS = 16 V 10 VGS = 18 V 8 VGS = 20 V 6 4 Conditions: IDS = 225 A tp = 200 µs 2 0 0 100 200 300 400 500 600 Drain-Source Current, IDS (A) Figure 5. On-Resistance vs. Drain Current For Various Temperatures 3 VGS = 12 V 100 Conditions: TJ = -40°C tp = 200 µs 0 VGS = 14 V VGS = 18 V CAS300M17BM2,Rev. - 700 0 -50 -25 0 25 50 75 100 125 Junction Temperature, TJ (°C) Figure 6. On-Resistance vs. Temperature for Various Gate-Source Voltage 150 Typical Performance 3.5 Drain-Source Current, IDS (A) 3.0 Threshold Voltage, Vth (V) 400 Conditions VDS = 10 V IDS = 15 0.5mA mA 2.5 2.0 1.5 1.0 Conditions: VDS = 20 V tp = 200 µs 300 TJ = 150 °C 200 TJ = 25 °C TJ = -40 °C 100 0.5 0.0 -50 -25 0 25 50 75 100 125 0 150 0 2 4 6 Junction Temperature TJ (°C) -2.5 -2.0 -1.5 -1.0 -0.5 0.0 -4.0 VGS = -2 V -300 -400 -1.5 -0.5 -2.0 -1.5 -1.0 -0.5 0.0 -300 -400 VGS = -2 V -500 Conditions: TJ = 25°C tp = 200 µs VGS = -5 V -600 -1.0 -2.5 VGS = 0 V -600 Drain-Source Voltage VDS (V) Figure 10. Diode Characteristic at 25 ˚C Figure 9. Diode Characteristic at -40 ˚C -2.0 -3.0 -200 -500 Drain-Source Voltage VDS (V) -2.5 -3.5 -100 VGS = -5 V -3.0 16 -100 -200 -3.5 14 0 VGS = 0 V Conditions: TJ = -40 °C tp = 200 µs -4.0 12 0 Drain-Source Current, IDS (A) -3.0 Drain-Source Current, IDS (A) -3.5 10 Figure 8. Transfer Characteristic for Various Junction Temperatures Figure 7. Threshold Voltage vs. Temperature -4.0 8 Gate-Source Voltage, VGS (V) 0.0 0 -3.0 -2.5 -2.0 -1.5 -1.0 -0.5 0.0 0 -100 -200 VGS = 0 V VGS = -5 V -300 VGS = -2 V -400 Conditions: TJ = 150°C tp = 200 µs Drain-Source Voltage VDS (V) Figure 11. Diode Characteristic at 150 ˚C 4 CAS300M17BM2,Rev. - Drain-Source Current, IDS (A) Drain-Source Current, IDS (A) VGS = 0 V -200 VGS = 10 V VGS = 20 V -300 VGS = 15 V -400 -500 -600 -100 VGS = 5 V Conditions: TJ = -40 25 °C °C tp = 200 µs Drain-Source Voltage VDS (V) -500 -600 Figure 12. 3rd Quadrant Characteristic at -40 ˚C Typical Performance -3.0 -2.5 -2.0 -1.5 -1.0 -0.5 0.0 -3.0 -2.5 -2.0 -1.0 -1.5 -0.5 0.0 0 0 VGS = 0 V -100 VGS = 5 V -200 VGS = 20 V VGS = 10 V -300 VGS = 15 V -400 Drain-Source Current, IDS (A) Drain-Source Current, IDS (A) VGS = 0 V -300 -400 Conditions: TJ = 150°C 25 °C tp = 200 µs -500 -600 Drain-Source Voltage VDS (V) Figure 14. 3rd Quadrant Characteristic at 150 ˚C Figure 13. 3rd Quadrant Characteristic at 25 ˚C 100 25 Conditions: IDS =300A IGS = 100 mA VDS = 900 V TJ = 25 °C 20 -200 VGS = 15 V -600 Drain-Source Voltage VDS (V) Conditions: TJ = 25 °C VAC = 25 mV f = 200 kHz Ciss 10 15 Capacitance (nF) Gate-Source Voltage, VGS (V) VGS = 20 V VGS = 10 V -500 Conditions: TJ = 25°C 25 °C tp = 200 µs 10 5 Coss 1 Crss 0.1 0 -5 0 200 400 600 800 1000 0.01 1200 0 50 Gate Charge, QG (nC) 100 150 200 1.6 Conditions: TJ = 25 °C VAC = 25 mV f = 200 kHz Ciss 100 Drain-Source Voltage, VDS (V) Figure 16. Capacitances vs. Drain-Source Voltage (0 - 200 V) Figure 15. Gate Charge Characteristics 1.4 10 1.2 Stored Energy, EOSS (mJ) Capacitance (nF) -100 VGS = 5 V Coss 1 Crss 0.1 1 0.8 0.6 0.4 0.2 0 0.01 0 200 400 600 Drain-Source Voltage, VDS (V) 800 Figure 17. Capacitances vs. Drain-Source Voltage (0 - 1 kV) 5 CAS300M17BM2,Rev. - 1000 0 200 400 600 800 1000 Drain to Source Voltage, VDS (V) Figure 18. Output Capacitor Stored Energy 1200 Typical Performance 20 Switching Loss (mJ) 40 Conditions: TJ = 25 °C VDD = 900 V RG(ext) = 2.5 Ω VGS = -5/+20 V L = 77 μH Conditions: TJ = 25 °C VDD = 1200 V RG(ext) = 2.5 Ω VGS = -5/+20 V L = 77 μH 35 ETotal 30 Switching Loss (mJ) 25 15 EOn 10 EOff 5 ETotal 25 20 EOn 15 10 EOff 5 0 0 50 100 150 200 250 300 0 350 0 Drain to Source Current, IDS (A) 150 200 250 300 Conditions: TJ = 25 °C VDD = 900 V IDS =300 A VGS = -5/+20 V L = 77 μH Figure 20. Inductive Switching Energy vs. Drain Current For VDS = 1200 V, RG = 2.5 Ω 140 120 ETotal 20 ETotal Switching Loss (mJ) 160 100 80 EOn 60 EOff 40 15 EOn 10 EOff Conditions: VDD = 900 V RG(ext) = 2.5 Ω IDS =300 A VGS = -5/+20 V L = 77 μH 5 20 0 0 0 5 10 15 20 25 30 35 40 45 External Gate Resistor RG(ext) (Ohms) Figure 21. Inductive Switching Energy vs. RG(ext) 1400 0 25 50 75 100 125 150 1000 800 Figure 22. Inductive Switching Energy vs. Temperature td (off) 600 400 td (on) 200 tr tf 0 0 5 10 15 20 25 30 35 40 External Gate Resistor, RG(ext) (Ohms) Figure 23. Timing vs. RG(ext) CAS300M17BM2,Rev. - 175 Junction Temperature, TJ (°C) Conditions: TJ = 25 °C VDD = 900 V IDS = 300 A VGS = -5/+20 V 1200 6 350 25 180 Time (ns) 100 Drain to Source Current, IDS (A) Figure 19. Inductive Switching Energy vs. Drain Current For VDS = 900V, RG = 2.5 Ω Switching Loss (mJ) 50 Figure 24. Resistive Switching Time Description Typical Performance 2000 Drain-Source Continous Current, IDS (DC) (A) 1800 Maximum Dissipated Power, Ptot (W) 350 Conditions: TJ ≤ 150 °C 1600 1400 1200 1000 800 600 400 200 0 -40 -20 0 20 40 60 80 100 120 200 150 100 50 -20 0 20 40 60 80 100 120 140 Case Temperature, TC (°C) Figure 26. Continous Drain Current Derating vs Case Temperature 100E-3 100E-3 0.5 Junction To Case Impedance, ZthJC (oC/W) Junction To Case Impedance, ZthJC (oC/W) 250 -40 Figure 25. Maximum Power Dissipation (MOSFET) Derating vs. Case Temperature 0.3 10E-3 0.1 0.05 0.02 1E-3 0.01 SinglePulse 0.5 0.3 10E-3 0.1 0.05 1E-3 0.02 0.01 SinglePulse 100E-6 100E-6 10E-6 10E-6 1E-6 10E-6 100E-6 1E-3 10E-3 Time, tp (s) 100E-3 1 10 Figure 27. MOSFET Junction to Case Thermal Impedance 1000.0 10 µs Limited by RDS On Drain-Source Current, IDS (A) 300 0 140 Case Temperature, TC (°C) 100 µs 1 ms 100.0 100 ms 10.0 1.0 Conditions: TC = 25 °C D = 0, Parameter: tp 0.1 0.1 1 10 100 1000 Drain-Source Voltage, VDS (V) Figure 29. Maximum Power Dissipation (MOSFET) Derating vs. Case Temperature 7 Conditions: TJ ≤ 150 °C CAS300M17BM2,Rev. - 1E-6 10E-6 100E-6 1E-3 10E-3 Time, tp (s) 100E-3 1 10 Figure 28. Diode Junction to Case Thermal Impedance Schematic Package Dimensions (mm) CAS300M17BM2 8 CAS300M17BM2,Rev. - Notes • RoHS Compliance The levels of RoHS restricted materials in this product are below the maximum concentration values (also referred to as the threshold limits) permitted for such substances, or are used in an exempted application, in accordance with EU Directive 2011/65/EC (RoHS2), as implemented January 2, 2013. RoHS Declarations for this product can be obtained from your Cree representative or from the Product Documentation sections of www.cree.com. • REACh Compliance REACh substances of high concern (SVHCs) information is available for this product. Since the European Chemical Agency (ECHA) has published notice of their intent to frequently revise the SVHC listing for the foreseeable future,please contact a Cree representative to insure you get the most up-to-date REACh SVHC Declaration. REACh banned substance information (REACh Article 67) is also available upon request. • This product has not been designed or tested for use in, and is not intended for use in, applications implanted into the human body nor in applications in which failure of the product could lead to death, personal injury or property damage, including but not limited to equipment used in the operation of nuclear facilities, life-support machines, cardiac defibrillators or similar emergency medical equipment, aircraft navigation or communication or control systems, air traffic control systems. Module Application Note: The SiC MOSFET module switches at speeds beyond what is customarily associated with IGBT based modules. Therefore, special precautions are required to realize the best performance. The interconnection between the gate driver and module housing needs to be as short as possible. This will afford the best switching time and avoid the potential for device oscillation. Also, great care is required to insure minimum inductance between the module and link capacitors to avoid excessive VDS overshoots. Please Refer to application note: Design Considerations when using Cree SiC Modules Part 1 and Part 2. [CPWR-AN12, CPWR-AN13] Copyright © 2014 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree, the Cree logo, and Zero Recovery are registered trademarks of Cree, Inc. 9 CAS300M17BM2 Rev. - Cree, Inc. 4600 Silicon Drive Durham, NC 27703 USA Tel: +1.919.313.5300 Fax: +1.919.313.5451 www.cree.com/power